Autosite_Users_Manual.pdf - 第142页
Trans lati on Form ats B-44 AutoSite User Manual <pin numbe r> :: = <del imiter > <number> N :: = number of pins on device <test vector> :: = ‘V’ <number> < delimiter> < test cond i…
Translation Formats
AutoSite User Manual B-43
• The U-field cells are not included in the C (fuse checksum) field.
• The U field reads left to right to be consistent with the L (fuse list) and
E fields.
The syntax for the U field is as follows:
<User Data Fuse List>::’U’<binary-digit(s)>’*’
The character U begins the U field and is followed by one binary digit for
each U fuse. Each binary digit indicates one of two possible states (zero,
specifying a low-resistance link, or one, specifying a high-resistance link)
for each fuse.
For example,
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
Electrical Data (E field)
The
E
field allows special feature fuses that do not affect the logic
function of the device to be specified in JEDEC files.
The following guidelines apply to the E field:
• The E-field cell must be explicitly provided if the E field is present.
• The F (default fuse state) field does not affect E fuses.
• There can only be one E field in a JEDEC file.
• The E field fuses must be listed in the order they appear in the device.
• The E field must be listed before the C (checksum) field. If the U field
is used, the E field must come before the U (user data) field.
• The E field is specified using binary numbers, since the full number
of E-field cells is otherwise unknown.
• The number of cells specified in the E field is not included in the QF
(number of fuses) field.
• The E-field cells are included in the C (fuse checksum) field.
• The E field reads left to right for the purpose of checksum calculation.
The syntax for the E field is as follows:
<Electrical Data Fuse List>::’E’<binary digit(s)>’*’
The character E begins the E field and is followed by one binary digit for
each E fuse. Each binary digit indicates one of two possible states (zero,
specifying a low-resistance link, or one, specifying a high-resistance link)
for each fuse. For example,
QF24*
L0000
101011000000000000000000*
E10100111*
C011A*
U10110110*
Test Field (V field)
<function test> :: = [<pin list>] <test vector> {<test vector>}
Translation Formats
B-44 AutoSite User Manual
<pin number> :: = <delimiter> <number>
N :: = number of pins on device
<test vector> :: = ‘V’ <number> <delimiter> < test condition> :N ‘* ‘
<test condition> :: = <digit> ‘B’ | ‘C’ | ‘D’ | ‘F’ | ‘H’ | ‘K’ | ‘L’ | ‘N’ | ‘P’
| ‘U’ | ‘X’ | ‘Z’
<reserved condition> :: = ‘A’ | ‘E’ | ‘G’ | ‘I’ | ‘J’ | ‘M’ | ‘O’ | ‘Q’ | ‘R’ |
‘S’ | ‘T’ | ‘V’ | ‘W’ | ‘Y’ | ‘Z’
Functional test information is specified by test vectors containing test
conditions for each device pin. Each test vector contains
n
test conditions,
where n is the number of pins on the device. The following table lists the
conditions that can be specified for device pins.
When using structured test vectors to check your logic design, do NOT
use 101 or 010 transitions as tests for clock pins: use C, K, U, or D instead.
Test Conditions
Note: C, K, U, and D are clocking functions that allow for setup time.
The C, K, U, and D driving signals are presented after the other inputs are
stable. The L, H, and Z tests are performed after all inputs have
stabilized, including C, K, U, and D.
Test vectors are numbered by following the V character with a number.
The vectors are applied in numerical order. If the same numbered vector
is specified more than one time, the data in the last vector replace any
data contained in previous vectors with that number.
0 Drive input low
1 Drive input high
2-9 Drive input to supervoltage #2-9
B Buried register preload (not supported)
C Drive input low, high, low
D Drive input low, fast slew
F Float input or output
H Test output high
K Drive input high, low, high
L Verifies that the specified output pin is low
N Power pins and outputs not tested
P Preload registers
U Drive input high, fast slew
X Output not tested, input default level
Z Test input or output for high impedance
Translation Formats
AutoSite User Manual B-45
The following example uses the V field to specify functional test
information for a device:
V0001 C01010101NHLLLHHLHLN *
V0002 C01011111NHLLHLLLHLN *
V0003 C10010111NZZZZZZZZZN *
V0004 C01010100NFLHHLFFLLN *