IPC J-STD-003B - 第39页
which promote global standardization for the electronics industry . The standard activated flux composition selected and tested by the committees has been utilized in the International Electrotechnical Commission (IEC) 60…

APPENDIX E
J-STD-002/J-STD-003 Activated Solderability
Test Flux Rationale Committee Letter
The current J-STD-002/J-STD-003 specification includes a
departure in the test flux methodology used in past solder-
ability testing. The table in 3.2.2 Flux is:
The J-STD-002/J-STD-003 committees understood that
any proposed change to the use of ROLO (formerly desig-
nated type R) would be heavily scrutinized and would
require test data showing the applicability of using a stan-
dard activated flux composition. The J-STD-002/J-STD-
003 has spent significant resources working this flux
change issue, discussing the chemistry details and conduct-
ing multi-company Design of Experiment investigations.
The J-STD-002 committee chairmen, Dave Hillman [Rock-
well Collins], Doug Romm [Texas Instruments], Mark
Kwoka [Intersil], Jack McCullen [Intel], feel that the com-
mittee has compiled a significant data set and held through
topic discussions supporting the proposed flux material
change. The four rationales for proposing/supporting the
flux change are summarized below:
1) A Proactive Solderability Testing Approach To The
Implementation of Non-Tin Finishes
A number of industry studies (1996 NEMI Surface Fin-
ishes Task Group Report, 1997 NCMS Lead-Free Solder
Project, 2000 National Physical Laboratory CMMT (A)
284 Report) have shown that an incompatibility of ‘‘R
type’’ flux with non-tin surface finishes such as palla-
dium, organic solderability preservatives (OSPs), and
immersion gold. The introduction of these various
metallic surface finishes on components and printed wir-
ing boards is no longer the exception but has/is quickly
becoming the norm. The use of a ‘‘R type’’ flux contain-
ing only naturally occurring activators has resulted in
producing ‘‘false negative’’ solderability test results
which impact both the component/board fabricator and
the assembler negatively in terms of cost and schedule.
2) Reduced Solderability Test Variability
The J-STD-002/003 solderability committees enlisted
the assistance of Dr. Carol Handwerker and the
resources of the National Institute of Standards & Tech-
nology (NIST) to investigate/compare a standard acti-
vated flux composition versus the ‘‘R type’’ flux compo-
sition. A detailed statistical analysis by Bill Russell,
Raytheon Systems, and NIST statisticians revealed the
use of a standard activated flux composition greatly
reduced the amount of solderability test variation. One
of the major goals of the J-STD-002/003 solderability
committees is to develop test methods and standards
which promote consistency across the industry.
3) Concerns of A Loss of Solderability Assessment
Safety Margin
The two major historical rationale for using an ‘‘R
type’’ flux: 1) colophony or rosin contains only naturally
occurring flux activator constituents and thus is not sub-
jected to the problems/complications of chemistry for-
mulas by the flux supplier; 2) it was an accepted indus-
try acknowledged fact that if a component or printed
wiring board surface was found to have acceptable sol-
derability test results using ‘‘R type’’ flux then the more
active flux formulations used in the assembly process
would produce acceptable solder process results. This
solderability assessment safety margin was a self
imposed, industry consensus decision. The J-STD-002/
003 committees understood the historical relevance
behind the decision to use ‘‘R type’’ flux and had a
equally strong desire to maintain a solderability assess-
ment safety cushion. However, committees fielded a
number of industry inputs to reassess the solderability
flux composition based on the technology improvements
in surface finishes, improvements in the flux chemistry
formulations from flux suppliers, and the desire to not
have excessive safety margin which would impact cost
and schedule in an non-value added manner. The com-
mittees conducted a number of tests (Wenger, Kwoka,
ACI) demonstrating, using a specific standard level of
activation on real world, industry supplied component
and printed wiring board cases, that the occurrence of a
‘‘false acceptable’’ solderability test result was
extremely low. There was no case that exhibited a ‘‘pass
ROL1 test - fail ROL0 test - Fail during board assembly
‘‘sequence. In fact the use of both ROL1 and ROL0 are
more likely to create a ‘‘false reject ‘‘dip and look sol-
derability test result when compared to board level sol-
dering performance.
4) Standardization of Solderability Test Flux Composi-
tion On A Global Scale
A second major goal of the J-STD-002/003 solderability
committees is to develop test methods and standards
Table 3-1 Flux Composition
Constituent
Composition by
Weight Percent
Flux #1 Flux #2
Colophony 25 ± 0.5 25 ± 0.5
Diethylammonium hydrochloride
(CAS 660-68-4)
0.15 ± 0.01 0.39 ± 0.01
Isopropyl Alcohol (IPA) Balance Balance
Weight of Chlorine as % of solids 0.2 0.5
IPC J-STD-003B March 2007
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Copyright Association Connecting Electronics Industries
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Not for Resale
No reproduction or networking permitted without license from IHS
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which promote global standardization for the electronics
industry. The standard activated flux composition
selected and tested by the committees has been utilized
in the International Electrotechnical Commission
(IEC) 60068-2-20 Soldering specification. The IEC
specification is successfully utilized for solderability
testing. Having compatibility of flux composition
requirements between the J-STD-002/003 specification
and the IEC specifications is a win-win situation for
electronics assemblers and component/printed wiring
board fabricators.
A number of the major flux chemistry suppliers have
been queried on the electronics industry ability to pur-
chase the standard activated flux composition and a
positive response was received. If you have any ques-
tions please contact the IPC Technical Staff to obtain
additional answers/clarification.
March 2007 IPC J-STD-003B
29
Copyright Association Connecting Electronics Industries
Provided by IHS under license with IPC
Not for Resale
No reproduction or networking permitted without license from IHS
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IPC J-STD-003B March 2007
30
Copyright Association Connecting Electronics Industries
Provided by IHS under license with IPC
Not for Resale
No reproduction or networking permitted without license from IHS
--`,,```,,,,````-`-`,,`,,`,`,,`---
//^:^^#^~^^"^~"^"^:$^~#:"#:$@:~^"$^:#*~^$^~:^#*^^:^^*\\