IPC-4556 印制板化学镍钯浸金(ENEPIG)规范ENG - 第10页

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Figure A7-7 Sn63Pb37 Test Coupons5&6 ................... 53
Figure A7-8 Sn63Pb37 Test Coupons7&8 ................... 53
Figure A7-9 Sn63Pb37 Test Coupon 18 .......................... 53
Figure A7-10 Sn63Pb37 Test Coupon 19 .......................... 54
Figure A7-11 SAC305 Test Coupons1&2....................... 54
Figure A7-12 SAC305 Test Coupons3&4....................... 54
Figure A7-13 SAC305 Test Coupons5&6....................... 55
Figure A7-14 SAC305 Test Coupons 16 & 17 ................... 55
Figure A7-15 SAC305 Test Coupon 18 ............................. 55
Figure A7-16 SAC305 Test Coupon 19 ............................. 56
Figure A7-17 Solderball Shear Force as a Function of
Palladium Plating Thickness ........................ 56
Figure A8-1 Wire Bond Test Vehicle Showing pin #1,
quadrants 1, 2, 3 and 4 ............................... 58
Figure A8-2 Example of 6 inx8inPanel Containing
1 in x 1in ENEPIG Wire Bond Coupons ...... 60
Figure A8-3 Visual Evaluation of Wire Bonding
Showing Classical Crescents Resulting
in Neck Breaks ............................................. 61
Figure A8-4 (Top) Summary of 1 mil Gold Wire
ENEPIG Destructive Pull Test (DPT)
Results and (Lower) Comparison of
X-Y Directional DPT Values ......................... 62
Figure A11-1a Meniscometer ............................................... 70
Figure A11-1b
Wetting Balance ........................................... 70
Figure A11-2 ENEPIG with Thin and Thick Pd from
Vendors1&2 .............................................. 71
Figure A11-3 Wetting Rate as a Function of Battelle
Class 2 Aging ............................................... 72
Tables
Table 3-1 Requirements of Electroless Nickel Electroless
Palladium Immersion Gold (ENEPIG) Plating ... 4
Table 4-1
Suggested Fabricator Qualification Plan ......... 10
Table 4-2 C=0 Sampling Plan (Sample Size for Specific
Index Value
1
) .................................................... 11
Table A3-1 Comparison of the Accuracy of Measurements
Relative to the C Readings for All Three
Deposits ........................................................... 21
Table A4-1 Summary of XRF Configuration Solutions
Offered for Measurement of ENEPIG
Plating on PCB’s with Advantages and
Disadvantages ................................................. 27
Table A5-1 XRF Measurements of the Nominal
0.5 micron Electroless Palladium
Samples ........................................................... 32
Table A6-S1 Preconditioning and Solder Paste Matrix
Used for Solder Spread Testing for a
Given ENEPIG Chemistry and Electroless
Palladium Thickness ........................................ 40
Table A7-1 Test Coupon Serial Number and Palladium
Thickness ......................................................... 48
Table A7-2 Sn63Pb37 Solderball Shear Test Results
Coupon Set 1 (grams) ..................................... 50
Table A7-3 Sn63Pb37 Solderball Shear Test Results
Coupon Set 2 (grams) ..................................... 50
Table A7-4 SAC305 Solderball Shear Test Results
Coupon Set 1 (grams) ..................................... 51
Table A7-5 SAC305 Solderball Shear Test Results
Coupon Set 2 (grams) ..................................... 51
Table A8-I Twenty-one Panels Marked (a) Whole
Panel, (b) Array and (c) Hand Cut ................... 59
Table A8-II Destructive Wire Bond Pull Test Force
(grams) Results for All 21 ENEPIG
Test Groups ..................................................... 60
Table A8-III Summary of Plating Finish Thicknesses for
Samples Wire Bonded ..................................... 63
Table A9-1 XRF Detectors and Their Limitations at
Typical Count Rates ......................................... 64
Table A11-1 ‘‘Relative Wettability Guideline,’’ Using
Contact Angle (θ
C
) As ‘‘General’’ Metric .......... 70
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IPC-4556 January 2013
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Specification for Electroless Nickel/Electroless Palladium/
Immersion Gold (ENEPIG) Plating for Printed Circuit Boards
1 SCOPE
1.1 Statement of Scope
This specification sets the requirements for the use of Electroless Nickel/Electroless Palladium/
Immersion Gold (ENEPIG) as a surface finish for printed boards. This specification sets requirements for ENEPIG deposit
thicknesses for applications including soldering, wire bonding and as a contact finish. It is intended for use by chemical
suppliers, printed board manufacturers, electronics manufacturing services (EMS) and original equipment manufacturers
(OEM).
