IPC-TM-650 EN 2022 试验方法-- - 第460页

Figure 2 Schematic Drawings of Instrumentation Setups Suitable for Mea surements of Permittivity IPC-TM-650 Page 3 of 1 1 Number 2.5.5.5.1 Subject Stripline Test for Complex Relative Permittivity of Circuit Board Materia…

100%1 / 824
Figure 1 Exploded End Views of Stacked Specimen
Types A, B, C and D (See 3.0) with Copper Foil Thickness
Exaggerated and Including the Copper Plates (See 5.1.2)
and Steel Bars (See 5.1.1) of the Fixture
IPC-TM-650
Page 2 of 11
Number
2.5.5.5.1
Subject
Stripline
Test
for
Complex
Relative
Permittivity
of
Circuit
Board
Materials
to
14
GHz
Date
3/98
Revision
3.0
Test
Specimen
Specimen
length
corresponds
to
an
available
fixture
length
L.
Longer
L
values
enable
lower
mini¬
mum
resonant
frequencies
to
be
achieved.
L
is
also
the
length
dimension
of
the
copper
plates
described
in
5.0.
Four
types
of
specimens
can
be
used
for
this
method,
as
shown
in
Figure
1.
Steel
bar
Copper
plate
0
o
o
o
Specimen
stack
—
-
—
=
.=
Copper
plate
Steel
bar
0
Type
A
0
Type
E
0
Type
C
0
Type
D
I
PC-1
2555
1-1
For
types
B,
C,
and
D,
the
specimen
card
should
first
be
pre¬
pared
with
about
5
mm
or
more
excess
length.
Wide
pressure
sensitive
adhesive
(PSA)
tape
can
be
used
to
mask
the
ground
plane
side,
and
a
narrow
PSA
tape
can
be
used
to
mask
for
the
centered
strip
before
etching
off
exposed
cop¬
per.
Trimming
the
excess
length
after
etching
removes
any
undercut
areas
at
the
ends.
Trimming
to
length
should
be
done
in
a
way
that
leaves
the
end
surfaces
with
sharp
edges
and
no
conductor
edge
distortion
or
smears
over
that
surface.
Sanding
specimens
clamped
between
paper-phenolic
lami¬
nate
drill-entry
boards
is
an
advised
method
for
finishing
the
end
surfaces.
Type
A
specimens
with
untreated
smooth
copper
foil
will
pro¬
vide
the
most
accurate
values
for
tan
6,
but
will
tend
to
have
a
low
bias
on
£r.
Type
0
eliminates
all
clamped
interfaces
with
the
air
layer
between
the
dielectric
and
the
conductor
to
give
the
most
accurate
er
value
but,
with
the
copper
surfaces
treated
for
adhesion,
tends
to
have
a
high
bias
on
dissipation
factor.
Type
D
gives
a
good
measure
of
practical
performance
in
an
application.
3.1
Type
A
Two
25.4
mm
wide
by
L
long
cards
etched
free
of
copper
cladding.
These
are
placed
on
either
side
of
a
cen¬
ter
strip
of
smooth
copper
foil
of
specified
thickness
and
width
and
will
be
assembled
between
25.4
mm
wide
by
L
long
cop¬
per
foil
cards.
3.2
Type
B
One
25.4
mm
wide
by
L
long
card
with
clad
copper
on
one
side
and
copper
etched
off
the
other
side,
and
a
second
card
of
matching
size
with
clad
copper
on
one
side
and
copper
etched
off
the
other
side
except
for
a
centered
strip
of
specified
width
extending
to
both
ends
of
the
card.
The
copper
free
surface
of
the
first
card
is
assembled
against
the
etched
strip
of
the
other
to
form
the
stripline
resonator.
3.3
Type
C
Two
25.4
mm
wide
by
L
long
cards
with
clad
copper
on
one
side
and
copper
etched
off
the
other
side
except
for
a
centered
strip
of
specified
width
extending
to
both
ends
of
the
card.
The
etched
strip
surfaces
of
both
cards
face
together
to
form
the
stripline
resonator.
3.4
Type
D
Oversize
cards
similar
to
type
B
are
bonded
together
with
a
selected
bonding
film
and
then
trimmed
to
size
to
form
the
stripline
resonator
assembly.
This
could
be
a
test
coupon
cut
from
a
bonded
stripline
circuit
board
assembly.
4.0
Suggested
Electronic
Apparatus
The
principal
com¬
ponents
required
for
the
test
setup
consist
of
the
test
fixture
described
in
5.0
combined
with
the
components
described
in
4.1
,
Figure
2,
Type
A
and
Type
B,
or
preferably
with
the
sys¬
tem
in
4.2,
Figure
2,
Type
C.
