Autosite_Users_Manual.pdf - 第170页
Glossary AutoSite User Manual Glossa ry-9 Underblo wn Fuse A fuse that did no t disconnect as per manufacturer’s specificat ion. These fuses may test pro perly, but tend to be more prone to grow back when in circuit, ren…
Glossary
Glossary-8 AutoSite User Manual
one such string, e.g., 20 characters for a 20-pin PLD, with 10 input signals
and 10 expected outputs.
Structured Test Vectors
(design)
Structured vectors created by the design engineer to confirm that the
design is operating as intended, e.g., that a 10-bit counter is counting to
10. Design vectors are used in both preprogramming simulation and
manufacturing.
Structured Test Vectors
(device)
Structured vectors created by the design engineer, test engineer, or an
automatic test vector generation program, which confirm that the device
is operating properly after programming, e.g., that nothing can happen in
the device to prevent the 10-bit counter from operating correctly. An
exhaustive set of device vectors will assure that no undetectable faults
may occur.
Sumcheck
A 4- or 8-digit hexadecimal number that, when compared to the original
data, allows you to verify that a copy of the data matches the original
data. Memory devices have 8-digit sumchecks and logic devices have
4-digit sumchecks. For devices in a set, you can calculate the individual
sumcheck of the device and the sumcheck of the entire set.
Terminal Emulator
A program to enable a PC or other computer to act as an ASCII terminal.
Allows a PC to be used to communicate with a programmer in terminal
mode or with a mainframe.
Test Vector
Test vectors functionally test the device, using structured test vectors
stored in memory or in a disk file.
Test Vector Stretching
Conversion of DIP test vectors to equivalent PLCC test vectors by adding
don’t care vector characters into the string to correspond with the PLCC’s
dead pins.
Total Set Size
Used during serial set programming, this value specifies how many
devices are in a set.
Translate DIP/LCC Vectors
See JEDEC I/O translate DIP/LCC Vectors.
Translation Formats
A form of transmission protocol, these formats are used when
transferring data between the programmer and a host computer. The
different formats represent different ways of encoding the device data in
a data file. The data file could contain the fuse pattern for a logic device or
the data for a memory device.
Transmit Pacing
The number of milliseconds AutoSite will insert as a time-delay between
characters transmitted to the host computer during uploading. The time
delay is specified in tenths of milliseconds.
Underblow
A condition in which fuses that should have been blown or programmed
were not.
Glossary
AutoSite User Manual Glossary-9
Underblown Fuse
A fuse that did not disconnect as per manufacturer’s specification. These
fuses may test properly, but tend to be more prone to grow back when in
circuit, rendering the PLD useless.
Universal PLD
Programmer
A programmer that can apply power, ground, and any programming
pulse required to program any fuse technology device.
Universal Pin Driver
A pin driver with the ability to supply power and ground to every pin.
With Universal Pin Drivers, you can program and test devices without
having to use pin out adapters and characterizers.
Upload Data
A file transfer operation that involves sending data from the programmer
to a host.
Upload Host Command
A command that is sent from AutoSite to the host during an upload. The
command tells the host what to do with the incoming data.
Upload Wait
The length of time AutoSite will wait before it begins sending data to the
host computer after the host upload command is sent.
User Data Size
The hexadecimal number of bytes of a data block to use for a device
operation. Normally, this value is equal to the device size. During serial
set operations, this value works with Total Set Size to determine the total
number of bytes to program into a set of devices.
User Memory
The workspace used during device operations. It can be either internal
RAM or a disk file. Normally, RAM is used for small, quick device
operations, such as programming a single device, while disk is used for
larger device operations, such as serial set programming.
User RAM
The RAM in AutoSite. User RAM can be used as a source/destination for
an operation. Several operations use User RAM as a temporary storage
buffer, overwriting any data that may have been there previously.
Verify Device
A device operation that compares data in a programmed device with data
in RAM or in a disk file. With logic devices, verifying can also include
functional testing. Verify is an automatic part of the program operation,
but additional verify operations can provide useful information about
any errors.
Verify Pass
A verify pass is a trip through a device at a specified Vcc to see if the
device programmed properly. The pass is usually done once at 5V. The
pass can also be done twice, with the first pass at 5.5V and the second
pass at 4.5V.
Waveforms
Images of the programming pulses that program a device. Usually
created by programmer manufacturers and submitted to device
manufacturers as part of the approval process and to record the correct
programming spec for a specific device.
Glossary
Glossary-10 AutoSite User Manual
Wildcard
Used when entering filenames, a wild card represents one or more
characters in a filename. For example,
27*.dat
can represent both
27512.dat
and
27128.dat
.
Yield
The percentage of successfully programmed devices.
Yield Tally
The yield tally function keeps track of the programming statistics for the
last 16 types of devices programmed. The following statistics are kept for
each device type: the manufacturer name and part number, the family/
pinout code, the number of devices attempted, the number of devices that
programmed successfully, the number of devices that failed non-blank
test or illegal bit check, the number of devices that failed to verify, the
number of devices that could not be programmed because they contained
bits that required more programming pulses than were specified, and, for
logic devices only, the number of devices that failed structured vector
test.
ZIF Socket
An acronym for Zero Insertion Force. A socket into which the device can
be dropped and engaged via a lever.