prober-english - 第10页

■ PROBE SYST EM FOR FPD FPD Manual  Prober  for  Flat ‐ Panel  Display We  custom ‐ make  manual  probers  that  support  FPDs (flat ‐ panel  display)  ranging  from  small  to  large  glass  substrates…

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HiSOLSemiAutomatic Prober ControlSoftware
Manualoperation
BINmapping
WaferMapsetting
Seals feature
Supportedautomaticmeasurementsoftware
KEYSIGHTtechnologies
EasyEXPERT
DesktopEasyEXPERT
WaferProExpress
TFF/KEITHLEYinstruments
4200SCS KITE(KeithleyInteractiveTestEnvironment)
ACS
Proplus designsolution Noisepro
OtherGPIBcommunicationenabledsoftware
Userfriendlymultifunctionalsemiautomaticprobingsoftware.
SupportsWindows8asitsoperatingsystem.(Windows7isalsosupported.)
AlsoavailableasamanualproberwithasoftwareGUIorjoystickcontroller.
ReceivingBINinformationfromahigherlevelmeasuringinstrument,itispossibletodisplayBINmapping.
Supportswafer
thermalexpansioncompensationfunctionforThermaltest.
PossibletocontrolthesemiautomaticproberusingtheGPIBcommandsentfromahigherlevelmeasuring
instrument or PC.
Possibletoprovidesoftwareformakingadatabaseofandextractingparametersofrawdataobtainedfromeach
measuring instrumentinordertoanalyzethedata.
(Optional)
Theselfdevelopedsoftwareallowsuserstoincorporatecustomizedrequirements.
SEMI-AUTOMATIC PROBER
SemiAutomaticProber
9
PROBE SYSTEM FOR FPD
FPD
ManualProberforFlatPanelDisplay
WecustommakemanualprobersthatsupportFPDs (flatpaneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandCVmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
Thisproberalsosupportslightirradiationonthepanelsurface bythesolarsimulatororotherdeviceandlightirradiationon
the
bottom sideofpanel(backlight)bysuperhighluminancewhiteLED.
Lightirradiationonthebottom sideofpanel
byultrahighluminosityLED
(upto40,000cd/cm2) *Substage
Lightirradiationonthepanelsurfaceby
thesolarsimulatororotherdevice
Builtinlasercutter
(laserwavelength:1064,532,355,266nm)
Ultrahighaccuracymodelforstable
probingof
submicronpatterns
Function examples of systems for small to medium-sized panels
Model HMP-FPD series
Widerangeprobingareathatenableslayout
of FPDdevices.
ProbeSystemforFPD
10
FPD
PROBE SYSTEM FOR FPD
Model HSP-FPD series
SemiAutomatic ProberforFlatPanelDisplay
Function examples of systems for small to medium-sized panels
Commongatepadprobing(onsubplaten)
WiderangemicroscopeXYtravel
Widerangeprobingarea
ProgrammableXYZpositioner(manipulator)
WecustommakeSemiautomatic probersthatsupportFPDs (flatpaneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandCVmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
ProbeSystemforFPD
11
High/Lowtemperaturemodel60C +200C