RAPID-NX-LINE-UK.pdf - 第4页
m Double side 8 heads (4+4) m Automated loading m MTBH conveyer m 9000 hits/min m Ultrafast capacitive test m Stretch fixture system built-in m Kelvin/Barrel m ICT (embedded components) m Automatic marker system m Laser w…
RAPID NEXT>: TEST CHARACTERISTICS
The RAPID NEXT> line of flying probe systems is based on the VIVA Integrated Platform (VIP), Seica’s common-core
hardware and software platform which includes a complete set of high performance automated tools and instruments to develop
and execute test programs.
DIGITAL SIGNAL PROCESSOR
The integrated DSP-based instrumentation takes
advantage of the high definition and resolution of
the digital world to execute precision testing of even
the lowest value parameters. This ensurs repeatable,
full-range measurements even in the most critical
test situations and pushing fault coverage to
maximum levels.
FIBER OPTIC BUS
The proprietary, optical bus included in VIP ensure
noise-free communication between real time
devices and the system PC.
DRIVER/CONTROLLERS
The VIP platform includes proprietary motion driver/controllers that
are specifically designed for flying probe test applications, which
means optimised test time, and no electrical interference in test
measurements caused by general-purpose motion electronics.
VIVA SOFTWARE
The innovative VIVA software organizes
test program development into a simple
3-step, Prepare-Verify-Test process,
which guides the user through a series of
automated operations in an intuitive,
self-explanatory environment. This
drastically reduces programming time
and practically eliminates the possibility for error and omissions,
consequently ensuring the quality of the final test program.
GUARANTEED MECHANICAL RELIABILITY
With twenty years of experience as a leader in Flying Probe test
technology, Seica has the know-how and capability to equip the Rapid
line with a reliable, accurate and integrated mechanical system. The X-Y
axes utilize the latest generation technology linear guides and ball
screws, controlled by brushless motors, and are arranged in a geometry
designed to minimize the overall dimensions while optimizing the
motion and positioning accuracy.
The Z axes are driven by linear motors and are designed for maximum
accuracy and controlled dynamics of the probes.
Motion control is achieved with new generation
Seica digital drivers,
connected via optical fiber digital channels, for electrical noise-free
operation.
ULTRA FAST AND HIGH PRECISION
The new capacitive measurement unit, integrated directly on the mobile probes and based on DSP technology, enables the
RAPID NEXT> Line testers to perform high-precision capacitive measurements, further minimizing the test time.
m Double side 8 heads (4+4)
m Automated loading
m MTBH conveyer
m 9000 hits/min
m Ultrafast capacitive test
m Stretch fixture system built-in
m Kelvin/Barrel
m ICT (embedded components)
m Automatic marker system
m Laser warpage calculation
m Medium volumes
m Soft touch probe
m Soft land
RAPID V8/V
4
NEXT>RAPID V8
A
NEXT>
m Manual loading
m Double side 8 heads (4+4) / 4 heads (2+2)
m 9000 hits/min / 4500 hits/min
m Laser warpage calculation
m Small volumes and prototypes (V4)
m Medium/Low volumes (V8)
m Ultrafast capacitive test
m Kelvin/Barrel
m ICT (embedded components)
m Soft touch probe
m Soft land
m Double side 8 heads (4+4)
m Automated
m In-line conveyor
m Pass / Fail magazine
m 9000 hits/min
m Automatic marker system
m Kelvin Barrel Test
m Laser warpage calculation
m Medium volumes
m ICT (embedded components)
m Soft touch probe
m Soft land
RAPID H8 NEXT>
RAPID NEXT> is SEICA’s line of Flying Probe testers for
printed circuit boards with the highest performance available
on the market. It meets the requirements of industry segments
through models with horizontal or vertical architecture, 4 or 8
independent flying probes and a complete range of
measurement techniques.
Through Seica architecture flexibility all unique market
segments can be easily addressed due to the advanced
hardware and software integration.
Hori
Z
ontal Systems
RAPID NEXT>
FLYING PROBE TEST PLATFORM FOR PCBS
V
ertical Systems
m Single side 4 heads
m Up to 4500 hits/min
m Automatic / Manual loading
m Automatic test generation for embedded components
m ICT test R,L,C, Junction
m Soft land to minimize pad impact
m Soft touch probe
RAPID H
4A/
H
4
NEXT>
m Vacuum table
m Unwinder, rewinder
m Integrated ionizer
m Single side 4 heads
m Up to 4500 hits/min
m Automatic / Manual loading
m Automatic test generation for embedded components
m ICT test R,L,C, Junction
m Soft land to minimize pad impact
m Soft touch probe
RAPID H
4 FLEX
NEXT>
SOLUTIONS FOR CERAMIC AND FLE
XI
BLE CIRCUITS
Different architectures for di
V
erse solutions
Rapid NEXT> V8
A
V8 V
4
H
8 A
H
4 A H4
Architecture Vertical Vertical Vertical Horizontal Horizontal Horizontal
Max Mobile Resources 4+4 4+4 2+2 4+4 4
1
4
1
Loading Aut/Man Manual Manual Aut/Man Aut/Man Manual
Trace parameter test ül l l ül l l
Test of passive components ül l l ül l l
Test of active components ül l m ül l l
Kelvin test ül l m ül l l
Barrel test ül l l ül m m
Multipanel Test ül l l ül l l
Barcode reading ül l l ül l l
Stamper ül l l ül l l
Repair station ül l l ül l l
Programming Station ül l l ül l l
Vacuum table m m m ül l l
Best for Med. Med/Low. volumes Low volumes. Med. Ceramics Ceramics/Flex
volumes and prototypes & prototypes volumes med./low volumes low volumes
& prototypes & prototypes
l= available m= not possible
1
probes on TOP side only -
2
H4 Flex