prober-english - 第26页

26 Accessories Accessories ■ ACCESSORI ES Probes and Probe Arms Model Maximum  voltage （ DC  ±） *1 Frequency  band （ 3dB ） *1 Temperature  range Note HP40 500V DC  ～ 30  kHz ‐ 65 ℃～ +300 ℃ noncoaxial Support  disp…

Accessories

■ ACCESSORIES

Probe & probe arm

DCProbe

Kelvinprobe

Specialtyprobe

HP40

Standardprobe

HP40S

Suspensionprobe

HCP40

High‐performanceprobe

HCP40LP

Lowprofile

High‐performanceprobe

A74CJ

1tip/Kelvinprobe

A74‐KS

1tip/Kelvinprobe

A73‐TK

TrueKelvinprobe

Coaxial・ Triaxialprobe

RFprobe・ Activeprobe ProbeforHigh‐powerdevices

HCP40‐HV

High‐voltageprobe

HCP‐SHC

High‐currentprobe

GGBPicoprobe

(Activeprobe)

VariousRFprobe

HCP40U

Freeangleprobe

(Universalprobe)

HCP40NM

Non‐magneticprobe

A73‐UL

High‐performanceprobe

forNoisemeasurement

Weofferoptimalprobeforyourrequiredmeasurementapplication fromourabundantlineup.

Wealsooffercustomizedprobesaccordingtoyourrequiredspecification.

Accessories

■ ACCESSORIES

Probes and Probe Arms

Model

Maximumvoltage

（DC±）

Frequencyband

（3dB）

Temperature

range

Note

HP40 500VDC～ 30kHz ‐65℃～+300℃

noncoaxial

Support

disposableprobe

●

HP40S 500VDC～ 30kHz ‐65℃～+250℃

noncoaxial，softcontact

●

HCP40 Coax500V，Triax1.2kVDC～ 10MHz 4k～+300℃

Ultralowcurrentmeasurement(fA level)

●

HCP40LP Coax500V，Triax1.2kVDC～ 10MHz 4k～+300℃

Ultralowcurrentmeasurement(fA level)，lowprofile

●

A74CJ 500VDC～ 100MHz 10k～+200℃

UltralowsignalI‐V・C‐Vmeasurement，1tip/kelvin

△

A74KS 500VDC～ 10MHz 4k～+300℃

1tip/Kelvin，I‐V・C‐Vmeasurement，supportdisposableprobes

●

A73TK 500VDC～ 100MHz 10k～+200℃

Truekelvin，ultralowsignalI‐V・C‐V，LCR

－

HCP40‐HV Coax10kV，Triax3kVDC～ 10MHz 4k～+300℃

Highvoltage，sup portdisposableprobes

●

HCP‐SHC 200VDC～ 30kHz 50k～+300℃

SupportsmaximumcurrentofDC20A，200Apulse

－

HCP40‐NM 500VDC～ 10MHz 4k～+300℃

Non‐magnetic，proberforapplyingmagneticfields

●

A73‐UL 500VDC～ 300MHz 10k～+200℃

1/f noise,RTN,TLP

－

Typicalspecifications

Note *1Frequencybandandmaximumvoltagevariesdependingonatypeof cableconnectedtoaprobe.

*2Onlyspecialcoaxialsemirigidprobeatthetipisreplaceable.

Replaceable ProbeTips （Disposableprobes）

HiSOL’sprobetiplineup

Tungsten (W)

Excelsinelectricalcharacteristics,elasticmodulus,mechanicalstrength,andalsocosteffective.Tungsteniswidelyusedprobematerial.

Differentfromotherprobematerials,itcandoshapemachiningatthetipwithetching.Itcandoextra‐finetipprocessingthatmachinecannot

do.Also,therearevarietiesoftipshapes.

Especiallycompatiblewithaluminumpad.

TungstenwithAuplating

Goldplatedonthesurfaceoftungstenprobe.Specialmethodis usedforhigheradhesivestrengthwithtungsten.

