COMPACT-NX-LINE-UK.pdf - 第7页
R EPAIR S TATION AND S TATISTICS Th e R epa ir S ta ti on modu le pr ov id es a com pre he ns iv e gr ap hi c sof tw ar e en vi ro nm en t fo r fa ult l oc at io n and re pa ir . Onc e th e te st p ha se h as bee n c om …
ON-BOARD PROGRAMMING (OBP)
Seica offers a fully integrated On-Board Programming (OBP)
solution, which can be included in any Compact Series system.
Typically, two different programming levels can be adopted in order
to meet the different customer needs:
m The fixture-level integration offers advantages in terms of
operational costs and speed, but it can be seen as a customized
solution for a single family of products.
m The In-System level integration is a universal solution, which
can be used to program different devices families. This ensures a
flexible yet reliable solution. The maximum configuration allows to
program up to 16 devices simultaneously. SEICA has a library of
dozens of available plug-ins, and also provides development
services for custom requirements.
BOUNDARY SCAN
The VIVA Software is able to drive a Boundary Scan component through the Virtual Bed of Nails (VBN) capability
developed by SEICA, which is useful to increase test coverage using the pins of the JTAG components. The goal is to
debug and test boards equipped by huge programmable components (FPGA, CPLD, µP...) using them as simple but
powerful digital I/O connectors and ignoring their internal program.
OPEN FIX TEST
The OPENFiX™ module is available for
testing today’s complex integrated circuits
without the need to power up the UUT. The
dedicated sensors, placed on the IC under
test, measure the transmitted AC signal to
verify for opens; this technique also includes
the verification of shorts between adjacent
pins. Fast, easy generation of the test
and autoleaning make for rapid and
extremely efficient implementation.
HIGH VOLTAGE TESTING
Seica systems can integrate external resources for
High Voltage (HV) and High-Power Test and
Isolation Leakage test and measurements. All the
instruments needed for the required measurements are
integrated into the test rack containing the switching
matrix and backplane. Seica also provides the
recommended safety practices and cooling systems
in regards to the High Voltage and high-power tests.
The considerations concerning safety in electrical
testing apply not only to personnel, but also to the test
equipment and apparatus or system under test.
COMPACT NEXT> FEATURES AND OPTIONS
REPAIR STATION AND STATISTICS
The Repair Station module provides a comprehensive
graphic software environment for fault location and
repair. Once the test phase has been completed, the
operator can recall (either manually or via a barcode
reader) and view the faults detected on every tested
board, as well as the relevant circuitry connections of the
involved components. An intuitive and self-
explanatory dialog window displays all the critical
points requiring inspection, and allows the operator to
enter the information regarding the repair actions
performed, which are then stored in a database.
The QSTAT™ tool uses this database to generate
troubleshooting tips and repair information for the
operator, and can create reports related to repair activity
on the tested boards.
The software can be installed either on the test system (local) or on a dedicated PC (remote) networked to the test systems.
The database can collect repair actions on multi-panel boards, on board panels and single boards with no limit on inserted
data or dimensions (except for the available space on disk). The SPC Tool enables the statistical analysis of test data, and
the generation of CP, CPK and Gauge R&R reports.
QUICK TEST
Quick Test™ is a global Virtual Instrument software interface, to
access all Seica hardware. QuickTest allows the user to
graphically interact in real time with the tester hardware and the
UUT. The user can easily create test sequences
that can be prepared off-line (hardware
emulation) or directly executed and viewed.
The results can be stored and become part of
the overall test program. QuickTest allows
technicians to use any part of the powerful and
complex platform of the compact
NEXT> SERIES with the same ease that
they use any familiar lab instrument, without
requiring knowledge of the system and time-
consuming database preparation.
ACCESSIBILITY AND TEST COVERAGE
Seica
can also offer the Test Point Accessibility
report, Feasibility Study Report and Coverage Report
in order to provide the customer with more information
related to the test.
INDUSTRY 4.0
Traceability and Industry 4.0 are facing the continuous
demand of industrial manufacturing companies to
increase the productivity through the digitalization of the
manufacturing processes and the collection and
processing of data.
The
COMPACT line features all of the capabilities
needed for implementation in any Factory 4.0 scenario,
providing the possibility to plug in any proprietary or
third party information system to achieve the desired
goals.
Seica introduces the Canavisia ShoeBox, a
noninvasive control unit that allows to monitor energy
consumption while reducing costs and waste:
m Monitoring of consumption
m Data analysis
m Intervention planning
Brochure Compact NEXT> Line UK ver. 01 11/2019
100% Recycled paper
PROXIMA S.R.L.
E-mail: info@proxima-ate.com
SEICA Inc.
E-mail: DavidSigillo@seicausa.com
SEICA FRANCE SARL
E-mail: stephane.dupoux@seica.fr
SEICA DEUTSCHLAND GmbH
E-mail: marc.schmuck@seica.com
SEICA ELECTRONICS
(Suzhou) Co.Ltd.
E-mail: seicachina@seica.com
SEICA WORLDWIDE
GLOBAL SUPPORT NETWORK
SEICA SpA
via Kennedy 24
10019 Strambino - TO - ITALIA
Tel: +39 0125 6368.11
Fax: +39 0125 6368.99
E-mail: sales@seica.com
www.seica.com
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and its subsidiaries, Seica can ensure
local service support wherever the
customer needs it,
in addition to 24-hour
telephone assistance.