COMPACT-NX-LINE-UK.pdf - 第5页
COMPACT DIGITAL N EXT > is S eic a res pon se to the c ons tan t d ema nd for t est ing in teg rat ed dev ice s v ia vecto r-b ase d t ech niq ues a nd ded ica ted pro toc ols su ch as Bo und ary Sc an, with out ex cl…
The COMPACT
SL
NEXT> configuration offers a
completely automated solution via an integrated, SMEMA
compatible transport system, allowing completely automatic
board handling and easy integration into high volume
production lines. This automated system for in-line integration
is perfect for ICT, pre-functional, functional and RUN-IN Test.
m SMEMA compliant in-line or stand-alone solution
m Up to 2048 Analog Channels
m Digital channels up to 10 MHz
m Openfix capabilities
m Up to 16 user power supplies
m Parallel test option (max 4 jobs)
m On board programming features
m GPIB, RS232, CAN, and other protocols management
m Motorized fixture receiver
m 19” internal rack for instrument integration
COMPACT
SL
COMPACT
TK
It is the ideal solution for all mixed ICT, pre-functional,
functional, EOL and RUN-IN test. The versatility and scalability
makes the COMPACT
Multi
NEXT>, the perfect test
system suited for the integration of external instrumentation,
capabilities and techniques in a single test program.
m Analog and Digital channels capabilities
m Power channels capabilities
m Optional Software in-circuit capabilities
m CAN, LIN, K-line, GPIB interfaces
m Pneumatic or Manual fixture receiver integrated
m Multiple programmable power supplies
m Resistive loads modules option
m High voltage/current capabilities
m 19” internal rack for instrument integration
m Parallel test option (max 4 jobs)
m On Board Programming (OBP) capabilities
m Radio Frequency (RF) Test up to 5G
m Digital channels up to 10 MHz
m Openfix capabilities
Seica offers other similar system solutions that can be
adapted to any application:
COMPACT NEXT>
TK
and
CUBE.
Compact NEXT>: MAXIMUM CONFIGURABILITY
AND FLEXIBILITY
COMPACT
Multi
COMPACT CUBE
COMPACT DIGITAL NEXT> is Seica
response to the constant demand for testing integrated
devices via vector-based techniques and dedicated
protocols such as Boundary Scan, without excluding the
need to combine the in-circuit test as well.
m Analog, Digital and Hybrid channels capabilities
m ICT (In Circuit Test): Open/Short, R/L/C, Diodes,
Transistors, FETs, regulators
m Up to 1536 Analog Channnels
m Functional testing
m On Board Programming (OBP) test option
m Boundary scan test option
m Digital test pattern
COMPACT DIGITAL
Seica
meets the needs of the continuous driving market trend
of Electronics PCBs miniaturization with the new COMPACT
RT
NEXT>. It is a fully automatic Rotary Table based
system, ideal for medium/high volume production. It has been
designed to provide immediate in-line robot integration to
reduce the impact of DUT loading/unloading times. The first
tangible sign is that the rotary table gives the benefit to save
the loading/unloading time.
m In-line robot integration
m Very handy and ergonomic: 450 mm width
m Up to 640 Analog Channnels
m Functional test expandibility
m On Board Programming (OBP) test option
m Boundary scan test option
m Electrical Press fixture receiver
m Rotary Table
COMPACT
RT
ON-BOARD PROGRAMMING (OBP)
Seica offers a fully integrated On-Board Programming (OBP)
solution, which can be included in any Compact Series system.
Typically, two different programming levels can be adopted in order
to meet the different customer needs:
m The fixture-level integration offers advantages in terms of
operational costs and speed, but it can be seen as a customized
solution for a single family of products.
m The In-System level integration is a universal solution, which
can be used to program different devices families. This ensures a
flexible yet reliable solution. The maximum configuration allows to
program up to 16 devices simultaneously. SEICA has a library of
dozens of available plug-ins, and also provides development
services for custom requirements.
BOUNDARY SCAN
The VIVA Software is able to drive a Boundary Scan component through the Virtual Bed of Nails (VBN) capability
developed by SEICA, which is useful to increase test coverage using the pins of the JTAG components. The goal is to
debug and test boards equipped by huge programmable components (FPGA, CPLD, µP...) using them as simple but
powerful digital I/O connectors and ignoring their internal program.
OPEN FIX TEST
The OPENFiX™ module is available for
testing today’s complex integrated circuits
without the need to power up the UUT. The
dedicated sensors, placed on the IC under
test, measure the transmitted AC signal to
verify for opens; this technique also includes
the verification of shorts between adjacent
pins. Fast, easy generation of the test
and autoleaning make for rapid and
extremely efficient implementation.
HIGH VOLTAGE TESTING
Seica systems can integrate external resources for
High Voltage (HV) and High-Power Test and
Isolation Leakage test and measurements. All the
instruments needed for the required measurements are
integrated into the test rack containing the switching
matrix and backplane. Seica also provides the
recommended safety practices and cooling systems
in regards to the High Voltage and high-power tests.
The considerations concerning safety in electrical
testing apply not only to personnel, but also to the test
equipment and apparatus or system under test.
COMPACT NEXT> FEATURES AND OPTIONS