1.2 Description ENEPIG is a tertiary layered surface finish plated over copper as the basis metal. ENEPIG consists of an
electroless nickel base layer over which is plated an electroless palladium barrier layer followed by a deposit of a thin
immersion gold as the final outer layer. For deposition process details, see APPENDIX 1 of this specification. It is a multi-
functional surface finish, applicable to soldering and to gold, aluminum and copper wire bonding. It is also suitable as the
mating surface for soft membrane and steel dome contacts. Additional applications include use in Low Insertion Force (LIF)
and Zero Insertion Force (ZIF) edge connectors and for press-fit applications. The electroless palladium layer forms a dif-
fusion barrier that impedes nickel diffusion to the gold surface. The immersion gold protects the palladium layer from react-
ing with contaminants prior to processing that might otherwise affect joining processes, such as wire bonding and soldering.
1.2.1 Electroless Nickel Reducing Agents - Phosphorus Content Phosphorus-containing, reducing agents are typically
used for the reduction of the electroless nickel during the deposition process and phosphorus is incorporated in the nickel
deposit. The level of this co-deposited element should be controlled within the suppliers specified process limits. Variation of
phosphorus levels outside the specified process limits may have adverse effects on the performance of the finish.
1.2.2 Electroless Palladium Reducing Agents There are two distinct classes of reducing agents used in electroless pal-
ladium baths currently available for use in the ENEPIG process, those that produce deposits that contain a co-deposited ele-
ment such as phosphorus, and those that produce an essentially pure palladium deposit. The level of the co-deposited ele-
ments should be controlled within the specified process limits. Examples of electroless palladium deposit from both these
classes have been evaluated during the development of this specification and no perceivable differences in performance were
observed in the tests of solderability or wire bondability
1.3 Objective This specification sets the requirements for ENEPIG as a surface finish (see Table 3-1 for a summary of
these requirements). As additional surface finishes require specifications, they will be addressed by the IPC Plating Processes
Subcommittee as part of the IPC-455X specification family. This and other surface finish specifications are under continuous
review. The 4-14 subcommittee will make appropriate amendments or revisions to these documents as required. The 4-14
Plating Processes Subcommittee undertook a ‘Round Robin’’ study to generate data to support the recommendations sited
for the various aspects of this specification. For an outline of the study, refer to APPENDIX 2.
1.3.1 Order of Precedence In the event of conflict, the following order of precedence shall apply:
1. The purchase order. This includes AABUS exceptions to this specification.
2. The master drawing. This includes AABUS exceptions to this specification.
3. This specification.
4. Applicable documents as detailed in Section 2 of this document.
1.3.1.1 Appendices This specification contains eleven Appendices provided for information which are included after the
main body of this document. Be aware that none of the content of these appendices are binding requirements unless sepa-
rately and specifically specified herein, or as required by purchase order, master drawing, other applicable documents, or as
established AABUS.
1.4 Performance Functions
1.4.1 Solderability
One of the two primary functions of ENEPIG is to provide a solderable surface finish capable of pro-
viding IPC Category 3 shelf life (minimum 12 months) per IPC-J-STD-003 testing. This shelf life is suitable for all surface
mount, hybrid and through-hole assembly applications. The use of electroless palladium as a diffusion barrier between the
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