C_TR5001 SII SERIES_EN.pdf - 第4页

SPECIFICA TIONS C-5001 SII SERIES-EN-1911 Specifications are subject to change without notice. Content may not be used as acceptance criteria. All trademarks are the pr operty of their owners. ® ® TRI IN N OV A TION ® Th…

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Multi-program Testing
A B C D
Quad-core ICT
A B C D
Dual-core ICT
A B
The Next Generation In-Circuit Test Strategy
Non-Multiplexing Pin Design, 1:1 Driver/Receiver to Pin Ratio.
• Optimized Nail Placement with 1:1 Ratio Flexibility
• 1:1 per-pin Driver/Receiver ratio for the fastest test program development and debugging
• Improved Test Accuracy and Capability
The most flexible ICT+FCT solution in the market. TR5001 SII series can integrate with
external instruments for functional tests such as: PXI, Labview, ....etc.
Multi-Core Parallel Testing Design
The new TR5001 SII series testers support up to four independent test cores for high-throughput
parallel testing. Depending on tested product complexity, tester cores can be merged to test
higher pin-count boards.
Multiple Serial Bus Access
The TR5001 SII testers feature a new Serial Test Controller, which offers two high-speed serial
ports per tester core, for a maximum of 8 individual ports. Each of these serial ports can be
mapped to any test pin on TR5001 SII’s Hybrid Switching Board and deliver a variety of Serial Bus
protocols (I
2
C, SPI, UART, JTAG) to the DUT.
TR5001 SII SERIES
FEATURES
TR5001 SII Series
• R, L, C Measurement
• 6-Wire Measurement
• Auto-Guarding Feature
• AC Phase Measurement
• TRI Enhanced TestJet
Detects open connections on ICs,
connectors and other SMT devices.
• Transistor/Diode Measurement
• Full digital in-circuit test (ICT)
• Friendly UI
• On-Board Programming
• Boundary Scan
Auto-Generation of test programs
• Frequency Counter
• LED Testing
TRI Enhanced TestJet
1:1 Per-pin Driver & Receiver Up to 8 Serial Ports can be Mapped to any Pin
Real Image Display
Flash Programming
Clear Parallel Test
Interface
Customizable Test Plan
Driver
Di
Vih
Vterm
En
Do
Receiver
Digital Pin
STC
BACKPLANE
HSWB128
CORE A
DUT
(I
2
C/SPI/UART/JTAG)
HSWB128 HSWB128
CORE B
DUT
(I
2
C/SPI/UART/JTAG)
HSWB128
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•
Inspection results and data integration
•
Real time SPC and production yield
management
•
Quality reports and closed loop tracking
•
Support defect component analysis
and improvements
•
Knowledge Management (KM)
•
Productivity and Quality Management
Yield Management System
TR518 SII Series
TR5000 Series
Data Flow
Screen Print
Pick & Place
Reow Oven
Insertion & Wave
Soldering
Data
Interface
Intelligent
Integrated S/W
with YMS
SFC/MES
Feedback Flow
TR7007 Series
TR8000 Series
TR7500 Series or
TR7700 Series
TR7500 Series or
TR7700 Series
TR7600 Series
Limited Access Test Solutions
Drive Through Test
Greatly reduces test probes for passive analog
components connected in series with JTAG and
BScan capable devices and connectors.
Boundary Scan Test
Virtual nails tests for RAM,
ROM, TTL and TREE
devices, and IEEE1149.6
Test.
Boundary Scan Virtual Chain Test using BSCAN2 Module
Simplify chained DUT testing
using software TAP routing in TRI
Virtual Chain BScan Test. Reduce
fixture wiring and test program
complexity.
TRI ToggleScan
Test
A Powerful vectorless test technology that significantly reduces the number of test probes,
ToggleScan utilizes BScan and vectorless probes to test non-BScan devices.
Shop Floor System Support
TR5001 SII Series can integrate with many shop floor systems to help centralize production line
management and improve production quality using gathered testing data.
Intelligent Software Interface
The TR5001 SII Series features an intuitive
software interface designed for easy operation
and programming. Enhanced Automated
features include Automated Test Program
Generator, Auto-tuning, and setting templates.
