TR518_SII_硬体规格与架构_v1.0.0.pdf - 第17页
Test R esearch Inc. TR518 SII 使用手冊 --- 硬體 規格與架構 15 3.2.16 電感測量 Range : 1uH ~ 60H Accuracy : (1% ~ 10% ) +/-50uH 3.2.17 兩極體測量 Current Ran ge : 3mA, 10mA, 20mA Voltage Range : 0 ~ 10V 3.2.18 齊納 二極體測量 Current Ran …
Test Research Inc.
14 TR518 SII 使用手冊---硬體規格與架構
3.2.9 阻抗測量
RC & Other Analog Circuits
Programming Frequency: 0.15 ~ 100KHz
AC level 100mVrms\
3.2.10 訊號產生器
1 Sine wave voltage Source
Frequency Range : 0 ~ 100KHZ(Max)
Frequency Resolution : 1 HZ
DC offset Range: 0 ~ +/-10V (Max)
Minimum output level : 100 mV
3.2.11 電阻測量
40mΩ- 40MΩ over 7 range
Uses 2-, 4- Wire Unguarded Tests
Uses 3-, 6- Wire Guarded Tests
Accuracy: 1% to 10%
3.2.12 電容測量
Range: 1pF ~ 40mF
Accuracy: (3% - 10%)+/-100pF
3.2.13 電容放電
Yes
3.2.14 針對極性電容的定向測量
2-pole Polarized Capacitor Leakage Current Test Technology
3-pole Polarized Capacitor Test Technology
HP-Test-Jet
3.2.15 針對 IC 裝置的定向測量 (not on 2-sided devices with VCC and GND
symmetrical)
Clamping Diode Test Technology
Test Research Inc.
TR518 SII 使用手冊---硬體規格與架構 15
3.2.16 電感測量
Range: 1uH ~ 60H
Accuracy: (1% ~ 10%)+/-50uH
3.2.17 兩極體測量
Current Range: 3mA, 10mA, 20mA
Voltage Range: 0 ~ 10V
3.2.18 齊納二極體測量
Current Range: 3mA, 10mA, 20mA
High Voltage Range: 100V/ 100mA max
3.2.19 雙載子接面電晶體
Junction Test (similar to Diode Test)
Hfe ( Beta ) Test
Vce Test
Source Voltage: 0 ~ +/-10V
3.2.20 場效電晶體
Junction Test (similar to Diode Test)
JFET/MOSFET Ids Test
Source Voltage: 0 ~ +/-10V
3.2.21 矽控整流器 測量
Iak Test
Source Voltage: 0 ~ +/-10V
3.2.22 保險絲,交換器 以及跳針 測試
Default Source Voltage: 0.2V
Resistance Range: 3 ohm ~ 100 ohm
Test Research Inc.
16 TR518 SII 使用手冊---硬體規格與架構
3.2.23 DACs (數位-轉-類比的轉換器)
Resolution : 12 bits
Accuracy : +/- 1 LSB
3.2.24 ADCs (類比-轉-數位的轉換器)
Resolution: 14 bits
Conversion Time : 50nS
Accuracy : +/- 4 LSBs (max)
3.2.25 通用型 輸入/輸出 (GPIO)
TTL Input : Maximum 24V
Open collect output : Maximum 24V
Over Current Protection
- Build-in diagnostic hardware
- Auto Calibration
- USB 2.0 / PCIe interface with NetBook/Notebook/Desktop PC