4.1
A
Test
Setup
for
Computer
Automation
of
Data
This
requires
a
microwave
signal
source,
an
accurate
means
of
measuring
the
signal
frequency,
an
accurate
means
for
detecting
power
level,
and
an
accurate
method
of
determin¬
ing
frequency
values
above
and
below
the
resonant
frequency
at
the
half-power
level
for
the
test
fixture
loaded
with
the
specimen.
4.1.1
The
following
components
or
equivalent,
properly
interconnected,
can
be
used
most
effectively
with
a
computer
control
program
for
automated
testing.
•
Sweep
Frequency
Generator
Mainframe
HP8350B
•
RF
Plug-In,
0.01
to
20
GHz
HP83592A
•
Power
Splitter
HP1
1
667A
•
Automatic
Frequency
Counter
HP5343A
•
Source
Synchronizer
HP5344A
Obtained
as
an
interconnected
assembly
with
the
counter.
•
Coaxial
cables
and
adapters
Figure 2 Schematic Drawings of Instrumentation
Setups Suitable for Measurements of Permittivity
IPC-TM-650
Page 3 of 11
Number
2.5.5.5.1
Subject
Stripline
Test
for
Complex
Relative
Permittivity
of
Circuit
Board
Materials
to
14
GHz
Date
3/98
Revision
COMPUTER
WITH
GPIB
(IEEE
438)
INTERFACE
SOURCE
SYNCHRONIZER
AUTOMATIC
COUNTER
SWEEPER
WITH
RF
PLUG-IN
POWER
METER
POWER
SPUTTER
A.
Automated
test
setup
B.
Simplified
automated
test
setup
C.
Network
analyzer
setup
I
PC-1
25551-1
•
10
dB
Attenuator
HP8491
B
•
Programmable
Power
Meter
HP436A
•
Power
Sensor
HP8484A
with
70
to
10
dBm
range
•
IEEE
488
(GPIB)
cables
•
Controlling
computer
with
GPIB
interface
The
above
equipment
is
connected
as
explained
in
4.1
.1
.1
through
4.1
.1
.3,
and
as
illustrated
in
Figure
2,
Type
A.
4.
1.1.1
RF
Connections
The
power
splitter
connects
directly
to
the
RF
plug-in
output.
One
output
of
the
splitter
connects
by
RF
cable
to
the
counter
input.
The
other
output
is
connected
by
RF
cable
to
the
attenuator
which
connects
to
one
of
the
test
fixture
probe
lines.
4.1
.1
.2
Control
Connections
Connections
between
counter
and
synchronizer
are
provided
as
specified
by
the
manufacturer.
The
FM
output
from
the
synchronizer
connects
by
BNC
to
the
FM
input
on
the
sweeper.
GPIB
cables
connect
in
parallel
to
the
sweeper,
synchronizer,
power
meter,
and
computer
interface.
4.
1.1.3
Other
Connections
The
power
sensor
is
con¬
nected
to
the
other
probe
of
the
fixture,
and
its
special
cable
connects
into
the
power
meter.
4.1.2
The
microwave
signal
source
must
be
capable
of
pro¬
viding
an
accurate
signal.
During
the
required
time
period
and
range
of
frequency
needed
to
make
a
permittivity
and
loss
tangent
measurement,
the
source
must
provide
a
leveled
power
output
that
falls
within
a
0.1
dB
range.
When
the
source
is
set
for
a
particular
frequency,
the
output
must
be
capable
of
remaining
within
5
MHz
of
the
set
value
for
the
time
required
to
make
a
measurement.
The
means
for
measuring
frequency
shall
have
a
resolution
of
0.05%
or
less
and
an
accuracy
of
0.08%
or
less.
An
error
of
+8
MHz
in
measurement
of
a
resonant
frequency
near
1
0
GHz
for
a
material
with
nominal
permittivity
of
2.50
represents
a
-0.004
error
in
permittivity.
The
means
for
detecting
the
power
level
shall
have
a
resolu¬
tion
of
0.1
dB
or
less
and
be
capable
of
comparing
power
levels
within
a
3
dB
range
with
an
accuracy
of
0.1
dB.
An
error
of
0.1
dB
in
estimating
half
power
frequency
points
can
result
in
an
error
in
the
loss
tangent
of
about
0.0001
for
a
material
with
2.5
permittivity.
See
equation
5
in
7.2.
4.1.3
A
synthesized
CW
generator
can
be
used
to
replace
the
sweeper,
plug-in,
power
splitter,
connector,
and
source
synchronizer
for
the
simpler
set-up
shown
in
Figure
2,
Type
B.
4.2
Automated
Network
Analyzer
for
the
Test
Setup
The
instrumentation
described
in
4.1
may
be
replaced
with
either
a
scalar
or
vector
network
analyzer,
with
test
cables
connected
to
the
test
fixture
of
5.0
as
the
device
under
test
(DUT),
as
shown
in
Figure
2,
Type
A.
