IPC-4556 印制板化学镍钯浸金(ENEPIG)规范ENG - 第72页
IPC-4556-a8-4 Figure A8-4 (T op) Summary of 1 mil Gold Wire ENEPIG Destructive Pull T est (DPT) Results and (Lower) Comparison of X-Y Directional DPT V alues 4 2 6 8 10 12 De s tr u ctive P u ll V a l u e s (Gr a m s ) D…

1 mil Gold Wire Bonding and Destructive Pull Testing Evaluation per MIL-STD-883 The 1 mil gold wire bond parameters
developed for the ENEPIG plating finish test vehicles were based upon the same 1 mil gold wire bond approach used in the
development of the wire bond parameters designed for production level substrates with gold plating finish.
Manufacturing processes and operations are inherently specific. While automatic wire bonders are similar, they may be dif-
ferent in specific aspects. Wire bond fixtures and capillaries are critical and play a significant role in a successful wire bond-
ing operation. The experience levels of the wire bond operator are also important.
Following removal of the coupons from the panel and marking of the coupons, the parts were baked in a nitrogen oven at
150 °C [302 °F] for 4 hours. The parts were then plasma cleaned and wire bonded. 120 wires were placed onto each con-
ditioned coupon. A minimum of 10 each 1 mil gold wires per coupon in the X-direction and 10 wires in the Y-direction were
bonded, followed by DPT (see Figure A8-1).
The 1 mil gold wire bonding parameters selected for bonding on substrates with an electrolytic gold plating finish were
modified for the bonding of ENEPIG coupons with the immersion gold finish, as follows:
Reduction in Power by 7%
Force was increased by 10%
Time was increased by 100%
Stage temperature at the substrate surface was 150 °C±5°C[302 °F ± 9 °F].
MIL-STD 883 destructive pull test requirements for all ENEPIG test vehicles were met (see Figures A8-3 and A8-4).
Figure A8-3 Visual Evaluation of Wire Bonding Showing Classical Crescents Resulting in Neck Breaks
(Left) Destructive Pull Test value of 12.5 grams / (Right) DPT is 5.5 grams
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Vac-High PC-Std. 10 kV
50 m
4/5/2011 *000055 VarcHigh Pc Srd.oky
20 pm
41520412000056

IPC-4556-a8-4
Figure A8-4 (Top) Summary of 1 mil Gold Wire ENEPIG Destructive Pull Test (DPT) Results and (Lower) Comparison of X-Y
Directional DPT Values
4
2
6
8
10
12
Destructive Pull Values (Grams)
Data S
Plating Methodology: Wilrebond Direction
et #1
Data Set #2
Data Set #3
Data Set #4
Data Set #5
Data Set #6
Data Set #7
Data Set #8
Data Set #9
Data Set #10
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Data Set #20
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Data Set #22
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Data Set #24
Data Set #25
Data Set #26
Data Set #27
Data Set #28
Data Set #29
Data Set #30
Data Set #31
Data Set #32
Data Set #33
Data Set #34
Data Set #35
Data Set #36
Data Set #37
Data Set #38
Data Set #39
Data S
et #40
Summary of NiPdAu Destructive Wire Bond Pull Tes
Data Set #41
Data Set #42
t for 1-MIL Gold Wire
I II-SN13-3 II-SN13-4 III-SN7-2 III-SN7-3 III-SN7-4
IVB IXB XXB
VA VIIA VIIIA XB
XIB
XIIA
XXIB XXII2-A XXIVA
Participants
Uyemura - Japan
Uyemura - US
XXR
XXVA
A
DOW
MacDermid
Cookson-Ethone
OMG
Atotech
Mil-STD 883 Requirement = 3 Grams
14
13
12
11
10
9
8
7
6
5
4
ENEPIG Plating Finish 1-mil Gold Wirebond Results X-Y Bond DPT Comparison
Q1
Min
Median
Max
Q3
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Upon completion of the final wire bonding and submission of data, the plating finish sample thicknesses were obtained and
summarized. The results are shown in Table A8-III.
SUMMARY
The tasks identified through consensus of the IPC 4-14 Plating Processes Subcommittee to evaluate the suitability of Elec-
troless Nickel Electroless Palladium Immersion Gold (ENEPIG) as a finish for gold ball wire bond bondability included
development of an industry Round Robin with roles and responsibilities, development of a wire bond test vehicle, partici-
pation of commercial ENEPIG plating finish suppliers, establishment of ENEPIG plating finish attributes to evaluate the wire
bonding and 1 mil gold ball wire bonding destructive pull testing evaluation per MIL-STD883.
The wire bond test vehicle artwork was supplied by Kulicke and Soffa, fabrication of the test vehicle was conducted by TTM
Technologies, Inc. and the ENEPIG plating finish was supplied by commercial suppliers, Uyemura, Dow Electronic Mate-
rials, MacDermid, Enthone-Cookson, OMG and Atotech.
The electroless palladium target thicknesses were 4, 8, 12 and 20 microinches. The nickel and immersion gold thicknesses
were not considered variables.
One set of 1 mil gold ball wire bond parameters were selected for testing all six (6) ENEPIG supplier finishes evaluated in
this study.
All destructive pull testing results for all 6 commercial ENEPIG plating finish suppliers were in compliance with MIL-STD-
883 requirements.
Table A8-III Summary of Plating Finish Thicknesses for Samples Wire Bonded
Summary of Plating Finish Thickness per Tracking Codes (µinches)
ID Code ID IAu Thickness (µin) EPd Thickness (µin) EN Thickness (µin)
1 I 2.07 3.48 349.32
2 II-SN13-3 2.2 5.49 343.83
3 II-SN13-4 2.54 6.84 371.24
4 III-SN7-2 2.9 1.57 190.3
5 III-SN7-3 2.15 6.38 175.14
6 III-SN7-4 3.3 8.32 182.84
7 IVB 1.64 5.78 176.75
8 IXB 0.77 9.95 190.16
9 XXB 0.72 16.26 176.21
10 VA 1.16 4.46 217.78
11 VIIA 1.82 7.76 212.54
12 VIIB 2.06 10.34 202.79
13 VIIIA 2.22 4.39 280.83
14 XB 1.42 7.48 267.04
15 XIB 1.68 11.01 254.14
16 XIIA 1.35 3.8 181.65
17 XXIB 1.24 5.93 184.07
18 XXII-2A 1.59 6.9 209.22
19 XXIVA 1.48 17.95 196.17
20 XXR 0.56 4.77 219.95
21 XXVA 0.73 7.37 236.76
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