Products_Overview_EN_CN.pdf - 第10页

TECHNOLOGY BENEFIT S 技术优势 › Analysis of resistance of sensitive electronics in extreme temperatures › Optimal combinations of systems with other measuring equipment › Excellent insulation values due to foamed housing › E…

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Securo Tests | Trials
+120 °C
+80 °C
RT
t
°C
Securo
Plus
40 °C
50 °C
RT
t
°C
Securo
Minus
Safe electronics despite heat – hot function
test system for temperature range of +80 °C
bis +120 °C.
不惧酷热的安全电子元器件——高温耐受性测试系
统,模拟+80℃至+120℃的极端温度
Always reliable in the cold as well – cold
function test system for temperatures up
to -50 °C.
寒冷环境下始终可靠如一——低温耐受性测试系
统,可模拟低至-50℃的极端寒冷环境。
Securo
Tests | Trials
Modern electronics are used nowadays in a range of industries and are therefore exposed to
the most widely varied temperatures. Most notably, electronic assemblies in safety-related are-
as of application must function 100 % reliably at all temperature conditions. Safe testing and
measuring methods are increasingly relevant and have already become standard in analysing
the resistance of electronic components and increasing their durability in the long term.
Our Securo systems for cold and hot function tests simulate these extreme environmental con-
ditions by selectively heating or cooling the system. The systems function under air or nitrogen
atmosphere and are available as batch or inline variant.
如今,现代电子设备已被广泛应用于各大行业,需要常常暴露于广泛温度范围条件下。尤其值得注意的
是,与安全相关的应用领域中,电子设备必须在所有温度条件下都100%安全可靠,否则后果不堪设想。由
此,各种安全测试和测量方法层出不穷,并逐渐衍生出专门用于分析和检测电子元器件耐受性,以及提高
元器件耐久性的相关标准,
锐德开发的Securo高温/低温耐受性测试系统可通过对电子组件进行选择性的冷却/加热,真实而准确地对极
端环境进行模拟。该系统可用于空气或氮气环境,并可根据需要选择批处理或嵌入式处理系统。
Temperature ranges