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FPD ■ PROBE SYST EM FOR FPD Model HSP-FPD series Semi ‐ Automatic Prober for Flat ‐ Panel Display Function examples of syste ms for small to mediu m-sized panels Common gate pad probin g (on sub ‐ platen)…

■ PROBE SYSTEM FOR FPD
FPD
ManualProberforFlat‐PanelDisplay
Wecustom‐makemanualprobersthatsupportFPDs (flat‐paneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(‐40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandC‐VmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
Thisproberalsosupportslightirradiationonthepanelsurface bythesolarsimulatororotherdeviceandlightirradiationon
the
bottom sideofpanel(backlight)bysuper‐highluminancewhiteLED.
Lightirradiationonthebottom sideofpanel
byultrahighluminosityLED
(upto40,000cd/cm2) *Sub‐stage
Lightirradiationonthepanelsurfaceby
thesolarsimulatororotherdevice
Built‐inlasercutter
(laserwavelength:1064,532,355,266nm)
Ultrahigh‐accuracymodelforstable
probingof
submicronpatterns
Function examples of systems for small to medium-sized panels
Model HMP-FPD series
Widerangeprobingareathatenableslayout
of FPDdevices.
ProbeSystemforFPD
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FPD
■ PROBE SYSTEM FOR FPD
Model HSP-FPD series
Semi‐Automatic ProberforFlat‐PanelDisplay
Function examples of systems for small to medium-sized panels
Commongatepadprobing(onsub‐platen)
‐ WiderangemicroscopeX‐Ytravel
‐ Widerangeprobingarea
‐ ProgrammableX‐Y‐Zpositioner(manipulator)
Wecustom‐makeSemi‐automatic probersthatsupportFPDs (flat‐paneldisplay)rangingfromsmalltolargeglasssubstrates.
Amicroscopeandprobingareawithawiderangeofmotionallowstableprobingacrossthepanelsurface.
Aheatingtype(upto+200°C)orthermaltype(‐40°Cto+200°C)can
beselectedfortherectanglepanelchuckand
ultralowcurrentmeasurementsonthefAlevelandC‐VmeasurementsonthesubpFlevelaresupportedforalltemperature
zones.
ProbeSystemforFPD
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High/Lowtemperaturemodel(‐60゜C~ +200゜C)

25mm sq.
Model HMP-V80 series
CompactVacuumProberforR&D(atUltraLowtoUltraHighTemperatures)
ThisisacompactvacuumproberforR&DthatsupportsI‐V/C‐V/RFmeasurementson5‐mmto25‐mmsamples.
Thereareavarietyofmodelsavailablesuchasonethatsupportstemperaturetestsatultralowtemperaturesonthe
4klevelandonethatsupports
thetemperaturetestsatupto+500°C.
Substrate Size
General
Ultimatevacuum*
Numberofmeasurementchannels
Measurementfeed‐throughconnector*
Probe X‐Y‐Ztravel
Magnification*
Illuminatingapparatusformicroscopes*
ProbeAdjustmentsensitivity
5mm~ 20mm square
1x10E‐4Pa
40x~ 240x(onmonitor)
LEDring lighti ng
2~ 7(6‐ probemaximum,1‐ chuck)
Hermetically triaxial(Jack)standard
X30mm,Y50mm, Z15mm
<0.01mm
Microscopemovement*
Microscopetype
3jointhorizontalswingarm
CCDmono‐scopewithLCDmonitor
*Itemswithasteriskvarydependingonsystemconfiguration.
Movements
Microscope
Roomtemperatureorultralowtemperaturemodel
Model Temperaturerange Heatingmethod Coolingmethod
HMP‐V80 Ambient None None
HMP‐V80‐LH
4.2kto298k(+25°C)
Heater Liquidheliumtransfer
HMP‐V80‐LHM
8klevelto473k(+2 00°C)
Heater Liquidheliumtransfer
HMP‐V80‐LHH
10klevelto573k(+300°C)
Heater Liquidheliumtransfer
HMP‐V80‐LN
80kto298k(+25°C)
Heater Liquidnitrogencryostat
HMP‐V80‐LNM
80kto473k(+200°C)
Heater Liquidnitrogencryostat
HMP‐V80‐LNH
80kto573k(+300°C)
Heater Liquidnitrogencryostat
HMP‐V80‐PS
80kto298k(+25°C)
Heater FreePistonStirlingcooler
Ultrahightemperaturemodel
Model Temperaturerange Heatingmethod Coolingmethod
HMP‐V80
R.T.to+300°C
Heater Compressedair
HMP‐V80‐LH
R.T.to+400°C
Heater Compressedair
HMP‐V80‐LHM
R.T.to+500°C
Heater Compressedair
Common specification
■ VACUUM PROBE SYSTEM
Vacuumprobesystem
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