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Case S tud ies P r o v en I n s pecti on a n d Met r ol ogy S ol u t io n s t h a t Im p r o v e Pr oc es s a n d Yie ld Powered b y MRS™ T echnolo gy C ASE STUDIES Sock et Metrology Our customer was using a Coordinat e …

Industry 4.0
Intelligent Self-Learning, Self-Adjusting Zero Defect Line
Smart Factory Solution
3
CyberOptics oers a range of unique value-add software
solutions that enable automation, reduce rework costs,
minimize scrap and optimize print process.
CyberOptics Software Solutions provides our customers and
partners the best added-value possible for inspection and
measurement in electronics manufacturing.
Save Time, Save Expense and Improve Yields with
CyberOptics’ Powerful Value-Add Solutions
SPI Pre Reow AOI Post Reow AOI
Enables smarter and faster inspection
• Reduce training eorts and minimize operator interaction saving time and cost with the
powerful yet simple software with intuitive multi-touch interface and 3D visualization tools.
• Optimize printing process, establish stencil cleaning cycles and ne-tune printer set-up.
• Gain the power to do more with SPI results with closed loop feedback.
• Improve the solderability of smaller components by using the printing oset data for
compensating parts placement with forward capability.
Automatically optimizes the print process by proactively analyzing
current trend data.
• Improve yields and reduce downtime with its predictive process improvement capability.
• Get started quickly with pre-dened templates
• Customize with customizable rules for specic product needs.
Enables smarter and faster inspection
• Ultra-fast programming capabilities, auto tuning and enhancements that signicantly
speed setup, simplify the process, reduce training eorts and minimize operator
interaction.
• Speed programming and performance with AI (Autonomous Image Interpretation)
technology for set-up in <13 minutes with a data-rich, pre-loaded library and
automated scripts that collect and update models all on their own.
A complete Statistical Process Control (SPC), oers full-edged
machine-level to factory-level SPC capability to improves yields
• Attain eective process verication and control with traceability.
• Identify trends and enhance line yields with real-time monitoring tools for historical analysis
and reporting.
• Reduce training with easy-to-set-up intuitive interface that facilitates quick learning.
• Achieve fast parsing and charting speed with the robust and scalable software, while enabling
an extremely compact database size.
Enables smarter and faster coordinate measurement (Add-on)
• Extensive suite of CMM tools for precise measurement of critical features
• Signicantly speed measurements compared to traditional CMM systems, with high accuracy
and repeatability
• Multi-process capable – 3D AOI, 3D AOM, 3D CMM
As members and participants in the IPC-Connected
Factory Initiative and The Hermes Standard, CyberOptics
is committed to advancing machine-to-machine
communication in SMT assembly and maximize line
throughput and traceability in an open protocol.
INDUSTRY 4.0

Packaging SMT
Through Hole
Mobile Phone SMT
Memory SMT
Medical SMT
Automotive SMT - Pins
Application Examples
Expanding Capabilities for Multiple Industries
Powered by
MRS™ Technology
APPLICATIONS
Mini/ MicroLED Inspection
BGA/ Solder Ball and Bump
Industrial/ Machined Parts
Inspection and Metrology
Capabilities
Component Types Inspected
• Standard SMT (chips, J-lead, gull-wing, BGA, etc.),
through-hole, odd-form, clips, connectors, header pins,
and more
Component Defects
• Missing, polarity, tombstone, billboard, ipped, wrong
part, gross body and lead damage, and more
Solder Joint and Other Defects
• Gold nger contamination, excess solder, insucient
solder, bridging, through-hole pins
3D Measurement Inspection
• Lifted Lead, package coplanarity, polarity dimple and
chamfer identication
Solder Paste Inspection
• Height, area, volume, registration and bridge detection
Coordinate Measurement Capability
• Line / Distance / X,Y / Mid Line, Inter Point / Regression
Shifted, Datum X,Y / LSF X,Y Oset, X,Y Oset / Value
/ Location / List of X,Y Values, Height / Local Height /
Regression / Radius, Coplanarity/ Distance to plane / 2nd
Order tting, Dierence / Absolute / 2sqrt / VC, Max /
Min / Ave / Sigma / Plus / Minus / Multiple
Automated Optical Inspection
Solder Paste Inspection
Coordinate Measurement - Socket Metrology
Semiconductor Applications
Copper Pillar Micro Bumps Flip Chip (c4)

