CyberReport Datasheet EN.pdf - 第2页

DS-CYBERREPORT -270224 For more inf ormation, speak with your Nordson represent ative or c ontact your Nordson re gional oice Nordson T est & Inspection Europe, SEA, Africa ti-sales-eu@nordson.com Nordson T est &amp…

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CyberReport, a complete SPC solution, oers full-fledged machine-level to factory-level SPC capability,
historical analysis and reporting tools. CyberReport provides complete traceability for eective process
verification and control, resulting in improved yields.
CyberReport is easy to set up in a few clicks while its intuitive interface facilitates quick learning
with minimal training. CyberReport is robust and scalable while enabling an extremely
compact database size, fast parsing and charting speed.
Fast, Intuitive and Scalable SPC Solution
CyberReport
TM
Soware
Factory-level SPC
Line-level SPC
Machine-level SPC
Yield
CYBERREPORT
SPISOFTWARE
AOISOFTWARE
CYBERREPORT
CYBERCMM
SPISOFTWARE
AOISOFTWARE
CYBERCMM
CYBER
PRINTOPTIMIZER
CYBER
PRINTOPTIMIZER
DS-CYBERREPORT-270224
For more information,
speak with your Nordson
representative or contact
your Nordson regional oice
Nordson Test & Inspection
Europe, SEA, Africa
ti-sales-eu@nordson.com
Nordson Test & Inspection
Americas
ti-sales-us@nordson.com
Nordson Test & Inspection China
ti-sales-cn@nordson.com
Nordson Test & Inspection Japan
ti-sales-jp@nordson.com
Nordson Test & Inspection
Singapore
ti-sales-eu@nordson.com
Nordson Test & Inspection
Taiwan
ti-sales-tw@nordson.com
Nordson Test & Inspection Korea
ti-sales-korea@nordson.com
www.nordson.com/TestInspect
Soware
CyberReport
TM
Specifications
Recommended Hardware
2.8 GHz processor, 8 GB RAM, 2 TB hard disk space
Inspection Soware Compatibility
QX 6.7 and later • SPI v2.5 and later • SPI v5.3 and later • SQ v1.0 and later
Output Formats
PDF, CSV, BMP
Supported Operating System
Windows 7, Windows 10
SDK
Windows XP, 7, 10 (32 & 64 bit). Windows Server 2003, 2008, 2012 (32 & 64 bit)
Firmware Support
Ability to upgrade firmware through CyberSpectrum
FPY by Line FPY by Product
Defects by Type Defects by Line
SPC by Feature SPC by Feature and Panel
Panel View Defect View
Sample Report
Comprehensive Charts for Eective Process Control
Yield Analysis Tools
Eectively monitor how well
your manufacturing processes are
running to help you streamline
your process for enhanced yield
and throughput.
View First Pass Yield (FPY) charts by
date, hour, product, machine, shi,
category, lot number and more.
Defect Analysis Tools
Identify the components which
are causing the most defects
enabling quick diagnosis and
corrective action.
Categorize defect charts by date,
product, machine, defect type,
part number, category, lot number
and more.
SPC, Traceability and Reporting Options for Improved Yield
SPC Charts
Quickly and accurately monitor
process variation using a range
of SPC charts.
Choose to view SPC charts
by feature or by panel at any
drill-down stage.
Traceability
Search with complete
traceability of data with fast,
eicient search tools.
Display filtered data either in
a panel view or defect list view
with defect images included.
Reporting
Customize reporting with an
extensive range of options for
process monitoring and control.
Select the charts and reports
for the desired interval and
save them to your disk.