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Optimize your line inspection strategy Correlate SPI and AOI defects (s-500) to minimize operator review and expand defect coverage • Adjust SPI and AOI program tolerances based on facts (data and images) • Eliminate ope…

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Review your process
in 3D
Review high quality 3D defect images to focus on what matters
• Localize defects at a glance
• Classify easily using reference image
• Use IPC or user-dened defect categories
• Benet from pre-dened corrective action messages
• Optimize review environment using customized screen layout
“Lifted lead is easily identied”
Optimize your line
inspection strategy
Correlate SPI and AOI defects (s-500) to minimize operator review
and expand defect coverage
• Adjust SPI and AOI program tolerances based on facts (data
and images)
• Eliminate operator false sanctions
• Enable intelligent sampling at X-ray station
• Build process knowledge by tracing defect evolution in the line
“Lack of solder detected at AOI, not at SPI; we need to tighten tolerances at SPI to detect it as an error”
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SIGMA EN Rev 02 2017-12
HEADQUARTERS
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Tel: +33 4 76 75 85 65
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Shenzhen
Tel: +86 755 8212 4147
ASEAN & OCEANIA
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Singapore
Tel: +65 6747 6550
Specifications
PC conguration
Core i5 minimum, 8 Gb RAM,
ethernet 100Mbits/s
Graphics card (1 Gb min., 2 Gb for optimal
perfomance)
Operating system Windows 7 or later
Data base SQL server recommended
Screen conguration 22” wide screen with 1680x1050 resolution