ATPG
The advanced programming assistant helps generate fixture wiring and test programs based on
CAD data and BOM input files.
Easy Debugging
The new test program debugging interface supports flow-based test program debugging of
individual or parallel test programs. Using multiple cores, it is now possible to debug both panel
boards or individual boards.
No test probes needed to detect opens and shorts
TRI’s ToggleScan Test
BSCAN
Chip
DUT
- Connector/Socket
- BScan Chip
- Non-BScan Chip
- Capacitor Array
- Resistor Array
JTAG
Vectorless
Probe
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
DUT
BScan
Chip
BScan
Chip
BScan
Chip
BScan
Chip
Non-
BScan
Device
Standard Chain Routing Virtual Chain Test
Board A Board A
Board A Board A
Board A Board B
Board C Board D
Flow Based Debugging Parallel Test Program Debugging
DUT 1
TAP 1
TAP 1
SOFTWARE TAP ROUTING
TAP 2 TAP 3
DUT 2 DUT 3 DUT 1 DUT 2 DUT 3
TDO/TDI
TDI
TDI
TDO
TDO TDI TDO TDI TDO
TDO/TDI
Path/File Setting
Circuit Analysis
Device Generation
Program Configuration
Test Strategy
Wire Analyisis
SPECIFICATIONS
C-5001 SII SERIES-EN-1911
Specifications are subject to change without notice. Content may not be used as acceptance criteria.
All trademarks are the property of their owners.
® ®
TRI INNOVATION
®
The absence of a product or service name or logo from this list does not constitute a waiver
of TRI’s trademark or other intellectual property rights concerning that name or logo. All other
trademarks and trade names are the property of their owners.
General
Multicore/Single Core Test
TR5001 SII INLINE
TR5001 SII QDI
TR5001 SII
TR5001D SII INLINE
TR5001D SII QDI
TR5001D SII
TR5001Q SII INLINE
TR5001Q SII QDI
TR5001Q SII
1 1, 2 1, 2, 4
3456 3328 4096
(cores)
Maximum Analog/Hybrid Test Points
Operating System
Microsoft
®
Windows compatible PC with USB, Windows 10
Power Requirement 200 – 240 VAC, Single Phase, 50/60 Hz 3 kVA
Air Requirement Dry Air 4 – 8 kg/cm
2
, Air Consumption: 20 liters/cycle
Fixture Type
Inline or offline with long lifespan Quick Disconnection Interface.
Offline press type (TR5001D/Q SII)
PCB and Conveyor System
PCB Size
Standard (W) 450 x (L) 300 x (H) 0.6 – 5 mm [(W) 17.7 x (L) 11.8 in.]
Min. (W) 70 x (L) 70 mm [(W) 2.76 x (L) 2.76 in.]
Max. PCB Weight 2 kg (4.41 lbs) [5 kg (11.02 lbs) optional]
Component Height Limitations
Top Surface of Conveyor 90 mm (3.54 in.)
Bottom Surface of Conveyor 30 mm (1.18 in.)
