BT Catalogue EN.pdf - 第7页
Nordson- Bond T es ting | 13 12 | Nordson - Bond T es ting Aut oma tion Dedic a t ed Waf er T es t er - 4800 Semic onduct or Waf er T es t er - 4800 INTEGR A ™ High density int erc onnect quality c ontr ol. Int egr at ed…

Nordson- Bond Testing | 1110 | Nordson - Bond Testing
Automation
Leadframe Solution - 4600-LF
Wafer Solution - 4600-W
High precision automated wafer
handling with OCR.
High precision automated
leadframe handling with OCR.
My wafers have sensitive fine pitch bumps and it’s
too easy to damage them. 4600-W gives me peace
of mind with zero broken wafers.
My product is flexible and high density, it can
only be handled by a robot. 4600-LF guarantees
more repeatable test results.
Micro-bumps,
micro pillars
50mm - 250mm
wafers
Fine pitch wires
and bumps
25 - 100 mm wide,
100 - 320 mm long strips
Robotic handler
Extreme precision
Robotic handler
Extreme precision

Nordson- Bond Testing | 1312 | Nordson - Bond Testing
Automation
Dedicated Wafer Tester - 4800 Semiconductor Wafer Tester - 4800 INTEGRA
™
High density interconnect
quality control.
Integrated wafer handling that’s
clean room compatible.
I perform fine pitch testing on bumps and pillars
for a range of wafer sizes. The 4800 even handles
my extremely warped wafers.
I test a high volume of wafers and achieve the
highest throughput with the 4800 INTEGRA. It’s
fire and forget so I can be more eicient.
Micro-bumps,
micro pillars
Micro-bumps,
micro pillars
50mm - 300mm
wafers
Island of
automation
Robotic handler
Ultimate precision Extreme precision

Nordson - Bond Testing | 1514 | Nordson - Bond Testing
Find Every Failure
Solder Ball
Wirebond Pull
Wirebond Shear
Passivation Shear
Stud Pull
Ribbon
Surface Pad
Ribbon Pull
Micro-pillar Shear (base) Micro-pillar Shear (cap)
Micro-pillar
Cold Bump Pull
Ball Shear
Tab Bond ShearDie Shear
Wirebond
Die
Micro-pillar PullHot Bump Pull
Surface Mount Device Shear
Test Components Advanced Tests
Variable heights and dimensions.
For diicult to grip or small dimensions.
Larger components and higher forces.
Standard Pull Tests
Standard Shear Tests
Tab
Surface Mount Device