YXLON-FF20-CT-Product-Brochure.pdf - 第2页
Do y ou w an t t o i mpr ov e the m at eri al t est in g pr oce dur es i n yo ur R & D depa r t me nt ? Do y ou w an t t o op ti mi ze y ou r pr oces s con tr ol an d sma l l se rie s in spe cti on? Be ne fit fr om pr…
YXLON FF20 CT
HIGH-RESOLUTION COMPUTED TOMOGRAPHY (CT)
INSPECTION SYSTEM FOR FINE PARTS
- Combined 2D- and 3D inspection
- 190 kV nano-focus transmission tube
- Touch operation via software platform GEMINY
- Metrology version available
Do you want to improve the material testing procedures
in your R&D department? Do you want to optimize your
process control and small series inspection?
Benefit from precise inspection results of YXLON FF20 CT.
The extremely compact high-resolution systems
YXLON FF20 CT and FF20 CT Metrology are designed
for fine to very fine parts like
- Electronic components incl. SMD
- Semiconductor packages
- Products made from new materials or new
manufacturing methods, e.g. additively manufactured
components, fiber-reinforced plastics
- Microsystems (MEMS, MOEMS)
- Medical objects, e.g. cannulas
With comparatively high energy of 190 keV, even larger or
denser parts can be inspected to the finest detail.
Experience a structured
CT inspection workflow
Typical applications for computed tomography are
- Research and development
- Failure analysis
- Process control
- Inspection of small serial productions
- Quality assurance and material analysis
- Assembly checking
- Combined DR (digital radiography) and CT inspection
3D-CT volume of a microchip
with pillar array