IPC-TM-650 EN 2022 试验方法-- - 第493页

IPC-TM-650 Number Subject Date Revision Page 2 of 5 2.5.5.9 Permittivity and Loss Tangent, Parallel Plate, 1 MHz to 1.5 GHz 11/98 Calibrations only last 24 hours, so calibration shall be per¬ formed within 24 hours of th…

100%1 / 824
HP 4291A-5 Product Note
HP Application Note 380-1
The Institute for Interconnecting and Packaging Electronic Circuits
2215 Sanders Road • Northbrook, IL 60062
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 5
IPC-TM-650
TEST
METHODS
MANUAL
1
Scope
This
procedure
outlines
a
test
method
to
deter¬
mine
the
permittivity
(dielectric
constant
or
ET)
and
loss
tan¬
gent
(dissipation
factor
or
Tan8)
of
printed
wiring
materials
at
various
frequencies
(from
1
MHz
to
1
.5
GHz)
using
a
single
test
fixture
for
the
measurement.
The
permittivity
and
loss
tangent
are
measured
using
a
narrow
sweep
of
frequency
around
the
target
or
desired
frequency.
The
test
method
is
built
around
the
capability
of
currently
available
materials
analyzers,
which
use
a
capacitance
method
to
determine
permittivity.
This
test
method
is
not
intended
for
low
loss
materials,
such
materials
may
be
tested
at
fixed
frequencies
using
other
I
PC
test
methods.
2
Applicable
Documents
"Dielectric
Constant
Evaluation
of
Rough
Surface
Materials,"
which
describes
how
to
make
accurate
measurements
using
the
HP
4291
A
and
HP
16453A.
“Dielectric
Constant
Measure¬
ments
of
Solid
Materials,"
which
contains
a
technical
back¬
ground,
suitable
for
this
subject.
3
Test
Specimen
3.1
Each
specimen
shall
be
50
mm
x
50
mm
by
the
thick¬
ness
of
the
substrate
material.
Within
the
limits
of
the
test
fix¬
ture,
the
thicker
the
sample
the
less
error
in
the
measure¬
ments.
Multilayer
samples
can
be
used
to
increase
the
thickness
of
the
sample,
but
these
cannot
be
simple
stacked
layers;
they
must
be
physically
bonded
with
no
air
gaps
between
the
layers.
A
target
thickness
would
be
1
.0
mm,
but
both
thinner
and
thicker
samples
will
work.
3.2
Three
specimens
are
required
for
this
test.
3.3
All
materials
are
affected
by
moisture,
including
all
rein¬
forced
laminates
and
most
films.
Therefore,
all
samples
shall
be
conditioned
at
23℃
土
2
℃
and
50%
RH
土
5%
RH
for
a
minimum
of
24
hours
prior
to
testing.
However,
if
a
sample
has
recently
been
etched
or
exposed
to
excessive
moisture,
it
should
be
dried
in
an
air-circulating
oven
for
two
hours
at
105℃
+5℃,
-2℃
prior
to
testing
and
conditioned
at
room
Number
2.5.5.9
Subject
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
Date
Revision
11/98
Originating
Task
Group
HDI
Test
Methods
Task
Group
(D-42a)
temperature
as
mentioned
above.
3.4
Sample
Surface
Preparation
3.4.1
It
is
preferred
that
the
sample
be
patterned
with
a
conductive
material
in
the
shape
and
size
of
the
test
elec¬
trode.
This
conductive
material
is
preferably
1
00
angstroms
of
vapor
deposited
copper.
Other
metals
may
be
used.
In
all
cases,
the
conductor
on
the
sample
must
make
good
electri¬
cal
contact
with
the
fixture
electrode.
Such
a
conductive
pat¬
tern
eliminates
air
gaps
and
other
potential
sample
mounting
errors.
3.4.2
Bare
dielectric
materials
may
be
tested
with
this
test
method.
The
fixture
electrodes
must
be
applied
with
some
level
of
force
to
ensure
a
gap-free
contact
area.
