cp742me_pam_operation_manual.pdf - 第9页

Fuji Software Upgrade Report (Appendix) 02022A3 9/21 htt p:/ /www.f uj i. co. jp / Copyright © 2002 Fuji Mac hine Manufacturi ng Co., Ltd. All Right s Reserved. 5. Displaying the Measu rement Results Press [Maintenanc e]…

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4.5 Renewal

The results are used to update the machine data placement offset items.

4.6 Editing Offset Tolerances

The offset tolerances can be edited.

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5. Displaying the Measurement Results

Press [Maintenance] - [PAM Measure] - [100%/80%] - [OK] - [PAM Measure] - [Result] to display the

following screen. The results for all the measurements display (Avg., 3

σ, 6σ, Max., Min., Cp, Cpk).

Measurement results screen.

5.1 Change Nozzle

The nozzle display can be changed.

5.2 Edit USL/LSL

The data (USL, LSL) can be set for the calculation of Cp and Cpk.

5.3 Show Deviation

The measurement results for each sequence are displayed.

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6. Editing USL and LSL

Press [Maintenance] - [PAM Measure] - [100%/80%] - [OK] - [PAM Measure] - [Result] - [Edit

USL/LSL] to display the following screen.

Editing screen for USL/LSL.

6.1 Set

Press [Set] to the left of the item to be edited, and input the setting using the numerical keypad.

6.2 Cp and Cpk Calculation Functions

The functions to calculate Cp and Cpk are as follows.

Ave: Average amount of misalignment

σ: Standard deviation

USL: Upper limit

LSL: Lower limit

6 sigma

USL - LSL

Cpk

USL + LSL

-Ave

USL - LSL

Cp 1 -