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Trans lati on Form ats B-42 AutoSite User Manual The P Field The P field remaps the device pinout and is used with the V (test vector) field. An asterisk terminates the field. The syntax of the field is as follows: <p…

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Translation Formats
AutoSite User Manual B-41
The C field, the fuse information checksum field, is used to detect
transmitting and receiving errors. The field contains a 16-bit sum
(modulus 65535) computed by adding 8-bit words containing the fuse
states for the entire device. The 8-bit words are formed as shown in the
following figure. Unused bits in the final 8-bit word are set to zero before
the checksum is calculated.
Following is an example of full specification of the L, C, and F fields:
F0*L0 01010101* L0008 01010111* L1000 0101*C019E*
Following is an alternate way of defining the same fuse states using the K
field:
F0*K0 55* K0008 57* K1000 5* C019E*
Another example, where F and C are not specified:
L0200 01101010101010101011
010111010110100010010010010*
The Security Fuse Field (G)
<security fuse>::=’G’<binary-digit>’*’
The JEDEC G field is used to enable the security fuse of some logic
devices. To enable the fuse, send a 1 in the G field:
G1*
The Note Field (N)
<note>::=’N’<field characters>’*’
The note field is used in JEDEC transmission to insert notes or comments.
The programmer will ignore this field; it will not be interpreted as data.
An example of a note field would be:
N Test Preload*
The Value Fields (QF, QP,
and QV)
JEDEC value fields define values or limits for the data file, such as
number of fuses. The QF subfield defines the number of fuses in the
device. All of the value fields must occur before any device programming
or testing fields appear in the data file. Files with ONLY testing fields do
not require the QF field, and fields with ONLY programming data do not
require the QP and QV fields.
The QF subfield tells the programmer how much memory to reserve for
fuse data, the number of fuses to set to the default condition, and the
number of fuses to include in the fuse checksum. The QP subfield defines
the number of pins or test conditions in the test vector, and the QV
subfield defines the maximum number of test vectors.
Word 00
Fuse No.
msb
7654321
lsb
0
Word 01
Fuse No.
msb
15 14 13 12 11 10 9
lsb
8
Word 62
Fuse No.
msb
503 - - - 499 498 497
lsb
496
Translation Formats
B-42 AutoSite User Manual
The P Field
The P field remaps the device pinout and is used with the V (test vector)
field. An asterisk terminates the field. The syntax of the field is as
follows:
<pin list>::=’P’<pin number>:N’*’
<pin number>::=<delimiter><number>
The following example shows a P field, V field, and the resulting
application:
P 1 2 3 4 5 6 14 15 16 17 7 8 9 10 11 12 13 18 19 20 *
V0001 111000HLHHNNNNNNNNNN*
V0002 100000HHHLNNNNNNNNNN*
The result of applying the above P and V fields is that vector 1 will apply
111000 to pins 1 through 6, and HLHH to pins 14 through 17. Pins 7
through 13 and 18 through 20 will not be tested.
JEDEC U and E
Fields
As of Version 2.5, the programmer supports the optional JEDEC U (user
data) and E (electrical data) fields. The U and E fields are described below.
Note: Implementation of the JEDEC U and E fields is not part of the JEDEC-3C
(JESD3-C) standard.
User Data (U Field)
The
U
field allows user data fuses that do not affect the logical or
electrical functionality of the device to be specified in JEDEC files. For
instance, the U field can be used to specify the User Data Signature fuse
available in some types of PLD devices because this fuse contains
information only (it has no logical or electrical functionality).
Note: To have the JEDEC U field processed correctly, you must select the device
before downloading the JEDEC file.
The following guidelines apply to the U field:
• The U field must be included for devices with U fuses.
• Each U-field cell must be explicitly provided if the U field is present.
• The F (default fuse state) field does not affect U fuses.
• There can only be one U field in a JEDEC file.
• The U field fuses must be listed in the order they appear in the
device.
• The U field must be listed after the L field and E field (if used), and
before the V (test vector) field (if used).
• The U field is specified using binary numbers, since the full number
of U-field cells is otherwise unknown.
• The number of cells specified in the U field is not included in the QF
(number of fuses) field.
Translation Formats
AutoSite User Manual B-43
• The U-field cells are not included in the C (fuse checksum) field.
• The U field reads left to right to be consistent with the L (fuse list) and
E fields.
The syntax for the U field is as follows:
<User Data Fuse List>::’U’<binary-digit(s)>’*’
The character U begins the U field and is followed by one binary digit for
each U fuse. Each binary digit indicates one of two possible states (zero,
specifying a low-resistance link, or one, specifying a high-resistance link)
for each fuse.
For example,
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
Electrical Data (E field)
The
E
field allows special feature fuses that do not affect the logic
function of the device to be specified in JEDEC files.
The following guidelines apply to the E field:
• The E-field cell must be explicitly provided if the E field is present.
• The F (default fuse state) field does not affect E fuses.
• There can only be one E field in a JEDEC file.
• The E field fuses must be listed in the order they appear in the device.
• The E field must be listed before the C (checksum) field. If the U field
is used, the E field must come before the U (user data) field.
• The E field is specified using binary numbers, since the full number
of E-field cells is otherwise unknown.
• The number of cells specified in the E field is not included in the QF
(number of fuses) field.
• The E-field cells are included in the C (fuse checksum) field.
• The E field reads left to right for the purpose of checksum calculation.
The syntax for the E field is as follows:
<Electrical Data Fuse List>::’E’<binary digit(s)>’*’
The character E begins the E field and is followed by one binary digit for
each E fuse. Each binary digit indicates one of two possible states (zero,
specifying a low-resistance link, or one, specifying a high-resistance link)
for each fuse. For example,
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
Test Field (V field)
<function test> :: = [<pin list>] <test vector> {<test vector>}