COMPACT-NX-LINE-UK.pdf

在线预览 COMPACT-NX-LINE-UK.pdf PDF 文档。

Seica plants adopt the World Class Manufacturing (WCM) guidelines to improve the production process

from ergonomics and safety of the work area, maintenance and the quality control system.

Seica’s new compact NEXT> LINE is engineered to facilitate maintenance and includes features designed

to minimize or eliminate potential causes of downtime. All of the gauges and indicators for system service (compressed

air, network inlets, current plugs) are placed for easy monitoring by the operator. Moreover, air conduits for cooling,

protection of the electronics from dust and water, and service inlet are protected against accidental impacts.

Particular attention is paid to:

Workplace organization

Logistics

Safe working environment

Safe handling and disposal of waste

Standardized procedures and methods

Innovation

Growth of productivity

COMPACT NEXT> LINE

is the new conﬁgurable and customizable test platform for in-line or manual automated

In Circuit Test (ICT), ﬂash programming, functional/EOL and Run-in test.

Designed for high conﬁgurability, the compact

LINE, based on Seica’s NEXT> platform,

meets the most different test requirements, allowing

the user to choose the conﬁguration that best suits the

application. One of the main feature of the

NEXT> platform is the possibility to provide the

best integration of technology and easiness of use.

Seica offers a turnkey solution where the following

tests are automatically combined together in a

production line based on the demand:

In Circuit Test (ICT): Open/Short, R/L/C, Diodes,

Transistors, FETs, regulators etc.

OBP (On-board programming)

Power ON and Functional (FUN) Test through

CAN/LIN Interface etc.

LED Test with sensors

EOL Test

RUN-IN Test

Interactive Communication with Customer’s MES

COMPACT LINE DESIGN & WCM APPLICATION

A COMBINATION OF INNOVATION, HIGH PERFORMANCE, FLEXIBILITY

AND THROUGHPUT

The compact NEXT> is specialized in

conﬁgurations for synchronous and asynchronous

parallel test according to the user’s production

requirements. All of the Compact systems can be

conﬁgured in multi-receiver and multi-job arrays to

test up to 4 boards at the same time, ensuring:

Test time reduction;

Improved test throughput;

Overall test cost reduction,

More intensive use of instruments .

The engineering core bound to the system features the ACL and the iFUN modules designed to respond to both in-

circuit and functional test requirements. The ACL module is based on DSP technology and uses independent D/A and

A/D converters for each synthesized instrument. Measurements are fast, accurate and repetitive. Each ACL module

hosts 3 independent Arbitrary Waveform Generators (AWG), a Multimeter, a Timer-Counter, a large on-board

memory and processing capability to enable signal processing and digital scope functionalities.

The iFUN is a base module for AWG (Arbitrary Waveform

Generator) and/or DIGITIZER (Sampling Card) boards; it has

a 4-quadrant grounded DC Voltage Generator with ﬁxed

current limit and 16-bit resolution. The DIGITIZER is a 16-bit

sampling board. Controlled by the system PC through the

high-speed and high-bandwidth ﬁber optic bus, the test

backplane hosts digital and analog matrix cards and internal

instruments.

HARDWARE LOGIC CORE

The compact test stations are managed by

the

Seica VIVA proprietary Software, which

is a completely process-oriented test

environment, designed to streamline

test program development while the

functional graphic environment

guides the user through a series of

automated operations in an intuitive,

self-explanatory environment.

The

VIVA Software permits an

easy and intuitive management

of the CAD data, which are

directly imported for test

generation, validation and diagnostics

purposes.

Seica provides also advanced

Design-for-Test programming solutions for

high-mix PCB manufacturing. The new

VIVA

EXT> is able to import product data

either in its original CAD format, or in the form

of machine programs, and convert into

optimized test programs in a matter of

seconds even for highly complex boards.

This shows the amazing versatility of the

NEXT> platform, which ensures that

programs developed on other

NEXT>

systems, can be deployed on the compact

NEXT> SERIES. This means that a

program developed on a

Pilot test system

can be moved without additional efforts to a

compact system, allowing the user to

optimize production testing according to

volume, throughput, test requirements, etc.

VIVA SOFTWARE: THE NEXT GENERATION

OF AUTOMATIC TEST PROGRAM DEVELOPMENT

Thanks to its unique open architecture, the VIVA software is also

compatible with numerous “front-end” packages and allows easy

integration of external (.EXE. and .DLL) software modules, as well as

third party languages that might better respond to the desire of

commonality with tools already in use at the end user plant.

My View is more than a simple graphical user interface (GUI); it

is a VIVA software component that allows the customer to:

Easily create a customizable and localizable MMI using

a Seica Graphic Editor.

Read from and write to the MyView controls at runtime

from the external test software sequences.

Run Python .NET code (IronPython) easily and directly from

the external test software sequences.

Drive all the Hardware modules with the Seica Software suite,

external software tool or Python.

Run the diagnostic test.

The systems can be housed in a variety of ergonomic enclosures

that offer different levels of scalability.