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Offset calib ration system for SIPLACE 80 S15 / S20 / F3 / F4 Oper ating M anual Edition 01/ 98 Page 32 of 47 Note Do not mix up the sequence and sides of the glass components. Otherwise, the evaluation will be fal- sifi…
Operating Manual Offset calibration system for SIPLACE 80 S15 / S20 / F3 / F4
Edition 01/98
Page 31 of 47
•
Set up the microscope in a secure position close to the machine.
•
Prepare the evaluation form (print it out if necessary).
2.2 Placing the Glass Components
•
Load the placement program corresponding to your machine. To do this, copy the GF, BE, PM and
LA files from the supplied diskette into the appropriate folders on the line computer’s hard disk.
•
Define the setup for the required station. Select feeder Fd
∼
LIN_30. Set the Glas16_16 component
for the turret head (all machines) or Glas32_32 for the IC head (F machines only).
•
From the ”Services” menu select the ”Packaging Box” command and enter a vibration time of 3000
ms there.
•
Save the data.
•
Allocate the respective placement program to the desired placement head, e.g. 16
Å
turret head,
36
Å
IC head.
•
Specify the job and send the data for the desired head to the required placement station.
•
Push the glass plate in the input conveyor above the light barrier. Placement starts.
•
You should repeat the placement procedure if several glass components are rejected. Ideally,
placement takes place with all 12 segments. However, evaluation is still possible even if up to 4
components have been rejected.
•
Only one component (13) is placed for the IC head. It makes sense to perform and evaluate this
placement several times in succession. The overall average of all placements is then used for the
offset correction.
2.3 Measuring the Offset
•
Remove the glass plate from the machine and put the plastic cover over it.
•
Turn over the glass plate (plastic cover downwards) and put it under the microscope.
•
Start the measurement procedure with glass component no. 1, side 1. To do this, look at each of
the numbered sides (1 – 4) of the glass component to find the pin structure which best lines up with
a mark on the vernier scale of the glass plate. The principle is the same as with a caliper rule. In
the example shown on the next page (Fig. 2.3-1), the measurement values are +20 µm for side 1, -
80 µm for side 2, +20 µm for side 3 and -70 µm for side 4.
• Repeat the procedure for all the other glass components and enter the measured values in the ap-
propriate spaces on the evaluation form.
• With the IC head: Perform several measurements (repeat the placement several times).
Offset calibration system for SIPLACE 80 S15 / S20 / F3 / F4 Operating Manual
Edition 01/98
Page 32 of 47
Note
Do not mix up the sequence and sides of the glass components. Otherwise, the evaluation will be fal-
sified!
2.4 Evaluation
•
Use MS Excel to open the ANALYSIS.XLS file and fill in the ”General Information” (Machine No.,
User Name, Date). Click on the specific component and transfer each measured value in turn from
the evaluation form into the dialog boxes which appear.
Note
Manual evaluation (mathematical calculation without MS Excel) is also possible. Use the enclosed
evaluation form for this purpose.
•
Scroll to the right in the Excel window. The correction values are displayed under ”arithmethic
mean”.
•
Print out the Excel page with the mean values and place it to hand for entering corrections. Close
the Excel file by clicking on the ”Close all files” button.
Operating Manual Offset calibration system for SIPLACE 80 S15 / S20 / F3 / F4
Edition 01/98
Page 33 of 47