2023-0002-ITEC_003_Product-catalogue-Jan-2023_LR.pdf - 第12页

12 ITEC - PRODUCT PORTFOLIO Key f ea t ure s T ar ge t segmen ts • Ba ck- en d n al t es t • W a f e r Te s t High per f orm ance • Handler and prob er agnostic • Mu lti-site testing • 1 t o 4 hand ler s • Sh or t t e s…

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Eliminate power products’ lengthy test times for enhanced
output. This is the modular parameter test system for
power discrete semiconductor devices up to 12 leads.
The standard conguration has a maximum supply and
current per channel of 400V and 30A. Through its modular
architecture, this can be extended with a high voltage unit
of 2kV and a high current unit of 200A. µPARSET software
gathers data about measured devices and produces
various insights for product quality, stability, and yield
optimization.
The benchmark in analog
power testing
POWER µPARSET - DISCRETE POWER TESTER
TEST
Key features
Target segments
• Back-end nal test
• Wafer test
High performance
• Handler and prober agnostic
• 1 to 4 handlers
• Multi-site testing
• Short test times
• Pin electronics (voltage and current
measurement on all pins simultaneously)
• Maximum number of pins: (FT and AT/QT):
6 or 12 pins
• High-quality diagnostics and calibration
• High accuracy
• User-denable parameters
Test heads
• Current amplier for fast leakage
measurement
• Short and open pins close to DUT
• Dedicated test hardware
Embedded software
• User-denable parameters
• Visual ITEC: user-denable operator
interface
• Automatic multi-site expansion
• Scope function
• V and I waveforms and timing
on all channels
• Real-time diagnostics
• Curve traces
Specications
Maximum supply and current per channel
• 400 V / 30 A
Small footprint
• 600 x 665 x 1235mm
Other
• Extendable test heads for adding handlers
• Maximum: 12 leads
• Voltage: 220-240 VAC +/- 5%, 1-phase
• Current: Fused on 16 A
• Frequency: 50/60 Hz +/- 0.5 Hz
• Handler Interface: GPIB, TTL, RS232,
TCP/IP
• Optional SECS/GEM interface following
SEMI standard
Extendable software
• Equipment control for multiple test cells
• Post-processing
• Dynamic Part Average Test
• Static Part Average Test
• Moving Limits
• Nearest neighbourhood residual
Optional extension modules
• Qs: reverse recovery charge
(30 nC / 300 nC / 3 uC)
• Gate resistance and capacitance
(Rg/Cg) extension
• µPHV: high voltage test (2 kV)
• µPHC: high current unit (200 A)
• µPDI: digital interface 2 x 16 channels
fully oating
• SECS/GEM interface
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ITEC - PRODUCT PORTFOLIO
Key features
Target segments
• Back-end nal test
• Wafer Test
High performance
• Handler and prober agnostic
• Multi-site testing
• 1 to 4 handlers
• Short test times
• Pin electronics (voltage and current
measurement
on all pins simultaneously)
• Maximum number of pins:
(FT and AT/QT): 6 or 12 pins
• High-quality diagnostics
and calibration
• High accuracy
Test heads
• Current amplier for fast leakage
measurement
• Short and open pins close to DUT
• Dedicated test hardware
Embedded software
• User-denable parameters
• Visual ITEC: user-denable operator
interface
• Automatic multi-site expansion
• Scope function
• V and I waveforms and timing
on all channels
• Real-time diagnostics
• Curve traces
Specications
Maximum supply and current per channel
• 400 V / 3 A
Small footprint
• 600 x 665 x 1235mm
Other
• Extendable test heads for adding
handlers (max 4)
• Maximum: 12 leads
• Voltage: 220-240 VAC +/- 5%, 1-phase
• Current: Fused on 16 A
• Frequency: 50/60 Hz +/- 0.5 Hz
• Handler Interface: GPIB, TTL, RS232,
TCP/IP
• Optional SECS/GEM interface following
SEMI standard
Extendable software
• Equipment control for multiple test cells
• Post-processing
• Dynamic part average test
• Static part average test
• Moving limits
• Nearest neighbourhood residual
Extreme exibility options:
• µPFM: oating mV meter
(30 mV / 300 mV / 3 V)
• DCM: digital capacitance meter
(0.3 / 3 / 30 / 300 pF)
• µMUX: multiplexer 4 x 24 pins
for multi-site test
Gain short tester times and increase production at a lower
total cost of ownership. Built as a modular parameter test
system for discrete semiconductor devices with up to
12 leads, the Discrete High-Volume Tester enables high
throughput. Flexible hardware and software make
the Tester suitable for all wafer testing, nal testing,
acceptance or quality testing, and device characterization
tasks. µPARSET software gathers data about measured
devices and produces various insights. It is handler and
prober agnostic, equipped to connect to any prober or
tester. High accuracy leads to a narrow spread in test
results and better products. It can connect
up to four handlers when oor space is limited.
Eliminates lengthy
test times
µPARSET - DISCRETE HIGH-VOLUME TESTER
TEST
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Key features
Target segments
• Back-end Final Test
• Wafer Test
• PCM Test
High performance
• Near-zero footprint (213 x 440 mm)
• Ultra-short test times - increasing UPH
• Highest accuracy in the market
• Extreme exibility
Multiple congurations possible with
• 1 booster controller (nTHBC)
• Up to 4 test heads (nSBTH)
with 6 channels
• Fast Kelvin check without switching relays
• Ultra-fast leakage test
• Pin electronics
• Multi-site testing
• Optional SECS/GEM interface following
SEMI standard
Embedded software
• User-denable parameters
• Visual ITEC: user-denable operator
interface
• Automatic multi-site expansion
• Scope function
• V and I waveforms and timing
on all channels
• Real-time diagnostics
• Curve traces
Specications
Maximum supply and current per channel
• 400 V / 3 A
Small footprint
• Test Head: 125 x 540 x 375 mm
• Booster: 213 x 440 x 875 mm
Other
• Extendable test heads for adding handlers
(up to 2 handlers)
• Maximum: 12 leads
• Voltage: 220 - 240 VAC +/- 5%, 1-phase
• Current: Fused on 16 A
• Frequency: 50 / 60 Hz +/- 0.5 Hz
• Handler Interface: GPIB, TTL, RS232,
TCP/IP
• Optional SECS/GEM interface following
SEMI standard
Extendable software
• Equipment control for multiple test cells
• Post-processing
• Dynamic Part Average Test
• Static Part Average Test
• Moving Limits
• Nearest neighbourhood residual
The most advanced modular parameter test system for
discrete semiconductors up to 6 or 12 leads. With ultra-
short test times, this tester is capable of testing up to
92000 devices per hour with a single test handler - the
fastest test cell on the market. This tester can be used as
a wafer tester, a PCM tester and as a nal tester in the
back-end. nanoParset occupies minimal oor space. Up
to four test heads can be combined as one to test 24-pin
packages at the highest possible throughput. Fast Kelvin
checks without switching relays to prevent breakage.
Eliminate long test times
and high-test costs
NANOPARSET - DISCRETE ULTRA-FAST TESTER
TEST