Determining
the
correct
force
setting
may
require
some
trial
and
error
test¬
ing
for
each
type
of
sample
(see
6.4).
4
Equipment/Apparatus
4.1
The
Hewlett-Packard
Impedance
Material
Analyzer,
model
4291
A,
or
equivalent
is
recommended.
4.2
Hewlett-Packard
model
number
1
6453A
test
fixture,
or
equivalent
4.3
An
appropriate
calibration-verification
kit
and
a
fixture¬
correction
kit
as
recommended
in
the
instrument's
manual
(i.e.,
HP4291
A
Calibration
kit).
Such
a
kit
usually
includes
the
following
devices:
•
OPEN
and
SHORT
for
fixture
correction
•
50
Ohms
impedance
•
Dielectric
(PTFE)
of
known
characteristic
for
the
purpose
of
the
calibration
verification
4.4
Micrometer,
capable
of
0.001
mm
resolution
4.5
Circulating
oven
capable
of
105℃
+5℃,
-2℃
5
Procedure
5.1
Calibrate
the
instrument
using
the
calibration
kit
accord¬
ing
to
the
recommendations
of
the
instrument
manufacturer.
IPC-TM-650
Number
Subject Date
Revision
Page 2 of 5
2.5.5.9
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
11/98
Calibrations
only
last
24
hours,
so
calibration
shall
be
per¬
formed
within
24
hours
of
the
measurement.
See
6.1
for
more
calibration
notes.
5.2
Set
up
the
unit
to
sweep
the
target
frequency
土
0.5%
of
the
target.
5.3
Measure
the
sample
thickness
with
the
micrometer
and
insert
into
the
test
fixture.
The
sample
must
make
good
con¬
tact
with
the
fixture
electrodes
(see
6.1
concerning
the
proper
force
to
be
applied).
The
sample
must
not
touch
the
back
wall
of
the
fixture.
The
sample
electrode
placement
and
thickness
measurement
shall
be
obtained
from
the
same
area
of
the
sample.
5.4
Run
the
test
and
record
the
average
permittivity
and
loss
over
the
narrow
frequency
range
sweep.
The
scanned
data
may
also
be
saved
on
disk.
See
6.2
for
comments
on
expected
behavior
for
permittivity
as
a
function
of
frequency.
5.5
Repeat
5.1
through
5.4
for
all
desired
frequencies.
5.6
Report
the
average
permittivity
and
loss
at
the
frequen¬
cies
requested.
6
Notes
6.1
Correct
calibration
and
operation
of
the
test
equipment
is
required
to
obtain
accurate
measurement
of
permittivity
and
loss.
Proper
sample
preparation
is
also
very
important
for
obtaining
useful
data
from
this
test.
Calibrate
the
materials
analyzer
in
accordance
with
manufacturer's
instructions.
An
automatic
program
has
been
developed
for
the
HP
4291
A,
which
will
ease
calibration
and
setup
(see
6.6).
6.2
The
permittivity
should
decrease
slightly
with
increasing
frequency.
If
it
increases
greatly
or
decreases
more
than
0.2
units
from
approximately
20
MHz
to
1
.2
GHZ,
reposition
(reset)
the
sample
in
the
fixture
and
measure
again
(check
for
debris
between
the
electrodes;
blow
out
with
air).
6.3
Testing
at
temperatures
and
humidities
other
than
room
temperature
may
be
performed
with
this
instrument,
as
a
spe¬
cialized
fixture
can
be
placed
in
a
temperature
chamber.
A
temperature
chamber
must
be
used
when
testing
with
this
fixture
under
conditions
where
condensation
might
contami¬
nate
the
electrodes,
as
such
contamination
gives
spurious
results.
6.4
The
pressure
of
the
test
fixture
on
the
specimen
affects
the
measured
permittivity
and
loss
values,
in
particular
for
un-metallized
test
specimens.
Too
light
of
pressure
reduces
the
area
of
electrode/sample
contact,
thus
leaving
air
gaps,
which
result
in
erroneous
measurements.
