SYSTEMS-8020665-REV_K.pdf - 第5页

SE 6 0 0™ | High Pre cision • Dual illumination s ensor • Ins pec tion s peed up to 1 08 cm 2 / s ec. • SE60 0 - X available with L arge Board capabilit y SE50 0™ U LT R A | Hi gh S peed • High -spee d single illuminatio…

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Intuitive, Easy-to-use Software
The multi-award winning SQ3000 AOI software is a more powerful yet
extremely simple software designed with an intuitive interface. Including
multi-touch controls, 3D image visualization tools and ultra-fast programming
capabilities that brings ease-of-use to a completely new level, which reduces
training eorts and minimizes operator interaction - saving time and cost.
AI
2
- Superior in Programming &
Performance
CyberOptics AI
2
(Autonomous Image Interpretation) technology is all about
keeping it simple - no parameters to adjust or algorithms to tune. And, you do
not need to anticipate defects or pre-dene variance either - AI
2
does it all for
you. With AI
2
, you have the power to inspect the most comprehensive list of
features and identify the widest variety of defect types - including those that
you least expect.
Perfect for those high-mix or low volume applications. With its unique ability
to ‘ignore’ bad examples in a model, AI
2
oers precise discrimination even with
excessive variance and minimizes eects of outlier examples. The pixel marking
feature highlights defective spots, so you can identify genuine defects instantly.
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AOI SYSTEMS
Award-Winning AOI Software
Faster, Simpler and Smarter
CyberReport™ - Fast, Scaleable SPC Solution
CyberReport oers full-edged machine-level to factory-level SPC capability with powerful historical analysis and reporting tools
delivering complete traceability for process verication and yield improvement. CyberReport is easy to setup and simple to use while
providing fast charting with a compact database size.
Factory-level SPC
Line-level SPC
Machine-level SPC
Yield
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Faster, Highly Accurate Coordinate
Measurement (CMM) Suite
CyberCMM™, a comprehensive software suite of coordinate measurement tools provides highly accurate, 100% metrology-
grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and
datum X, Y to name a few.
A fast and easy set-up can be performed with the world’s rst in-line CMM system for programming complex applications
as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments with traditional
coordinate measurement machines (CMMs).
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Enable Smarter, Faster Inspection
Speed programming and tuning with new capabilities including AutoTeach,
AutoTune and AutoDene for faster set-up and to simplify process.
• New body inspection settings and lead inspection settings; automatically
teaches from the height map what parts are loaded based upon CAD data.
Lead inspection settings include 3D area measurement.
• New gap inspection settings; blob analysis - looks at height in between leads
beyond using an image
• New AutoDene Feature; automatically detects and adds inspection features
including leads and gaps by drawing a box around the package or component
• New AutoFeatureSet and AutoTune; adds body, leads and gaps inspection
features to training set data. AutoTune sets nominals for the specic package.
Sample Report
Failed Model
Passed Model
AutoDene Example
SE600™
|
High Precision
• Dual illumination sensor
• Inspection speed up to 108cm
2
/sec.
• SE600-X available with Large Board capability
SE500™ULTRA
|
High Speed
• High-speed single illumination sensor
• All-in-one scan
• On the y measurement at 210cm
2
/sec.
3D SPI Sensor Technology - Fast, Accurate Performance
Designed and built by CyberOptics, the sensor is manufactured as an integrated unit with no moving parts – which means no machine-
to-machine variation either. Plus, there is no drift over time, no parts to wear and absolutely no recalibration needed. The Dual
Illumination Sensor comes standard with the SE600.
For improved repeatability on smallest paste deposits, you can choose from the ULTRA and Dual Illumination sensor options on the
SE500ULTRA. Pads as small as 100 microns (4 mils) can be accurately measured with the MicroPad sensor. And, it is easy to swap with the
standard sensor too – so you can plug-and-play whenever you need to.
Dual Illumination SensorULTRA Sensor
Solder Paste Inspection (SPI)
Ultimate Precision Accuracy with World-Class Usability
SE3000
|
3D SPI
A Leap Forward in Solder Paste Inspection
• MRS Sensor for metrology grade accuracy at production
speed
• Enables unrivaled GR&R
• SE3000™ X available for Large Board capability
SE3000™ DD
|
3D SPI
Dual Lane - Dual Sensor
• Dual MRS sensors delivers metrology grade
accuracy at production speed
• Flexibility to switch from dual to single lane
for large boards
• SE3000™ D Dual Lane option available
MRS Technology for 3D SPI
The SE3000 SPI System brings the revolutionary MRS technology to solder paste
inspection delivering higher performance in accuracy and precision. Eective
suppression of multiple reections is critical for highly accurate measurements,
making MRS an ideal technology solution for a wide range of applications
including those with very high quality requirements.
CyberOptics MRS Sensor architecture, extended from the award-winning SQ3000
AOI platform, has been designed for use in solder paste inspection applications.
The unique sensor architecture with multi-view 3D sensors and a parallel
projector, simultaneously captures and transmits multiple images in parallel
while proprietary 3D fusing algorithms merge the images together, delivering
metrology grade accuracy at production speed.
SPI SYSTEMS
CyberOptics’ software delivers world-class user experience with its
intuitive interface that is extremely stable and simple to use, enabling
the shortest learning curve. With full multi-touch experience, SPI
software oers a range of features that enable smarter and faster
inspection:
• Seamless integration of all applications - Teach, Inspection, Defect
Review and Real-time SPC
• Unlimited undo-redo and global search options in Teach
• Loads of smart, informative and relevant charts that provide yield
summary, FPY information, hotspot display, top 10 pad failures,
historical panel and more.
• Easy, hassle-free operation using multi-touch, multi-selection, pinch-zoom
and pan-move options.
Closed Loop/ Feed-forward Ready
Reduce rework costs, increase production throughput and improve quality
CyberOptics’ SPI systems fully support feedback and feed forward capability with leading Solder Paste Printer and SMT
Mounter vendors. Closed loop feedback gives you the power to do more with SPI results – optimize printing process, establish
stencil cleaning cycles and ne-tune printer setup. While feed-forward capability improves the solderability of smaller
components by using the printing oset data for compensating parts placement. All this means reduced rework costs,
increased production throughput and improved quality.
Closed Loop Feedback Feed Forward Ready
Shifted solder
Corrected data of
shifted solder
Gives you the power to do more with SPI results - optimize
printing process, establish stencil cleaning cycles and ne-tune
printer set-up
Improves solderability of smaller components for
reduced rework cost, improved production throughput
and improved quality
All Major Screen
Printers
CyberOptics
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Award-Winning SPI Software
Intuitive Design, Exceptional Usability
CyberPrint OPTIMIZER™
Automatically optimizes the print process by proactively analyzing accurate trend data
– rst-ever in the industry! Pre-dened templates help you get started quickly while
customizable rules support perfect customization for specic product needs. With
its predictive process improvement capability, you can get better yields and reduce
downtime.
SPI SYSTEMS
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Failure analysis drives line optimization and auto tolerance changes
Defect Correlation
SPI AOI AOI
FAIL
FAIL
FAIL
FAIL
FAIL FAIL
PASS PASS
PASS
CyberReport™ - Fast, Scaleable SPC Solution
CyberReport oers full-edged machine-level to factory-level SPC capability with powerful historical analysis and reporting tools
delivering complete traceability for process verication and yield improvement. CyberReport is easy to setup and simple to use while
providing fast charting with a compact database size.
Factory-level SPC
Line-level SPC
Machine-level SPC
Yield
CYBERREPORT
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AOISOFTWARE
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Sample Report