SIGMA_brochure-complete-En-Rev02-2017-12_LD - 第8页
Follow us on and www.vitechnology.com SIGMA EN Rev 02 2017-12 HEADQUARTERS France T el: +33 4 7 6 75 85 65 AMERICAS sales.americas@vitechnology.com Unite d States T el: +1 (9 72) 235 1170 EUROPE, MIDDLE-EAST & AFRICA…
Review your process
in 3D
Review high quality 3D defect images to focus on what matters
• Localize defects at a glance
• Classify easily using reference image
• Use IPC or user-dened defect categories
• Benet from pre-dened corrective action messages
• Optimize review environment using customized screen layout
“Lifted lead is easily identied”
Optimize your line
inspection strategy
Correlate SPI and AOI defects (s-500) to minimize operator review
and expand defect coverage
• Adjust SPI and AOI program tolerances based on facts (data
and images)
• Eliminate operator false sanctions
• Enable intelligent sampling at X-ray station
• Build process knowledge by tracing defect evolution in the line
“Lack of solder detected at AOI, not at SPI; we need to tighten tolerances at SPI to detect it as an error”
Follow us on and
www.vitechnology.com
SIGMA EN Rev 02 2017-12
HEADQUARTERS
France
Tel: +33 4 76 75 85 65
AMERICAS
sales.americas@vitechnology.com
United States
Tel: +1 (972) 235 1170
EUROPE, MIDDLE-EAST & AFRICA
sales.europe@vitechnology.com
Germany
Tel: +49 (0) 17 3206 0510
CHINA
sales.asia@vitechnology.com
Shenzhen
Tel: +86 755 8212 4147
ASEAN & OCEANIA
sales.asia@vitechnology.com
Singapore
Tel: +65 6747 6550
Specifications
PC conguration
Core i5 minimum, 8 Gb RAM,
ethernet 100Mbits/s
Graphics card (1 Gb min., 2 Gb for optimal
perfomance)
Operating system Windows 7 or later
Data base SQL server recommended
Screen conguration 22” wide screen with 1680x1050 resolution