k-series-brochure.pdf - 第3页
4 5 K s er i e s 3D A OI T ak e inspe c ti on t o anoth er dim ension P o w e r f u l 3 D AO I Dril l down i nt o p ow er ful image libr ary t ools with adva nced algori thmic as sistanc e . Precise optical m etrology Hi…
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Advanced inspection that
stops defects at their source
At Mycronic, we’re on a mission to enable tomorrow’s zero-defect SMT line.
K series 3D AOI brings your factory one step closer to this vision by delivering
scalable high-precision metrology in a single, intelligent, closed-loop system.
The days of automated optical inspection as a post-refl ow quality check are long
gone. In today’s intelligent factory, you can combine pre- and post-refl ow data to
better predict and defi ne the root causes of defects, inform real-time decisions
and analyze complex process trends over time.
The K series 3D AOI system achieves all this by combining high-defi nition 2D
texture with proprietary shadow-free 3D inspection, resulting in comprehensive
coverage of component body and solder joints. For your operators, this means
extremely reliable detection of misplaced components, tombstones and more
for any degree of board complexity. Thanks to smart data visualization, you
can leverage sophisticated real-time data to signifi cantly reduce false calls and
escape rates while continuously improving your products in even the most
demanding production environments.
It’s one more part of the Mycronic 4.0 intelligent
factory, and one step closer to perfection.
Actual image from K series
France-based Vi TECHNOLOGY, a global pioneer in 3D AOI and SPI, is now
part of the Mycronic Group. Already used by leading global manufacturers
of aerospace, automotive and consumer electronics, Vi TECHNOLOGY’s
inspection solutions o er a uniquely integrated, accurate and scalable
architecture – an ideal complement to the Mycronic 4.0 intelligent factory.
France-based Vi TECHNOLOGY, a global pioneer
in 3D AOI and SPI, is now part of the Mycronic Group.
Already used by leading global manufacturers of
aerospace, automotive and consumer electronics,
Vi TECHNOLOGY’s inspection solutions o er a
uniquely integrated, accurate and scalable
architecture – an ideal complement to the
Mycronic 4.0 intelligent factory.
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K series 3D AOI
Take inspection to
another dimension
Powerful 3D AOI
Drill down into powerful image
library tools with advanced
algorithmic assistance.
Precise optical metrology
High-precision metrology
combining high-defi nition 2D
texture with shadow-free 3D
inspection that eliminates image
cropping and warpage e ects.
Complete test coverage
Comprehensive defect coverage
accurately measures component
body and solder joints to identify
misplaced components, tomb-
stones, lifted leads and more.
High resolution
camera
Telecentric optics
Laser
High
resolution
angular
cameras
LED
l i g h t i n g
Pin height
measurement
Coplanarity
Lifted lead Bridge
Tombstone
Actual images from K series
LEDs specifi c
measurements
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Ensure comprehensive
defect coverage
To enable reliable data capture and high-resolution 3D visualization,
the K series expands defect coverage using a combination of 2D texture
and shadow-free 3D inspection. This is made possible by a range of
state-of-the-art camera, 3D sensor and motion system technologies.
• High-resolution camera with fully telecentric
lens captures high-quality RGB images for
inspection and review.
• High-performance 3D sensor combines vertical
lasers to avoid projection shadows, optimized
angles to minimize intrinsic shadow e ects and
adaptive height fi ltering that adapts the sensor’s
sensitivity to component geometry.
Industry-leading performance
and production stability
Today’s lean and agile manufacturing calls for superior fi rst pass yield
e ciency and 100% performance portability from one line to another.
K series satisfi es the most demanding customers in the electronics assembly
industry where quality and productivity are both mission - and business -
critical. The system has been designed to optimize test coverage at line
speed for the smart factory while o ering 100% o ine capabilit ies.
• Superior uptime above 99.5%.
• Unifi ed software suite for pre-refl ow, post-refl ow and post-wave AOI applications.
• 100% o ine programming and tuning capabilities.
• Rapid inspection time up to 100 cm
2
/s.
• High-precision motion system utilizing three
linear motors for accurate high-speed motion
and 0.5 µm resolution optical encoders for
accurate positioning.
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