Case Studies
Proven Inspection and Metrology Solutions that
Improve Process and Yield
Powered by
MRS™ Technology
CASE STUDIES
Socket Metrology
Our customer was using a Coordinate Measurement Machine (CMM) to handle
the intricate measurements required for their socket metrology, semiconductor
jigs and mobile phone sensors. A high-volume manufacturer, they needed a
stable, robust and accurate metrology solution to inspect a variety of parts.
Though highly accurate, the slow speed of their outdated CMM system made
it dicult for this company to keep up with customer demand while meeting
stringent requirements, taking more than 10 hours to inspect 3,000 contact
points. The company’s workaround for the slow measurement speed was
a <5% sampling test requiring a great deal of resources to measure and
verify the correlation.
The CMM system also required intensive training, routine maintenance and
multiple adjustments throughout the inspection period to account for variables. Though there are machines in the market specically
for high-volume manufacturing that have greatly improved the speed of inspection, these machines have a limited eld of view (FOV),
preventing proper inspection of new, larger socket designs. To meet increasing customer demand and standards, the company needed a way
to accelerate inspection without wavering on quality or accuracy.
We worked with our customer to implement the SQ3000 CMM in their backend inspections, accelerating and optimizing production.
This system meets and exceeds expectations for full-coordinate measurements. What once took eight hours with the original CMM, now
takes less than 13 seconds, including all points and CTFs. The precision gantry provides a larger FOV for a more complete view of the
component, allowing our customer to scan a wider range of socket and part sizes.
Coordinate Measurement - Socket Metrology
Rohinni Adopts CyberOptics MRS-Enabled SQ3000 Multi-Function
system for Inspection and Metrology of Rohinni’s Micro LED
Technology
Rohinni needed an inspection and metrology solution for six critical in-line
production process locations including incoming quality inspection of the
exible circuits, solder paste inspection, pre and post reow AOI, coordinate
measurements post placement of the LED die and nal test.
CyberOptics SQ3000 Multi-Function system for Automated Optical Inspection
(AOI), Solder Paste Inspection (SPI) and Coordinate Measurements (CMM) was
extensively evaluated and adopted to address all six production process
locations.
“We are happy to use the SQ3000 in our line solution to inspect various process
steps because of its higher speed, higher resolution and higher accuracy with
the in-line CMM capability,” said Matthew Gerber, CEO, Rohinni. “The unmatched
performance and versatility of the system make it the perfect solution for our
challenging application needs and stringent quality requirements.”
View these Case Studies and others in their entirety at
www.CyberOptics.com
Example of micro/mini LED solutions. Source: Rohinni
Daktronics Considers CyberOptics SQ3000 CMM the Best in the
Industry for Inspection and Metrology
Daktronics needed a high resolution, high accuracy solution for
measuring and inspecting anything from a board size of 150mm
x 150mm with a tolerance of +/- 20m, to a Mini LED pixel with features
(LEDs, solder deposit, PCB features) that are less than 50m. The boards
and LEDs are ultimately integrated into various video displays.
Daktronics sought a solution to replace a manual microscope method in
their metrology lab. Although the microscope system works well for
small parts, it is limited in the size of substrate it can handle and it is not
very automated.
After a full, extensive evaluation to ensure it would meet Daktronics
stringent requirements, the company installed a CyberOptics
SQ3000 CMM (Coordinate Measurement Machine) in their lab testing environment for inspection and metrology. Daktronics considers
the SQ3000 CMM the best in the industry for their application needs based on the high resolution, high accuracy, comprehensive
coordinate measurement software suite, versatility, automation and ease-of-use. It provides the highest quality inspection and
metrology data to meet their commitment to the highest quality standard.
Example of Daktronics video board. Source: Daktronics
Packaging
Our customer experienced increased demand for their PCB boards with 0201
components and needed a way to ramp up and signicantly improve their
inspection process. Due to the intricacies and variations between elements from
a variety of suppliers, manual inspection was not an option. Manual inspection
also prohibited eective tracking of defects and anomalies of the intricate 0201
components. Speed and accuracy in high-volume inspection were very important
to our customer. Defects, when caught, were discovered at the very end of
inspection, forcing signicant manufacturing delays. The customer also struggled
with a high escape rate. To get to mass market quickly, this customer needed an
automated solution that allowed them to catch defects sooner, while reducing
operator costs and overhead. Shine was another factor that posed concerns.
As parts grew shinier, it became more and more dicult to nd a solution that
provided reliable, consistent inspection at their goal rate of 20,000 parts in under 20 seconds.
Implementing the SQ3000 allowed for a versatile solution that is easy to use and provides consistent, accurate results at high speeds. The
sensor, software and system all work together to completely automate the full-line inspection process, with higher mean time between
failures of inspected components — more than 35,000 hours. This solution meets the customer’s production requirement for line cycle time
with repeatability of six micrometers in three sigma for X, Y, Z measurement. The 2D scanning provides inspection coverage for text, rotation,
position, cracked or damaged components, debris and gap measurements, while the advanced 3D scanning technology provides detailed
coplanarity inspection up to eight times faster than competing solutions.
Packaging SMT