Conveyor Height
890 – 1000 mm* (35.0 – 39.4 in.)*
* SMEMA Compatible Inline Conveyor
Analog Hardware
Measurement Switching Matrix 6-wire measurement
Programmable Frequency 100 Hz, 1 kHz, 10 kHz, 100 kHz
Programmable DC Voltage Source ±10V max, Resolution: 10 mV
Programmable DC Current Source +100 mA max, Resolution: 0.2 mA
Programmable AC Voltage Source 10 Vpp max, Resolution: 10 mV
Programmable High Voltage Current Source
53 V / 100 mA max
Component Measurement Capability
Resistance 30 mohm – 40 Mohm
Capacitance 5 pF – 40 mF
Inductance 5 μH – 60 H
Analog Measurement
AC Voltmeter 0 – 100 Vp
DC Voltmeter 0 – ±100 V; Resolution: 2.5 mV – 50 mV
DC Ammeter 1 μA – 100 mA; Resolution: 30 nA – 30 μA
Optional Hardware
Analog Test
TestJet Technology Vectorless open circuit detection
Arbitrary Waveform Generator (AWG)
Frequency Range 0 – 100 kHz; Resolution: 0.15 Hz,
BW: 100KHz max
Digital Test
Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
Pin Drivers Programmable levels 0.5 V to 4 V
Pin Receivers Programmable levels 0 V to 5 V
Pull-up/Pull-down Resistor 4.7 K
DUT Power Supplies
5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
APPS Programmable DUT Power Supply
75 V / 8 A max, 200W maximum output power
On-board Programming of Flash & EEPROM Memories
MAC Address Programming
Supports MAC address programming with server supplied MAC
address
Boundary Scan
Includes BScan Chain Test, BScan Cluster Test, BScan Virtual
Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
ToggleScan
Test
Advanced test technology that combines with BScan and
Vectorless test functions to detect pin open or short issues
Tree Test Facilities with BGA Test
Pattern generator for detection of pin opens for BGA/VLSI chips
Dimensions/Weight
900 (35.4) 1080 (42.5)
1735 (68.3)
720 (28.3)
1050 (41.3)
500 (19.7)
700 (27.6)
850 (33.5)
390
(15.4)
195 (7.7)
1660 (65.4)
1850 (72.8)
1200 (47.2)
950 (37.4)
Unit : mm (in.)
TR5001D/Q SII INLINE
TR5001 SII INLINE
TR5001D/Q SII QDI
TR5001 SII QDI
TR5001D/Q SII
TR5001 SII
Weight 670 kg (1477 lbs) 700 kg (1543 lbs) 300 kg (661 lbs)
Headquarters
7F., No.45, Dexing West Rd.,
Shilin Dist., Taipei City
11158, Taiwan
TEL: +886-2-2832-8918
FAX: +886-2-2831-0598
E-Mail: sales@tri.com.tw
http://www.tri.com.tw
Linkou, Taiwan
No.256, Huaya 2nd Rd.,
Guishan Dist., Taoyuan
City 33383, Taiwan
TEL: +886-2-2832-8918
FAX: +886-3-328-6579
Hsinchu, Taiwan
7F., No.47, Guangming 6th
Rd., Zhubei City, Hsinchu
County 30268, Taiwan
TEL: +886-2-2832-8918
FAX: +886-3-553-9786
Shenzhen, China
5F.3, Guangxia Rd.,
Shang-mei-lin Area,
Fu-Tian Dist., Shenzhen,
Guangdong, 518049, China
TEL: +86-755-83112668
FAX: +86-755-83108177
E-mail: shenzhen@cn.tri.com.tw
Suzhou, China
B Unit, Building 4, 78 Xinglin St.,
Suzhou Industrial Park,
215123, China
TEL: +86-512-68250001
FAX: +86-512-68096639
E-mail: suzhou@cn.tri.com.tw
Shanghai, China
Room 6C, Building 14,
470 Guiping Rd., Xuhui Dist.,
Shanghai, 200233, China
TEL: +86-21-54270101
FAX: +86-21-64957923
E-mail: shanghai@cn.tri.com.tw
USA
832 Jury Court, Suite 4,
San Jose, CA 95112 U.S.A
TEL: +1-408-567-9898
FAX: +1-408-567-9288
E-mail: triusa@tri.com.tw
Europe
Gugelstr. 32
90443 Nuremberg
Germany
TEL: +49-9119-401-7827
FAX: +49-9119-400-6181
E-mail: trieurope@tri.com.tw
Japan
4-26-10 Ishiwara, Sumida-ku,
Tokyo, 130-0011 Japan
TEL: +81-3-6273-0518
FAX: +81-3-6273-0519
E-mail: trijp@tri.com.tw
Korea
No.207 Daewoo-Technopia,
768-1 Wonsi-Dong, Danwon-Gu,
Ansan City, Gyeonggi-Do, Korea
TEL: +82-31-470-8858
FAX: +82-31-470-8859
E-mail: trikr@tri.com.tw
Malaysia
C11-1, Ground Floor, Lorong
Bayan Indah 3 Bay Avenue,
11900 Bayan Lepas Penang,
Malaysia
TEL: +604-6461171
E-mail: trimy@tri.com.tw