If
the
pressure
is
too
high,
the
sample
can
be
reduced
in
thickness
and
the
mea¬
sured
values
would
be
incorrect
because
the
thickness
is
unknown.
Making
measurements
while
adjusting
the
force
should
lead
the
operator
to
a
force
setting
where
the
mea¬
sured
value
is
independent
of
the
force
applied.
6.5
The
HP
4291
Materials
Analyzer
and
related
fixtures
and
calibration
kits
are
available
from
Hewlett
Packard,
(800)
452-
4844.
6.6
Reference
Program
for
Automatic
Calibration
and
Operation
This
automatic
calibration
and
operation
pro¬
gram
was
developed
for
the
HP
4291A
and
is
published
in
this
method
as
a
reference.
Although
the
program
listed
in
this
section
has
been
tested
and
used,
it
is
given
here
for
^refer¬
ence
only.”
6.6.1
Procedure
Using
Automatic
Program
Turn
on
the
analyzer
with
the
program/calibration
disk
in
the
drive
and
fol¬
low
the
user
friendly
calibration
instructions,
which
appear
on
the
monitor.
The
calibration
on
the
HP4291
lasts
about
24
hours;
after
that,
it
begins
to
drift
and
provides
slightly
higher
values
as
a
function
of
time.
The
calibration
procedure
in
6.6.1
.1
through
6.6.1
.10
should
therefore
be
performed,
at
a
minimum,
on
a
daily
basis.
During
the
calibration
procedure,
the
line
traces
on
the
monitor
should
be
observed
during
each
step.
Noisy
or
erratic
traces
are
an
indication
of
external
inter¬
ference.
If
noise
is
observed,
the
calibration
procedure
should
be
aborted
and
rerun.
Clean
the
electrode
on
the
test
head,
standards,
and
fixture
connections
and
electrodes
on
a
regu¬
lar
(weekly)
basis.
Blow
dry.
6.6.1.
1
Allow
at
least
30
minutes
for
the
unit
to
warm
up
and
stabilize.
6.6.1.
2
As
the
unit
is
a
frequency
sweeping
unit,
enter
the
start
and
stop
frequency
(in
megahertz)
of
the
test
(single
fre¬
quency
tests
use
close
start/stop
frequencies,
which
should
be
±
0.5%
of
the
target
frequency).
6.6.1.
3
Place
the
OS
(open)
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
"xl”
on
the
unit.
IPC-TM-650
Number
Subject Date
Revision
Page 3 of 5
2.5.5.9
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
11/98
6.6.
1.4
Place
the
OQ
(short)
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1”
on
the
unit.
6.6.1
.5
Place
the
50Q
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1
”
on
the
unit.
6.6.1.
6
Place
the
HP
1
6453A
test
fixture
or
equivalent
on
the
test
head
as
specified
in
accordance
with
the
manufactur¬
er^
instructions
as
prompted
on
the
unit's
monitor.
6.6.1.
7
Open
the
fixture
gap
and
lock
it
open
as
prompted
on
the
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1''
on
the
unit.
6.6.
1.8
Short
the
fixture
gap
as
prompted
on
the
monitor
and
press
Return
on
the
unit's
keyboard
or
"x1
on
the
unit.
6.6.1
.9
Place
the
pure
PTFE
specimen
in
the
fixture
in
close
contact
with
electrodes
and
with
the
PTFE
specimen
not
touching
the
back
wall
of
the
fixture,
then
press
Return
on
the
unit's
keyboard
or
“x1”
on
the
unit.
Pull
out
the
PTFE
and
recheck.
Permittivity
should
be
within
±
0.01
or
±
0.02
units.
If
not,
recalibrate
starting
at
"Fixture."
If
it
is
still
off,
redo
the
calibration
from
beginning.
6.6.1.10
Test
the
sample
in
accordance
with
Section
5.
6.6.2
The
following
calibration/test
program
is
the
latest
ver¬
sion
of
what
was
developed
for
the
P
H4291
A.
