RAPID-NX-LINE-UK.pdf - 第6页

TEST Tools for Substrates H IGH A CCURACY TESTS The ca pab ili ty of eac h p rob e t o c ont act pr eci sel y a ny poi nt of the PC B i nde pen den tly of th e l oca tio n, ena ble s the ev en the mo st sop his tic ate d…

100%1 / 8
m Single side 4 heads
m Up to 4500 hits/min
m Automatic / Manual loading
m Automatic test generation for embedded components
m ICT test R,L,C, Junction
m Soft land to minimize pad impact
m Soft touch probe
RAPID H
4A/
H
4
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m Vacuum table
m Unwinder, rewinder
m Integrated ionizer
m Single side 4 heads
m Up to 4500 hits/min
m Automatic / Manual loading
m Automatic test generation for embedded components
m ICT test R,L,C, Junction
m Soft land to minimize pad impact
m Soft touch probe
RAPID H
4 FLEX
NEXT>
SOLUTIONS FOR CERAMIC AND FLE
XI
BLE CIRCUITS
Different architectures for di
V
erse solutions
Rapid NEXT> V8
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V8 V
4
H
8 A
H
4 A H4
Architecture Vertical Vertical Vertical Horizontal Horizontal Horizontal
Max Mobile Resources 4+4 4+4 2+2 4+4 4
1
4
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Loading Aut/Man Manual Manual Aut/Man Aut/Man Manual
Trace parameter test ül l l ül l l
Test of passive components ül l l ül l l
Test of active components ül l m ül l l
Kelvin test ül l m ül l l
Barrel test ül l l ül m m
Multipanel Test ül l l ül l l
Barcode reading ül l l ül l l
Stamper ül l l ül l l
Repair station ül l l ül l l
Programming Station ül l l ül l l
Vacuum table m m m ül l l
Best for Med. Med/Low. volumes Low volumes. Med. Ceramics Ceramics/Flex
volumes and prototypes & prototypes volumes med./low volumes low volumes
& prototypes & prototypes
l= available m= not possible
1
probes on TOP side only -
2
H4 Flex
TEST Tools for Substrates
HIGH ACCURACY TESTS
The capability of each probe to contact precisely any
point of the PCB independently of the location, enables
the even the most sophisticated tests to verify the circuit.
Trace Parameter Test: checks the continuity and isolation
between the PCB tracks through a resistive test.
Micro Short Identifier: checks for the presence of a short
circuit between tracks due to the manufacturing process.
100 G isolation: isolation test up to 100 G, applying
1000 Volts (optional).
Trace Capacitance Test: autolearns and tests the
capacitance between tracks and ground planes of the
PCB.
Kelvin Test: thanks to its architecture, Seica can perform
Kelvin measurements using strandard probes, and
positioning two probes on the same pad.
Barrel Test: performs continuity and parametric tests
on the vias of the PCB, by simultaneously positioning
two probes on each side.
Component Test: The RAPID NEXT>
systems can generate and perform all of the
parametrical and functional tests of passive and active
embedded components, thanks to Seicas decades of
experience and technology developed for full, loaded
board tests.
Link to Grid Test: enables retesting of boards, or sections
of boards previously tested on a bed of nails system.
Flexible Circuits: Seica has designed a new mechanical
locking system for flex circuits and inner layers with a
unique clamping device to minimize board warpage,
and for testing the extremely thin flex circuits, a vacuum
table, insertable in the test area, is available to simplify
testing.
PROBE
The RAPID NEXT> test system are equipped with
test probes designed specifically to enable the fast,
accurate testing of all types of board layouts: even the
most critical layouts and the smallest-sized pads can be
probed, thanks to the geometry, accuracy and
repeatability intrinsic to Seica systems. The innovative
design of the latest probe pins guarantees an extended life
with no maintenance (over 8 million hits). Particular
attention has been dedicated to minimize the electric noise
which can affect measurements, so it is possible to verify
even very small value parameters on tracks in a constant
and repeatable manner. The new generation of Soft Touch
Probes allows the testing of the PCB almost leaving witness
marks on the pad surface.
CAMERAS AND OPTICAL INSPECTION
All of the RAPID NEXT> line systems are
equipped with high-definition, color mobile cameras,
one on each side, allowing the automated optical
centering of the PCB and the visual inspection of the
probes during the test. In addition to simplifying the
execution and debug operations of test programs,
VIVA software includes the capability to utilize the
cameras for the automatic acquisition of barcodes.
REPAIR AND PROGRAMMING STATIONS
The VIVA software includes a
graphical repair environment,
which enables the user to locate
and view the parts of the PCB
which have failed during the
test, facilitating repair
operations.
This operation can be done
directly on the test system,
however it is also possible to
send the test information to a remote PC for the repair
activity offline.
The Programming Station option allows test program
development to be done offline, therefore optimizing
system availability for testing PCBs.
AUTOMATIC LOADER
The RAPID NEXT> Line features
the automation of both the horizontal
and vertical testers. This is a absolute
innovation in the market of flying
probers for PCBs.
The horizontal system may be
combined with Seica Automation
stackers and destackers, while a
simple menu is used to select the test sequence so that the system, upon
loading the selected test program, automatically adjusts the clamping rails
width. At the end of the test, the PCB is unloaded and, using the pass-through
capability, can be stored/routed according to the test result (pass/fail).
The vertical system may be combined with a single or multi-rack loader
capable of holding up to 50 PCBs at a time; these may all be the same part
number or all different part numbers.
The system automatically selects the correct test program and adjusts the
clamping rails, and the PCBs will be automatically divided according to the
test result.
Both systems provide the opportunity to install a labeling module to apply a
label with barcode on the failed boards.
MULTIPANEL AND PARALLEL TEST
The test program can easily
address multi-panel formats,
providing numerous options
to manage any layout, in an
easy to use visual
environment. The tests
defined for a single printed
circuit are multiplied and
applied to the entire panel
with a simple click on the
screen, and the test report
provides the result of each single figure.
The possibility of executing the test of two PCBs
simultaneously on the 8 probe systems allows the
user to maximize his investment and significantly
increase test throughput.
STATISTICAL MONITORING
TOOLS
The statistical monitoring tools are
essential for the quality analysis and
defect reports.
The RAPID NEXT> systems
provide the user with the different
functions needed to collect data on
the batch defects through self created
reports capable of providing
statistical information both in graphic
and text format.
BOARD MARKER
In the manufacturing environments there is an increasing request to mark the boards
with a “passannotation after electric test. To meet this requirement,
Seica has introduced
an automatic marking device. The marker uses either a stamp or a motorized pin
mechanism to mark the PCB in a location which has been defined using a dedicated
guided procedure integrated in the VIVA software.