TR518_SII_硬体规格与架构_v1.0.0.pdf - 第13页
Test R esearch Inc. TR518 SII 使用手冊 --- 硬體 規格與架構 11 3.1 功能 Open, Short Tes t R, L, C Test Resistor Test: 40 m ohm ~ 40Moh m Capacitor Test: 1pF ~ 40mF Inductor Test : 1uH - 60H Diode, Zener Diod e, IC Cl ampin…

Test Research Inc.
10 TR518 SII 使用手冊---硬體規格與架構
3 ANALOG TEST MODULE (ATM) BOARD
Figure 5: Analog Test Module (ATM) Board

Test Research Inc.
TR518 SII 使用手冊---硬體規格與架構 11
3.1 功能
Open, Short Test
R, L, C Test
Resistor Test: 40mohm ~ 40Mohm
Capacitor Test: 1pF ~ 40mF
Inductor Test: 1uH-60H
Diode, Zener Diode, IC Clamping Diode Test
Transistor, FET, MOSFET, Photo-Coupler Test
SCR, TRIAC Test
Press Unit Interface
TestJet
GPIO function
USB2.0 Interface between TR518 SII system and notebook/PC

Test Research Inc.
12 TR518 SII 使用手冊---硬體規格與架構
3.2 規格
3.2.1
類比測量模組
1 DCV or ACV or DC Constant Current Source.
1 DCV Source
1 High Voltage Source
AC/DC Voltage Measurement
AC/DC Current Measurement
System Diagnostic
3.2.2 直流電壓源
Two Programmable Output Voltage: 0V ~ +/-10V
Resolution: 5.86mV
Voltage Accuracy: 1.5%
Source-Configurable as Current and/or Voltage
High Voltage Current Source :30 ~ 100V , 4%
3.2.3 交流電壓源
1 Sine wave Voltage Source
Programmable Output Voltage: 0V ~ +/-10(AC+DC)(Max)
Resolution: 23.44mV
Voltage Accuracy: 2%
Frequency Range : 1 ~ 100KHZ (Max)
3.2.4 直流電流源
1 DC Current Source
Programmable Output Current:
Current Range : 50mA ~ 100nA
Accuracy: 3% FS +/-100nA
Programmable Clamping voltage