SIGMA_brochure-complete-En-Rev02-2017-12_LD - 第6页

Review your process in 3D Review high quality 3D defect images to focus on what matters • Locali ze defects at a glance • Classify easily using reference image • Use IPC or user-dened defect categories • Benet from pre…

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Analyze your
process at a glance
Go straight to the point to identify recurrent process detractors
Drill down in tera bytes of SPI (s-403) or AOI (s-404) data and
images to analyze root cause
Monitor process capabilities
Generate regular quality reports (daily, weekly, monthly, …) to
support 8D problem solving and lean initiatives.
“Print process quality has improved over the period but excessive warnings show
we are operating close to process limits”
Review your process
in 3D
Review high quality 3D defect images to focus on what matters
Localize defects at a glance
Classify easily using reference image
Use IPC or user-dened defect categories
Benet from pre-dened corrective action messages
Optimize review environment using customized screen layout
“Lifted lead is easily identied”
Optimize your line
inspection strategy
Correlate SPI and AOI defects (s-500) to minimize operator review
and expand defect coverage
Adjust SPI and AOI program tolerances based on facts (data
and images)
Eliminate operator false sanctions
Enable intelligent sampling at X-ray station
• Build process knowledge by tracing defect evolution in the line
“Lack of solder detected at AOI, not at SPI; we need to tighten tolerances at SPI to detect it as an error”