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W orld’ s Most Compact, Lightweight and Powerful ICT New Features • Serial Device Programming • Boundary Scan T est • Audio Signal Analyzer • USB Connection High Speed Serial Device Programing & T esting Built-in app…

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TR5001T SII TINY
SERIES
• Compact & Powerful ICT
• All-in-One Multifunction Tester
• High Speed Serial Programming
• Flexible Functional Testing
• Audio Signal Analysis
IN-CIRCUIT TESTER
World’s Most Compact,
Lightweight and Powerful ICT
New Features
• Serial Device Programming
• Boundary Scan Test
• Audio Signal Analyzer
• USB Connection
High Speed Serial Device Programing & Testing
Built-in application for programming and testing of supported onboard serial devices, including
writing MAC addresses, firmware, and device IDs.
CPLD UART
SPI I
2
C
TDI
TX
RX
SCL
SDA
WP
TMS
TCK
TRST
TDO
SDI
CS
SLK
SDO
Serial
Protocol
Engine
Boundary Scan Test
Limited test access technology for testing component dense PCBAs with BSCAN
enabled devices.
Parallel in Serial out Serial in Parallel out
Internal
Logic
TRST
TCK
TDI
TMS
TDO
BS
cell
1
1
0
0
0
1
Bypass Reg.
101010
Instruction
Reg.
TAP controller
ID
Register
Internal
Logic
TRST
TCK
TDI
TMS
TDO
BS
cell
1
1
0
0
0
1
Bypass Reg.
101010
Instruction
Reg.
TAP controller
ID
Register
Parallel in Serial out Serial in Parallel out
Internal
Logic
TRST
TCK
TDI
TMS
TDO
BS
cell
1
1
0
0
0
1
Bypass Reg.
101010
Instruction
Reg.
TAP controller
ID
Register
Internal
Logic
TRST
TCK
TDI
TMS
TDO
BS
cell
1
1
0
0
0
1
Bypass Reg.
101010
Instruction
Reg.
TAP controller
ID
Register
Parallel in Serial out Serial in Parallel out
TR5001T SII TINY FEATURES
TestJet Technology
Manufacturing Defect Analyzer
RLC Measurement
• 6-Wire Measurement
• Auto-Guarding Feature
• AC Phase Measurement
• High-Speed Test
TestJet Technology
Detects open connections on ICs,
connectors and other SMT devices.
Capacitor Polarity Test
• Leakage Current Measurement
• TestJet Detection
Transistor/Diode Measurement
• Diode
• Zener Diode
• Transistor: PNP, NPN
• FET/SCR/TRIAC
• Photo Coupler
Functional In-Circuit Tester
Boundary Scan Technology
• Limited Access Testing
High Speed Serial Ports
• Device Programming
• SPI, I
2
C, CPLD, UART Protocols
Audio Analyzer & DAQ
• Audio Signal Distortion Analysis
• Arbitrary Waveform Triggering
TR5001T SII TINY FEATURES
Audio Analyzer and Data Acquisition
Enables audio signal distortion analysis and speaker quality testing using single and multi-tone
analysis.
Arbitrary waveform generator enables functional testing of systems with complex triggering
preconditions and high speed data acquisition.
Single Tone Analysis Multi Tone Analysis Arbitrary Waveform Generator
Test Module Solution
All-in-one powerful multifunctional tester integrates with various test modules:
0000000
Signal Generator THD tester
Oscilloscope RS-232 Tester
Shop Floor System Support
Integrated data exchange solution that allows performance analysis of production line data for
quality assurance and engineering analysis.
TR7500 series TR5001T SII TINY
Post Reflow Inspection ICT Board Testing
Test Server ICT Server
Insertion
& Wave
Soldering
F/T
Station
Reflow
Oven
Server Server
•
Inspection results and data integration
•
Real time SPC and production yield
management
•
Quality reports and closed loop tracking
•
Support defect component analysis
and improvements
•
Knowledge Management (KM)
•
Productivity and Quality Management
Yield Management System
TR518 SII Series
TR5000 Series
Data Flow
Screen Print
Pick & Place
Reow Oven
Insertion & Wave
Soldering
Data
Interface
Intelligent
Integrated S/W
with YMS
SFC/MES
Feedback Flow
TR7007 Series
TR8000 Series
TR7500 Series or
TR7700 Series
TR7500 Series or
TR7700 Series
TR7600 Series