C_TR8100LV_EN.pdf - 第3页

FEATURES TR8 10 0LV THE SOL UTION F OR TES TIN G L OW VOL T AGE TEC HNOL OGIES TR8100L V provides an ultra-lo w output impedance to enhance lo w-voltage backdriving capability . • SN74A UC240 is a low-voltage devic e whe…

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FEATURES TR8100LV
THE SOLUTION FOR
TESTING LOW VOLTAGE
TECHNOLOGIES
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specication of
the SN74AUC240 in low-voltage
testing requirement.
FAST AND EASY TEST
PROGRAM DEVELOPMENT
Test Program Development Flowchart.
EASYTOUSE ONBOARD
PROGRAMMING SOFTWARE
MODULES
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster
Wire
Analysis
Retrofit
Fixturing
ATPG Debug
CAD Power Data
Frequency Data
Digital Parts Data
Analog Library
Digital Library
EEPROM Programming
SPI Programming
ISP Programming
LIMITED TEST ACCESS SOLUTIONS
• TRI ToggleScan
TM
Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for dierent kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost eciency and to decrease testing time.
INTEGRATED ASSET SCANWORKS
BOUNDARYSCAN TECHNOLOGY*
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)
Optional
Power
Control
Circuit
7474
B-Scan
IC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1
U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
USERFRIENDLY INTERFACE
TR8100LV provides a simple-to-understand exible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
EASY MODEL DEVELOPMENT
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capability
Waveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
JTAG
Output Pin
Drive A Signal
To Dut
BSCAN
Chip
Vectorless
Probe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScan
TM
Test
Drive-Through Test
FEATURES TR8100LV
THE SOLUTION FOR
TESTING LOW VOLTAGE
TECHNOLOGIES
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specication of
the SN74AUC240 in low-voltage
testing requirement.
FAST AND EASY TEST
PROGRAM DEVELOPMENT
Test Program Development Flowchart.
EASYTOUSE ONBOARD
PROGRAMMING SOFTWARE
MODULES
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster
Wire
Analysis
Retrofit
Fixturing
ATPG Debug
CAD Power Data
Frequency Data
Digital Parts Data
Analog Library
Digital Library
EEPROM Programming
SPI Programming
ISP Programming
LIMITED TEST ACCESS SOLUTIONS
• TRI ToggleScan
TM
Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for dierent kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost eciency and to decrease testing time.
INTEGRATED ASSET SCANWORKS
BOUNDARYSCAN TECHNOLOGY*
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)
Optional
Power
Control
Circuit
7474
B-Scan
IC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1
U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
USERFRIENDLY INTERFACE
TR8100LV provides a simple-to-understand exible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
EASY MODEL DEVELOPMENT
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capability
Waveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
JTAG
Output Pin
Drive A Signal
To Dut
BSCAN
Chip
Vectorless
Probe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScan
TM
Test
Drive-Through Test