Using
a
text
editor
(no
embedded
coding),
enter
this
program
on
a
DOS-
formatted
disk
and
name
it
''AUTOST.''
Place
the
disk
in
the
unit
and
turn
it
on
(If
you
have
any
improvements
PLEASE
for¬
ward
them
to
the
IPG):
The
program
disk
will
calibrate
and
configure
the
instrument's
screen.
Two
windows
will
appear.
The
top
window
should
be
permittivity
(ET)
and
the
bottom
window
should
be
loss
tangent
(8).
Both
windows
should
be
set
to
the
frequency
range
entered
in
6.3.1.
2.
If
they
are
not,
return
to
6.3.1
and
repeat
the
process.
100
!****
PLEASE
SET
PTFE
THICKNESS
ON
LINE
1610
AND
2600
****
110
!****
PLEASE
SET
PTFE
PERMITTIVITY
ON
LINE
2580
120
!****
PLEASE
SET
PTFE
LOSS
TANGENT
ON
LINE
2590
130
!****
200
!****
SAVE
THIS
PROGRAM
ON
A
DOS
FORMATTED
210
!****
DISK
USING
A
TEXT
EDITOR
(LINES
100-5000
220
!****
NAME
THE
PROGRAM
'
'AUTOST''
WITH
NO
EXTENSION
230
!****
PSCE
DISK
IN
UNITS
DRIVE
AND
TURN
UNIT
ON
240
!****
PROGRAM
WILL
AUTOMATICALLY
RUN.
TO
RESET
250
!****
UNIT
FOR
NEW
FREQUENCY
RANGE
PRESS
“STOP”
260
!****
ON
UNITS
FACE
THEN
“START''
ON
UNITS
FACE.
270
!****
IF
YOU
WANT
TO
RE-CALIBRATE
ANSWER
YES
[1]
280
!****
WHEN
PROMPTED
290
!****
WOO
!****
INITIALIZE
UNIT
FOR
TEST
***
1010
ASSIGN
@Hp4291
TO
800
1
020
Scode=8
1030
CLEAR
@Hp4291
1040
ABORT
Scode
1050
OUTPUT
@Hp4291;"DISP:ALL
BST”
1070
!
1100
!****
CALIBRATION
STATE
CHECKING
****
1110
OUTPUT
@Hp4291;,,SENS:CORR1
?”
1120
ENTER
@Hp4291
;Stat
230
IF
Stat
THEN
1130
INPUT
,(RE-CALIBRATE
NOW?
[1]
Yes;
[0]
No
[RETURN
OR
x1]'',Ans$
1140
IF
Ans$<>“1”
THEN
GOTO
Testjoop
1150
END
IF
1160
!
1200
!****
SETTING
UP
START/STOP
FREQUENCY
****
1210
INPUT
"Enter
Start
Frequency
in
MH
乙
[RETURN
OR
x1]'',A
1220
B=A*1
000000
1230
OUTPUT
@Hp4291;“SENS:FREQ:STAR
”旧
1240
INPUT
“Enter
Finish
Frequency
in
MH
乙
[RETURN
OR
1250
B=A*1
000000
1260
OUTPUT
@Hp4291;“SENS:FREQ:STOP
";B
1270
!
1300
!****
SETTING
ENABLE
REGISTER
FOR
SRQ
****
1310
OUTPUT
@Hp4291
;
11
STAT:
INST:
ENAB
256"
1320
OUTPUT
@Hp4291;“*SRE
4”
1330
!
1400
!****
SETTING
TRIGGER
SOURCE
INTERNAL,
CON¬
TINUOUS
OFF
****
1410
OUTPUT
@Hp4291;,,TRIG:SOUR
I
NT"
1420
OUTPUT
@Hp4291;llINIT:CONT
OFF"
1430
!
1500
!****
SETTING
CAL
MODE
TO
FIXED/USER
****
1510
OUTPUT
@Hp4291;“SENS:CORR1:COU_FPO
USER”
1520
OUTPUT
@Hp4291
;<<SENS:CORR2:COLL:FPO
USER"