IPC-TM-650 EN 2022 试验方法-- - 第808页

T able 1 Barometric Pressure* Altitude** In. of Mercury MM of Mercury Feet Meters 27 to 31 685 to 785 Seal Level Seal Level IPC-TM-650 Page 2 of 2 Number 3.13 Subject Withstanding Voltage, Connectors Date 7/75 Revision A…

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NOTE:
WARNING:
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 2
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
2215
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
.0
Scope
1.1
To
determine
the
ability
of
the
connector
to
operate
safely
at
its
rated
voltage
and
to
withstand
momentary
over-
potentials
due
to
switching,
surges,
or
other
similar
phenom¬
ena.
The
dielectric
withstanding
voltage
test
is
also
called
high-potential,
over-potential,
or
dielectric-strength
test,
but
differs
from
a
dielectric-breakdown
test
as
described
in
para¬
graph
6.2.
2
.0
Reference
Documents
2.1
Information
in
this
section
is
intended
to
parallel
the
test
method
described
in
EIA-RS-364/TP-20.
3
.0
Specimen
3.1
A
plug,
receptacle
or
mated
combination
as
specified
in
the
individual
connector
specification.
4
.0
Apparatus
4.1
High
voltage
source
adjustable
to
within
±
5%
of
required
test
voltage
(DC
or
RMS)
and
capable
of
delivering
a
minimum
current
of
1
milliampere.
4.2
Leakage
current
meter
accurate
to
土
5%
of
reading.
Commercial
devices
are
available
that
incorporate
the
voltage
source
and
leakage
monitor,
as
well
as
a
fault
monitor
(e.g.,
light,
bell,
automatic
shut-down)
into
one
instru¬
ment.
4.3
Altitude
chamber
capable
of
maintaining
a
simulated
alti¬
tude
at
temperature
extremes
of
-65
to
+
1
25℃.
5
.0
Procedure
POTENTIALS
USED
DURING
THIS
TEST
MAY
PROVE
HAZARDOUS
TO
PERSONNEL
TAKE
PRECAU¬
TIONS
TO
PROTECT
PERSONNEL
FROM
ACCIDENTAL
EXPOSURE
TO
THESE
TEST
POTENTIALS.
Number
3.13
Subject
Withstanding
Voltage,
Connectors
Date
Revision
7/75
A
Originating
Task
Group
N/A
5
J
The
withstanding
voltage
shall
be
applied
between
indi¬
vidual
pairs
of
immediately
adjacent
contacts
and
between
the
shell
and/or
engaging
hardware
(if
they
exist)
and
the
closest
individual
contact(s).
The
method
of
connection
of
the
test
voltage
if
significant
shall
be
specified
in
the
individual
connec¬
tor
specification.
When
special
preparations
or
conditions
such
as
special
test
fixtures,
reconnection,
or
grounding
iso¬
lation
are
required,
they
shall
be
so
specified.
5.2
Under
the
specified
conditions
of
temperature
and
baro¬
metric
pressure,
the
test
voltage
shall
be
increased
from
zero
to
the
specified
value
as
uniformly
as
possible
at
an
approxi¬
mate
rate
of
500
volts
(DC
or
RMS)
per
second
unless
other¬
wise
specified.
5.3
The
test
voltage
shall
be
applied
for
a
minimum
period
of
60
seconds
during
which
time
the
connector
under
test
shall
be
observed
for
evidence
of
disruptive
discharge
or
for
leakage
current
in
excess
of
one
milliampere.
5.4
The
test
voltage
shall
be
gradually
reduced
to
zero
to
avoid
surges.
6
.0
Notes
6.1
Acceptance
criteria
shall
be
established
by
the
lack
of
disruptive
discharge
as
evidenced
by
flashover
(surface
dis¬
charge),
sparkover
(air
discharge),
or
breakdown
(puncture
discharge),
or
of
excessive
leakage
current.
Resistance
to
these
conditions
is
an
inherent
characteristic
of
connector
geometry
(e.g.,
contact
spacing),
contact
configuration
(e.g.,
smooth
contours),
and
insulator
materials.