Lowcontactresistanceagainstgoldpadandcopperpad.Excelsinohmicfeatures. Non‐magneticsinceNicoatisnotusedinunderlayer

25mm(standard )・ 0.5mm

0.6/1.2/ 2.4/5/7/12/25

Straightor45°bend

25mm(standard )・ 0.5mm

5/7/10/12.5/20/25

Straightor45°bend

Paliney®7

Palladium basednoblemetalalloydevelopedforprobes. (Pd 35 / Ag 30 / Pt 10 / Au 10 / Cu 14 / Zn1 %)

Contactresistanceissmallandalsostable.Verylittlesurfaceoxidationinatmosphereandhightemperature.Suitableforapplyinghighcurrentand

continuoustest applicationunderhightemperature.Needtobecautiouswhenhandlingthinnerprobessincetheygetbendeasiercompareto

tungstenprobes. (Tipradiusofmorethan20μmisrecommended. )

25mm(standard )・ 0.5mm

5/7/10/12.5/20/25/50/100

Straightor45°bend

BerylliumCopper （Be‐Cu）

Probematerialiscopperalloythatexcelsinelectriccharacterandelasticmodulus. (Cu98/Be2%)

Smallercontactresistancecomparetotungsten,andstable.Suitableforcontactingtogoldpadandcopperpad.Damagetopadsbyscrubbing

canbereduced.Notrecommendedforcontinuoustestunderhigh

temperature.

25mm(standard )・ 0.5mm

5/7/10/12.5/20/25

Straightor45°bend

Paliney® 7isatrademarkofDeringer‐Ney

Overalllength・shankdiameter (mm)

Tipradius(μm)

Shape

Overalllength・shankdiameter (mm)

Tipradius(μm)

Shape

Overalllength・shankdiameter (mm)

Tipradius(μm)

Shape

Overalllength・shankdiameter (mm)

Tipradius(μm)

Shape

Accessories

■ ACCESSORIES

Probes and Probe Arms

TungstenCarbide (TC)

Highlyrigidandabrasion‐resistantprobematerial.Toutilizethecharacteristic,itcan beusedforscribe,

exfoliationofoxidelayer,cuttingmetal pattern,andtouchdownsensorbesideselectricalmeasurement.Shankcannotbebent.

WhiskerProbe

Probewithminuscule tipradiustocontactinternalcircuit.Ultrathintungstenwireissplicedatthetipofφ0.5mm nickelshank.

Elasticity oftungstenwirehasappropriatespringpressure.Itreducesdamagetocircuitduringprobing.

φ0.5mm shankcanbebentorcutfreely.Wirediameterisavailablein 127μm,76μm,and25μm.

25mm(standard )・ 0.5mm

5/7/10/12.5/20/25

Straightonly

Overalllength・shankdiameter(mm) 34mm・ 0.5mm

Wirediameter・Tipradius(μm)

Diameter127μm： 0.35/0.75/1

Diameter 76μm： 0.1/0.35/0.5

Diameter 25μm： 0.25/0.5/0.75

Shape Straightonly (Shankcanbebentorcut )

Wirelength(mm) 5mm

ReplaceableCoaxialProbeTipforA74CJ

ReplaceablesemirigidcoaxialprobespeciallyforA74CJ.Exceptabout2.5mmoftipswhichtheneedlepointisexposed,

ithas50Ω coaxialgeometryandexcelsinhighfrequencyproperty.Materialofthetipistungsten (W).Variousradiusisavailable.

Probeconductordia.・shielddia. 0.2mm・ 0.86mm

Tipradius(μm) 0.5/1.5/5/10/12.5/15/20/25/35/50

Shape Lowprofile double‐bend

Probe Card・Probe Card Adaptor

Standard probecardadaptor

for4.5” probecard

Probecardadaptorfor

circularprobecard

Probecardadaptorfor

Shieldchamber(SC)

Adaptorforlargediameter

WLR probecard

VariousProbeCardAdaptor

ProbeCardfor+300゜CHighTemperature

Wecustomizeprobecardadaptoraccordingtoyourrequiredspecification.

WeofferprobecardsmanufacturedbyCeladonSystems inUSA.Theysupportlownoiseandlowleakmeasurementinthe

temperature rangeof‐65゜C～ +350゜C.

Overalllength・shankdiameter (mm)

Tipradius(μm)

Shape