prober-english - 第10页
■ PROBE SYST EM FOR FPD FPD Manual Prober for Flat ‐ Panel Display We custom ‐ make manual probers that support FPDs (flat ‐ panel display) ranging from small to large glass substrates…

HiSOLSemi‐Automatic Prober ControlSoftware
Manualoperation
BINmapping
WaferMapsetting
Seals feature
Supportedautomaticmeasurementsoftware
KEYSIGHTtechnologies
‐EasyEXPERT
‐DesktopEasyEXPERT
‐WaferProExpress
TFF/KEITHLEYinstruments
‐4200‐SCS KITE(KeithleyInteractiveTestEnvironment)
‐ACS
Proplus designsolution ‐Noisepro
OtherGP‐IBcommunication‐enabledsoftware
‐ User‐friendlymultifunctionalsemi‐automaticprobingsoftware.
‐ SupportsWindows8asitsoperatingsystem.(Windows7isalsosupported.)
‐ AlsoavailableasamanualproberwithasoftwareGUIorjoystickcontroller.
‐ ReceivingBINinformationfromahigher‐levelmeasuringinstrument,itispossibletodisplayBINmapping.
‐ Supportswafer
thermalexpansioncompensationfunctionforThermaltest.
‐ Possibletocontrolthesemi‐automaticproberusingtheGP‐IBcommandsentfromahigher‐levelmeasuring
instrument or PC.
‐ Possibletoprovidesoftwareformakingadatabaseofandextractingparametersofrawdataobtainedfromeach
measuring instrumentinordertoanalyzethedata.
(Optional)
‐ Theself‐developedsoftwareallowsuserstoincorporatecustomizedrequirements.
■ SEMI-AUTOMATIC PROBER
Semi‐AutomaticProber
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■ PROBE SYSTEM FOR FPD
FPD
ManualProberforFlat‐PanelDisplay
Wecustom‐makemanualprobersthatsupportFPDs (flat‐paneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(‐40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandC‐VmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
Thisproberalsosupportslightirradiationonthepanelsurface bythesolarsimulatororotherdeviceandlightirradiationon
the
bottom sideofpanel(backlight)bysuper‐highluminancewhiteLED.
Lightirradiationonthebottom sideofpanel
byultrahighluminosityLED
(upto40,000cd/cm2) *Sub‐stage
Lightirradiationonthepanelsurfaceby
thesolarsimulatororotherdevice
Built‐inlasercutter
(laserwavelength:1064,532,355,266nm)
Ultrahigh‐accuracymodelforstable
probingof
submicronpatterns
Function examples of systems for small to medium-sized panels
Model HMP-FPD series
Widerangeprobingareathatenableslayout
of FPDdevices.
ProbeSystemforFPD
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FPD
■ PROBE SYSTEM FOR FPD
Model HSP-FPD series
Semi‐Automatic ProberforFlat‐PanelDisplay
Function examples of systems for small to medium-sized panels
Commongatepadprobing(onsub‐platen)
‐ WiderangemicroscopeX‐Ytravel
‐ Widerangeprobingarea
‐ ProgrammableX‐Y‐Zpositioner(manipulator)
Wecustom‐makeSemi‐automatic probersthatsupportFPDs (flat‐paneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(‐40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandC‐VmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
ProbeSystemforFPD
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High/Lowtemperaturemodel(‐60゜C~ +200゜C)