6.2
Dielectric
withstanding
voltage
shall
be
defined
as
75
percent
of
the
nominal
dielectric
breakdown
voltage
mea¬
sured
under
the
same
conditions
of
altitude
and
temperature.
6.3
Simulated
altitudes
used
during
this
test
shall
be
selected
from
those
shown
in
Table
1
.
Table 1
Barometric Pressure* Altitude**
In. of
Mercury
MM of
Mercury Feet Meters
27 to 31 685 to 785 Seal Level Seal Level
IPC-TM-650
Page 2 of 2
Number
3.13
Subject
Withstanding
Voltage,
Connectors
Date
7/75
Revision
A
*Source-U.S.
Standard
Atmosphere
1966.
**Altitude
is
given
as
a
reference
only
and
should
not
be
specified
without
barometric
pressure
as
a
test
requirement.
17.4
442
15,000
4,572
3.44
87.4
50,000
15,240
1.40
35.6
70,000
21,336
0.35
8.9
100,000
30,480
0.045
1.14
150,000
45,720
Note:
Table 1 Test Temperatures
Test Condition Chamber Temperature (°C)
Table 2 Length of Test
Test Time Condition Hours
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 2
Number
3.14
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
2215
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
Scope
This
test
method
is
used
to
determine
the
effects
of
exposure
to
elevated
ambient
temperature
on
the
electrical
and
mechanical
characteristics
of
a
connector.
2
Applicable
Documents
None
3
Test
Specimen
3.1
A
mated
connector
(plug
and
receptacle)
complete
with
all
applicable
guide,
keying,
and
engaging
hardware
shall
be
terminated
and
mounted
in
its
normal
manner
during
this
test.
3.2
The
card-edge
receptacle
and
an
applicable
PCB
of
minimum
thickness
shall
be
mated
during
this
test,
except
as
otherwise
specified.
4
Equipment/Apparatus
4.1
A
suitable
chamber
capable
of
maintaining
the
appli¬
cable
temperatures
within
±
20℃
at
the
geometric
center
under
no
load
conditions.
Thermal
distribution
shall
not
exceed
±
50℃
of
the
temperature
at
the
geometric
center.
4.2
A
thermocouple
bridge,
potentiometer,
or
resistance
bridge
of
suitable
range
for
the
specified
test
conditions
5
Procedure
5.1
The
chamber
shall
be
adjusted
to,
and
maintained
at,
the
temperature
specified
in
the
individual
connector
specifi¬
cation.
Thermal
equilibrium
shall
be
attained
prior
to
the
start
of
the
test
(see
6.3).
5.2
The
mated
test
specimen
shall
be
suspended
within
the
test
chamber
and
subjected
to
the
specified
temperature
for
the
required
time
duration
called
out
in
the
individual
specifi¬
cation.
Table
1
and
Table
2
may
be
used
as
a
reference
for
test
temperatures
and
test
times,
however,
the
individual
con¬
nector
specification
shall
take
precedence.
5.3
If
groups
of
samples
are
tested,
they
shall
be
mounted
in
a
manner,
such
that
the
normal
heat
dissipation,
absorp¬
tion,
conduction,
or
reflection
characteristics
inherent
in
the
connector
are
not
infringed.
Subject
High
Temperature
Life,
Connectors
Date
7/75
Revision
Originating
Task
Group
1
55
2
70
3
85
4
105
5
125
6
150
7
200
A
96
B
300
C
500
D
1000
E
1500
F
2000
G
3000
H
5000
5.4
The
connector
test
potentials,
duty
cycle
load,
and
other
operating
conditions
during
exposure
shall
be
specified
in
the
applicable
connector
specifications
5.5
At
the
completion
of
the
specified
exposure
time,
the
conductors
shall
be
stabilized
at
ambient
temperature
and
checked
for
low
level
circuit
and
insulation
resistance,
unless
otherwise
specified
in
the
individual
connector
specification.
5.6
Visual
examination
shall
be
for
evidence
of
the
following:
A.
Permanent
dimensional
changes
or
distortion
B.
Cracking
or
delamination
of
finishes
or
dielectric
materials
C.
Opening
of
seals
or
seams
D.
Hardening
or
softening
of
dielectric
materials
E.
Fusing
or
seizure
of
mating
connectors
or
components