2023-0002-ITEC_003_Product-catalogue-Jan-2023_LR.pdf - 第19页

19 NIJMEGEN Jonkerb osplein 5 2 65 3 4 A B Nijmeg en T he Ne th erl ands HONG KONG Unit H L - G 0 1 G / F , Building 22 E , Pha se 3 , Hon g Kong Sc ienc e Par k , Pak S hek Kok , Sha tin , Ho ng Kon g T he ico nic F if …

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Guarantees the quality of the products you produce
and deliver. The Post-Seal In-Tape Inspection eliminates
quality defects - bringing customer complaints and eld
recall rates close to 0 PPM. The PHIXEL IHW has a fast
convertible for 7-13-inch” carrier tape reel diameter and
auto conversion for dierent carrier tape widths up to
32mm. With AOI cellular network architecture for recipe
management and Advanced Defect Classication (ADC)
by hybrid analysis, the Post-Seal In-Tape Inspection
outperforms market competition to go above and
beyond your customers’ requirements.
The only post-tape
inspection equipment on
the market providing full
inspection capability
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ITEC - PRODUCT PORTFOLIO
Specications
Imaging system
Camera: 5M pixels area camera
monochrome
Number of cameras: 2: 1 (top) + 1 (bottom)
Resolution/Field of view: 4 - 16 µm/pixel
FOV: 10 mm to 40 mm
Minimum object detection: 16 µm
Lighting: Compound lighting
Inspection categories
Program mode: Fast programming
for common reject criteria
Reject treatment: Electronic map
Inspection view: Top (and angle camera
for lead lift-up defect as upgrade option)
Key features
Application
Inspection after taping to detect
orientation, lead, mark, seal, package
surface defect, reel label and quantity
Key features
Min. 5 MP camera for top & bottom
inspection
AOI cellular network architecture
for recipe management
Reel size: 7” to 13
Throughput: up to 120,000 UPH
(subject to package size & pitch)
Option: tilted lead defect vision
Cu exposure detection under development
Package: leaded, leadless, and WLCSP
Carrier tape width: 8 to 32 mm
(auto track width)
Advanced Defect Classication (ADC)
SEMI standard with SECS/GEM interface
Option: real-time data feeding to MES
and eSPC
Option: auto email alert (defect/batch
summary)
Inspection items
Marking defects: Unclear mark (faded
character). Shift mark (misaligned
marking). Incomplete mark. Double mark
(multiple character). Vertical mark (wrong
orientation). No mark. Mixed marking
Moulded Package defects: Bubbles/
bulge. Voids/pin holes. Crack. Broken body.
Chipping Scratch. Unmoulded. Incomplete
ll. Foreign material
Lead Package defects: Mould ash
on/along lead. Foreign material and
contamination. Exposed wire/clip. Ejector
mark. Visible wire Solder bridging. Bent
lead/lead angle. Lead sweep. Lead length.
Lead spacing/span. Lead cuts/depressions/
damage. Lead burr. Missing lead. Lead
length. Incomplete lead forming. Metal burr
Taping defects: Loose/unseal cover tape.
Cover tape misalignment. Damaged/
contamination cover tape. Deformed/
damaged cavity. Damaged bottom tape.
Chipped/broken body. Mixed product. Edge
sealing. Unseal tape. Oset sealing.
Cover tape tearing. Product tilting
PHIXEL IHW - POST-SEAL IN-TAPE INSPECTION
OPTICAL INSPECTION
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NIJMEGEN
Jonkerbosplein 52
6534 AB Nijmegen
The Netherlands
HONG KONG
Unit HL-G01 G/F, Building
22E, Phase 3, Hong Kong
Science Park, Pak Shek
Kok, Shatin, Hong Kong
The iconic FiftyTwoDegrees building, which stands
next to the Novio Tech Campus in Nijmegen is the
headquarters of ITEC. This eectively takes the company
back to its roots where the rst diodes were created in
1953. Besides our headquarters in Nijmegen, ITEC has
an oce in Hong Kong for supply chain management
and customer support. We also have representatives
in multiple countries.
Global solutions,
local support
Would you like to talk to one of our specialists and
discover how our solutions can help your business?
Get in touch: info@ITECequipment.com
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© 2023 ITEC
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prohibited without the prior written consent of the copyright
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consequence of its use. Publication thereof does not convey
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intellectual property rights.
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