Examples
of
automated
network
analyzers
known
to
be
suitable
include
the
Hewlett-
Packard
8510
vector
network
analyzer
or
the
Wiltron
Model
561
scalar
network
analyzer.
These
or
equivalent
may
be
used.
Figure 3 Three View Drawing of a Steel Clamping Bar
(See 5.1.1) Cut to Length for the 50.8 mm L Value
(Extended #4-40 Threaded Rod Both Ends is Not Shown)
Figure 4 Three View Drawing of a Copper Ground Plate
(See 5.1.2) for the 50.8 mm L Value
IPC-TM-650
Page 4 of 11
Number
2.5.5.5.1
Revision
Subject
Stripline
Test
for
Complex
Relative
Permittivity
of
Circuit
Board
Materials
to
14
GHz
Date
3/98
Such
instruments
may
be
operated
either
manually
or
under
computer
control
with
suitable
programming
to
locate
the
resonant
frequency
and
the
frequencies
above
and
below
resonance
where
transmitted
power
is
3
dB
below
that
at
resonance.
Network
analyzers
have
several
advantages
over
the
instrumentation
described
in
4.1.
Data
collection
is
rapid
and
may
be
continuously
refreshed
with
averaging.
The
log
magnitude
response
curve
for
ratio
of
transmitted
to
incident
power
(the
S21
parameter)
as
dB
versus
frequency
is
visible
on
a
screen
for
easy
verification
of
a
valid
resonance.
A
large
number
of
dB,
frequency
data
points
near
the
resonance,
are
readily
available
for
optional
use
of
non-linear
regression
analysis
techniques
to
determine
the
frequency
and
Q
values
with
statistically
better
degrees
of
uncertainty
than
those
attainable
by
the
three
point
(fr,
and
f2)
method
in
either
section
6.2
or
6.3.
5.0
Test
Fixture
5.1
Fixture
Parts
for
Clamping
L
is
the
selected
length
for
the
specimen.
A
fixture
may
include
hardware
for
more
than
one
value
of
L.
Suggested
L
values
are
50.8,
76.2,
152.4,
and
304.8
mm.
Since
the
fundamental
resonant
frequency
and
its
harmonics
are
inversely
proportional
to
the
value
of
L
for
a
given
£r,
the
selection
of
an
L
value
determines
the
low
fre¬
quency
at
which
the
material
may
be
measured
for
and
tan
8.
Figure
1
shows
the
end
views
of
a
series
of
specimen
con¬
figurations
and
includes
the
parts
for
clamping.
5.1.1
For
each
L
value,
two
ground
tool
steel
clamping
bars
25.4
mm
x
28.58
mm
x
(L-6.35),
as
shown
in
Figure
3.
These
are
intended
to
provide
uniformly
distributed
force
along
the
length
of
the
specimen,
transferred
through
part
5.1
.2.
A
rec¬
ommended
practice
is
to
provide
these
with
a
small
diameter
threaded
rod,
such
as
#4-40,
centered
on
each
end
and
extending
about
20
mm
to
serve
as
a
means
for
attaching
the
probe
assembly
of
5.2
used
in
6.1.5
or
the
alignment
jig
of
5.1
.3
used
in
6.1
.1
.
5.1.2
For
each
L
value,
two
pure
copper
ground
plates
25.4
mm
x
9.52
mm
x
L
with
all
edges
sharp
as
in
Figure
4.
These
provide
at
the
ends
a
copper
surface
perpendicular
to
the
specimen
length
direction,
which
serves
as
a
contact
area
over
a
range
of
specimen
thicknesses
for
making
ground
con¬
tinuity
to
the
coaxial
probe.
When
these
are
clamped
with
5.1
.1
as
described
in
6.1
.1
,
the
inside
corners
at
each
end
between
the
outer
face
of
5.1
.2
and
the
end
surface
of
5.1
.1
form
reference
locations
equidistant
from
the
center
line
of
the
stripline
resonator
element
that
are
used
by
the
probe
assem¬
bly
5.2
to
align
the
coaxial
probe
with
that
center
line.
IPC-25551-3
Drill
#43
(2.26
mm)
L
—
6.35
mm
L
LEAVE
ALL
EDGES
SHARP
5.1.3
A
stacking
alignment
jig
as
used
in
6.1
.1
of
an
appro¬
priate
design.
Figure
5
shows
a
suggested
design.
5.1.4
A
low
profile
mechanical
force
gage
with
4.45
kN
compression
capacity
such
as
a
Dillon
Model
U,
PN
30482-
0053,
available
from
Dillon
Quality
Plus,
Inc.,
11
40-T
Avenida
Acaso,
Camarillo,
GA
993012.
One
is
needed
for
each
of
part
5.1.5.
5.1.5
A
clamping
arrangement
with
5.1.4
properly
mounted
in
the
line
of
force
and
with
alignment
parts
for
assuring
the
line
of
force
is
properly
located
through
the
stack
assembled