Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第10页
P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 9 Depletion Field Effect Transistor Unguarded Tests Voltage Range: 0 to 10 V Default Voltage: 0.1 V On Resistance Range Accuracy 5 – 500 ±1.5%* * Plus s…

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Unguarded Tests (using DMC on ASRU-N)
Source Voltage: 0.1 VAC
Quality Factor: ω 1.0
Range
Measurement Type
Accuracy
5 µH – 50 mH
4-wire
±2.0%*
50 mH – 1.59 H
2-wire
±2.0%
1.59 H – 10 H
2-wire (using ED options)
±2.0%
10 H – 100 H
2-wire (using ED options)
±3.0%
* Plus system residual: 1 µH. 100k and 200k test frequencies are available when using DMC on the ASRU-N card.
Guarded Tests
Source Voltage: 0.1 VAC
Test Frequency: 8192 Hz
Dissipation Factor: 1.64
Value
Measurement Type
Accuracy
10 mH
6-wire (using ED and EN options)
±5.0%
Guard sense lines are not supported in tests using DMC on the ASRU-N card. Tests using source and detector sense lines are allowed
Diode
Unguarded Tests
Default Current: 1 mA
Programmable Range: Up to 100 mA
Range
Measurement Type
Accuracy
± 0V – 19 V
±(1.0% of reading + 4 mV)*
± 0V–19 V
* Plus system residual: 3.5 mV/mA
Zener Diode
Unguarded Tests
Default Current: 1 mA
Programmable Range: Up to 100 mA
Range
Accuracy
± 0V – 18 V
±(1.0% of reading + 4 mV)*
* Plus system residual: 3.5 mV/mA
High Voltage Zener
Default Current: 1 mA to 5 mA
Programmable Range: Up to 50 mA
Range
Accuracy
18V – 60 V
± 3.0% of reading
* Test is executed in pre-powered mode.
Bipolar Transistor (Beta Test)
Unguarded Tests
Programmable DC Emitter Bias
Current Range: 100 µA to 100 mA
Beta Range
Accuracy
10 – 1000
±15%

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Depletion Field Effect Transistor
Unguarded Tests
Voltage Range: 0 to 10 V
Default Voltage: 0.1 V
On Resistance Range
Accuracy
5 – 500
±1.5%*
* Plus system residual: 3.5
Fuse, Switch, and Jumper
Unguarded Tests
Default Voltage: 0.1 V
On Resistance Range
Accuracy
0.1 – 500
±1.5%
1.0 – 500
±1.0% (ASRU-N DMC)
* Plus system residual: 3.5
Vectorless Test EP
Source Voltage: 200 mV
Test Frequency: 8192 Hz
Parameter
Specification
Correlate Capacitance
Programmable Low Threshold
1 – 1000
0.5 fF – 750 pF
Programmable High Threshold
1 – 1000
0.5 fF – 750 pF
Programming Resolution
1
0.5 fF – 2 fF
Test Speed (typical)
500 pins per second
Polarity Check
Source Voltage: 200 mV
Parameter
Specification*
Test Range (total parallel capacitance)
up to 2000 µF
Test Range (stand-alone capacitance)
up to 4000 µF
Test Speed
10–15 capacitors per second (typical)
* Range varies with types of packaging used for capacitors.

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Powered / Functional Test Measurement Specification
Built-in Instruments
Universal Source (Four Quadrant)
Programmable Current Limit: 30 mA or 150 mA
Programmable Termination: 5, 50, 500, or 5,000
Output Resistance: 2.2
Application
Characteristic
DC Voltage Source
Four Quadrant and Auto-ranging
Range
Programming Resolution
Accuracy
±0.1 V
50 V
± 0.1% ± 3 mV
±10 V
5 mV
± 0.1% ± 10 mV
Functional Generator
Sine Wave
Distortion (THD): < 1%
Range
Programming Resolution
Accuracy
±7.071 Vrms
1
5 mV (Mux)
2 mV (UnMux)
± 2.0% ± 5 mVAC
Square Wave
Rise Time (10%–90% of 0–5 V): 2.5 µs (typical)
Range
Programming Resolution
Accuracy
± 0–10 V
1
5 mV
± 2.0% ± 5 mVAC
Triangle Wave
Linearity (10%–90%): 2% (typical)
Range
Programming Resolution
Accuracy
± 0–10 V
1
5 mV
± 3.0% ± 5 mVAC
Frequency
Range
Resolution
Accuracy
1–20 kHz
1 Hz
±0.015%
Jitter
2
Sine Wave
Square Wave
Triangle Wave
0.25 µs
2.2 µs
0.25 µs
DC Offset Voltage
Range
Accuracy
± 0–10 V
1
±15 mV
Arbitrary Waveform Generator
1–1024 samples
4096 samples
3 dB bandwidth
Frequency Range
1–32,768 Hz
1–8,192 Hz
120 kHz
Voltage Range
−10.0 to 10.0 V
−10.0 to 10.0 V
1. Peaks of waveform plus programmed offset must be between ±10 V.
2. Maximum edge to edge.
Auxiliary DC Voltage Source (Four Quadrant)
Programmable Current Limit: 30 mA or 150 mA
Output Resistance: 2.2
Range
Programming Resolution
Accuracy
±10 V
5 mV
± 0.1% ± 10 mV
Differential Detector DC
DC Voltage Detection
Characteristic
Specification
Resolution
16 bits (15 bits plus sign), < 0.005% of range
Converter
Integrator for noise rejection.
Converter Speeds
Normal
500 µs integration (high-frequency noise rejection)