00195987-03_VB_SWS_Software_3.0_DE_EN.pdf - 第31页

SIPLACE SWS Software 3. 0 / Versionsbeschreibung / Ve rsion Description Ausgabe 12/2014 Edition 31 13 SWS Software 2.1 Features The SWS software 2.1 include s all functions from the SWS softwar e 2.0. The following secti…

SIPLACE SWS Software 3.0 /

Versionsbeschreibung / Version Description Ausgabe 12/2014 Edition

12.8 Plain Wafer

12.8.1 Using Fixed Wafer Map Coordinates

This option forces a link of the start die position and the wafer map coordinates.

Background:

Without this option (default), the wafer map die coordinates are calculated from the theoretical

center point once the start dies have been defined in manual or automatic wafer referencing. If the

wafer was fitted badly in the wafer frame and it is not possible to perform wafer edge recognition

(e.g. for synthetic wafers with very wide dicing streets) too many dies will be taken off the wafer or

large areas of the wafer will be approached in which no dies are found.

This is prevented with the Use fixed wafer map coordinates option.

SIPLACE SWS Software 3.0 /

Versionsbeschreibung / Version Description Ausgabe 12/2014 Edition

13 SWS Software 2.1 Features

The SWS software 2.1 includes all functions from the SWS software 2.0. The following section

describes the main new features in version 2.1 of the SWS software.

NOTE

For details about the individual functions, please refer to the software manual for

the "SIPLACE SWS Software 2.1 [item no.: 00195986-02].

13.1 Revised Interface to Wafer Map Server

The menu navigation at Manual setting => Wafer-Map has been simplified. The settings and

monitoring options have been revised.

The option Connection settings => SIPLACE Wafer System has been extended. The software

now also supports passive connections to the wafer map server.

SIPLACE SWS Software 3.0 /

Versionsbeschreibung / Version Description Ausgabe 12/2014 Edition

13.2 Simplified Navigation in Manual Setting Menu

The menu navigation at Manual setting => Parameter test camera and in the corresponding

Wafer camera and Inspection camera views has been simplified.

A few unnecessary functions, such as Pattern Teaching, have been removed.

13.3 LAN Connection to Station Software 708

In addition to the connection via CAN with the station software 605 SP5, the SWS software

supports a connection to machines via LAN with station software 708.