Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第6页

P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 5 Optional System Access ories and Soft ware HybridPlus-DD cards (144 nodes, 16 D/R) Yes No AnalogPlus-DD cards (144 nodes, 0 D/R) Yes No HybridPlus-DD card…

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Receive edge placement accuracy (any
receiver):
±5 ns (typical)
Receive voltage accuracy
2.2 mV (typical) programming
resolution
±100 mV
Pattern rate
6.25, 12.5. 20 million/second
ASIC test length no reload
> 4M vectors (typical)
Boundary-scan test length no reload
> 4.8M vectors (typical)
RAM test length no reload
> 64M vectors (typical)
ROM test length no reload
> 256M vectors (typical)
Clocks
Sync to Clock
625 kHz to 50 MHz
160 kHz to 80 MHz
Standard Peripherals
PC Controller
Windows 10 64-bit
Guided hand-held probe
Yes
Repair ticket printer
Yes
Standard System Software / Features
Board Test Insight
Yes
Board Consultant
Yes
Fixture Consultant
Yes
Test Consultant
Yes
IPG-II Analog Program Generator
Yes
Pushbutton Debug
Yes
Automatic 6-wire analog in-circuit tests
Yes
Automatic digital test generation
Yes
Safeguard ICT analysis
Yes
Automatic global digital disable
Yes
Device test libraries
Yes
Multiple Board Versions
Yes
Long and Short-wire Fixturing Technology
Yes
Dual-well Fixturing Technology
Yes
Vectorless Test EP/intelligent Vectorless
Test EP
Yes
Connect Check
Yes
Boundary-scan (IEEE 1149.1)
Yes
PanelTest
Yes
Throughput Multiplier
Yes
Polarity Check Technology
Yes
Access Consultant
Yes
Board Test Grader
Yes
Coverage Analyst
Yes
Data Log Converter
Yes
Pushbutton Q-STATS
Yes
System Confirmation / Diagnostics
Yes
i3070 Software
Yes
Datalogging
Yes
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Optional System Accessories and Software
HybridPlus-DD cards (144 nodes, 16 D/R)
Yes
AnalogPlus-DD cards (144 nodes, 0 D/R)
Yes
HybridPlus-DD cards (144 nodes, 144 D/R)
No
AccessPlus card
Yes
Utility card
Yes
Barcode Reader 1
Yes
Pin Verification Fixture
Yes
Programmable DUT Power Supply
Yes
Advanced Throughput Multiplier
Yes
Drive Thru Test
Yes
InterconnectPlus Boundary-scan
(IEEE 1149.1 and 1149.6)
Yes
Automated Silicon Nails
Yes
Cover-Extend Technology
Yes
Flash70 Software
Yes
In-System Programming
(Flash ISP and PLD ISP)
Yes
nanoVTEP hardware
Yes
External Device Link Library
Yes
Additional Test Development 2
Yes
1. For i3070 Inline System only
2. Additional licenses are inexpensively gained by purchasing the i3070 development software for installation on individual PCs.
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Unpowered / Analog In-Circuit Test Measurement Specification
Shorts and Opens
Source Impedance: 100
Parameter
Specification
Programmable Threshold Range
Short
2–1000
Open
2–1000
Programming Resolution
1.0
Accuracy
±(0.25% + 2.2 )
Programmable Settling Time
Minimum
0 µs
Maximum
3.2768 s
Default
50 µs
Programming Resolution
50 µs
Test Voltage
0.1 V DC
Resistor / Potentiometer
Unguarded Tests
Source Voltage: 0.1 VDC
Range
Measurement Type
Accuracy
0.1 –10
4-wire (using ED, EN, & OXT options)
±1.5%
10 – 300
4-wire (using ED, EN, & OXT options)
±1.0%
300 – 10 k
4-wire (using ED, EN, & OXT options)
2-wire
±0.25%
±1.0%*
10 k– 100 k
2-wire (using ED, EN, & OXT options)
2-wire
±0.25%
±1.0%
100 k – 1 M
2-wire (using ED, EN, & OXT options)
2-wire
2-wire
±0.5% ±2.5%
1.0 M – 10 M
2-wire (using ED, EN, & OXT options)
±5.0%
* Plus system residual 3.5
Unguarded Tests (Using DMC on ASRU-N)
Source Voltage: 0.1 VDC
Range
Measurement Type
Accuracy
1 – 300
4-wire (using ED option)
±1.0%
300 – 10 k
4-wire (using ED option)
2-wire
±0.25%
±1.0%*
10 k– 100 k
2-wire (using ED option)
2-wire
±0.25%
±1.0%
100 k– 1 M
2-wire (using ED option)
2-wire
±0.5%
±2.5%
1.0 M– 10 M
2-wire (using ED option)
±5.0%
* Plus system residual 3.5