SIGMA_brochure-complete-En-Rev02-2017-12_LD.pdf - 第6页
Review your process in 3D Review high quality 3D defect images to focus on what matters • Locali ze defects at a glance • Classify easily using reference image • Use IPC or user-dened defect categories • Benet from pre…
Analyze your
process at a glance
Go straight to the point to identify recurrent process detractors
• Drill down in tera bytes of SPI (s-403) or AOI (s-404) data and
images to analyze root cause
• Monitor process capabilities
• Generate regular quality reports (daily, weekly, monthly, …) to
support 8D problem solving and lean initiatives.
“Print process quality has improved over the period but excessive warnings show
we are operating close to process limits”
Review your process
in 3D
Review high quality 3D defect images to focus on what matters
• Localize defects at a glance
• Classify easily using reference image
• Use IPC or user-dened defect categories
• Benet from pre-dened corrective action messages
• Optimize review environment using customized screen layout
“Lifted lead is easily identied”
Optimize your line
inspection strategy
Correlate SPI and AOI defects (s-500) to minimize operator review
and expand defect coverage
• Adjust SPI and AOI program tolerances based on facts (data
and images)
• Eliminate operator false sanctions
• Enable intelligent sampling at X-ray station
• Build process knowledge by tracing defect evolution in the line
“Lack of solder detected at AOI, not at SPI; we need to tighten tolerances at SPI to detect it as an error”