prober-english - 第11页

FPD ■ PROBE SYST EM FOR FPD Model HSP-FPD series Semi ‐ Automatic Prober  for  Flat ‐ Panel  Display Function examples of syste ms for small to mediu m-sized panels Common  gate  pad  probin g  (on  sub ‐ platen)…

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PROBE SYSTEM FOR FPD
FPD
ManualProberforFlatPanelDisplay
WecustommakemanualprobersthatsupportFPDs (flatpaneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandCVmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
Thisproberalsosupportslightirradiationonthepanelsurface bythesolarsimulatororotherdeviceandlightirradiationon
the
bottom sideofpanel(backlight)bysuperhighluminancewhiteLED.
Lightirradiationonthebottom sideofpanel
byultrahighluminosityLED
(upto40,000cd/cm2) *Substage
Lightirradiationonthepanelsurfaceby
thesolarsimulatororotherdevice
Builtinlasercutter
(laserwavelength:1064,532,355,266nm)
Ultrahighaccuracymodelforstable
probingof
submicronpatterns
Function examples of systems for small to medium-sized panels
Model HMP-FPD series
Widerangeprobingareathatenableslayout
of FPDdevices.
ProbeSystemforFPD
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FPD
PROBE SYSTEM FOR FPD
Model HSP-FPD series
SemiAutomatic ProberforFlatPanelDisplay
Function examples of systems for small to medium-sized panels
Commongatepadprobing(onsubplaten)
WiderangemicroscopeXYtravel
Widerangeprobingarea
ProgrammableXYZpositioner(manipulator)
WecustommakeSemiautomatic probersthatsupportFPDs (flatpaneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandCVmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
ProbeSystemforFPD
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High/Lowtemperaturemodel60C +200C
25mm sq.
Model HMP-V80 series
CompactVacuumProberforR&D(atUltraLowtoUltraHighTemperatures)
ThisisacompactvacuumproberforR&DthatsupportsIV/CV/RFmeasurementson5mmto25mmsamples.
Thereareavarietyofmodelsavailablesuchasonethatsupportstemperaturetestsatultralowtemperaturesonthe
4klevelandonethatsupports
thetemperaturetestsatupto+500°C.
Substrate Size
General
Ultimatevacuum*
Numberofmeasurementchannels
Measurementfeedthroughconnector*
Probe XYZtravel
Magnification*
Illuminatingapparatusformicroscopes*
ProbeAdjustmentsensitivity
5mm 20mm square
1x10E‐4Pa
40x 240x(onmonitor)
LEDring lighti ng
2 7(6‐ probemaximum1 chuck)
Hermetically triaxial(Jack)standard
X30mm,Y50mm, Z15mm
0.01mm
Microscopemovement*
Microscopetype
3jointhorizontalswingarm
CCDmonoscopewithLCDmonitor
*Itemswithasteriskvarydependingonsystemconfiguration.
Movements
Microscope
Roomtemperatureorultralowtemperaturemodel
Model Temperaturerange Heatingmethod Coolingmethod
HMPV80 Ambient None None
HMPV80LH
4.2kto298k(+25°C)
Heater Liquidheliumtransfer
HMPV80LHM
8klevelto473k(+2 00°C)
Heater Liquidheliumtransfer
HMPV80LHH
10klevelto573k(+300°C)
Heater Liquidheliumtransfer
HMPV80LN
80kto298k(+25°C)
Heater Liquidnitrogencryostat
HMPV80LNM
80kto473k(+200°C)
Heater Liquidnitrogencryostat
HMPV80LNH
80kto573k(+300°C)
Heater Liquidnitrogencryostat
HMPV80PS
80kto298k(+25°C)
Heater FreePistonStirlingcooler
Ultrahightemperaturemodel
Model Temperaturerange Heatingmethod Coolingmethod
HMPV80
R.T.to+300°C
Heater Compressedair
HMPV80LH
R.T.to+400°C
Heater Compressedair
HMPV80LHM
R.T.to+500°C
Heater Compressedair
Common specification
VACUUM PROBE SYSTEM
Vacuumprobesystem
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