Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第14页

P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 13 External Functional Test Instrument s Functional Test Access por t Parameter Specification Characteristic Impedance 5 0  (typical) Minimum DC Insulation…

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Frequency Range
Accuracy *
Normal Mode
10–50 Hz
± (4% of reading + 0.02% of range + 100 µV)
50–300 Hz
± (1% of reading + 0.02% of range + 100 µV)
300 Hz–3 kHz
± (0.2% of reading + 0.02% of range + 100 µV)
3–10 kHz
± (2% of reading + 0.02% of range + 600 µV)
10–19 kHz
± (5% of reading + 0.02% of range + 600 µV)
Fast Mode
50–200 Hz
± (7% of reading + 0.02% of range + 100 µV)
200–400 Hz
± (2% of reading + 0.02% of range + 100 mV)
400 Hz–5 kHz
± (1% of reading + 0.02% of range + 100 µV)
5–10 kHz
± (2% of reading + 0.02% of range + 600 µV)
10–19 kHz
± (5% of reading + 0.02% of range + 600 µV)
* Add 0.12% of reading for attenuated ranges (> 7.07 VAC); see DC voltage detection specifications for impedance of each voltage range.
Waveform Digitizer
Parameter
Specification
Interval between samples
25 µs–51.2 ms
Number of samples
1–8192
Settling time
25 µs
Noise
0.2% of range + 10 mV
Frequency/Time Interval Counter
The frequency/time interval counter has two input channels (Channel A and Channel B) and an external-
internal arming trigger which can be switched to any clock receiver pin on the Control card, Hybrid-144
Non-multiplexed, or HybridPlus-DD card to perform time interval, pulse width, and frequency
measurements.
Input Voltage Range: 0 to 4.875 V (Hybrid-144 pin card)
-3.5 to 5.0 V (Hybrid-DD pin card)
Measurement
Specification
Range
Accuracy *
Time Interval
100 ns–1 sec
± (10 ns + 0.01% + 2 x trigger error)
Pulse Width
25 ns–1 sec
± (5 ns + 0.01% + 2 x trigger error)
Positive or negative slope
Range
Threshold Accuracy *
Frequency
1 Hz–20 MHz
± 0.1 V on any pin card
Positive or negative slope
2 Hz–60 MHz
TTL level on Control card clock receivers
Positive or negative slope
Minimum Gate Delay
Resolution
Accuracy
0.5 ms
0.02%
0.03%
100 ms
0.0001%
0.01%
* Input signals to tester must have a slew rate 100 V/µs in 0.2 to 3.5 V range. Trigger error = 80 mV/(input signal slew rate).
Power Monitoring Circuit (PMC)
Parameter
Specification
Channels per ASRU card
3
Voltage limit range
1.0 to 50 V
Recommended voltage limit range
1.8 to 50 V
Accuracy
1.22% of reading
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External Functional Test Instruments
Functional Test Access port
Parameter
Specification
Characteristic Impedance
50 (typical)
Minimum DC Insulation Resistance
1 M
Maximum Voltage
±100 V peak (port to system ground)
Maximum Current
±500 mA peak per port
Maximum Power
7.5 VA per port
Minimum DC Insulation Resistance
10 M
Total Capacitance
< 900 pF port to ground
3 dB Bandwidth
12 MHz (typical) to and from any HybridPlus-DD pin
Crosstalk at 1 MHz
< −45 dB (50 source and load)
* External instruments can trigger frequency, pulse width, and time interval measurements.
Digital In-circuit Test and Functional Test
Edge Placement Accuracy
Parameter
Specification
Mux Systems
(1)
EPA Internally Referenced
±5 ns typical, ±10 ns warranted
EPA Externally Referenced
±7 ns typical, ±15 ns warranted
UnMux Systems
(2)
EPA Internally Referenced
±15 ns typical, ±20 ns warranted
EPA Externally Referenced
±17 ns typical, ±24 ns warranted
1. Drivers are programmed for 0.2–3.5 V and a 225 V/µs slew rate into 100 non high impedance state and measured at 1.5 V. Receivers are programmed to 1.5 V,
325 kHz DUT 20 MHz. Input signals to tester must have a slew rate 225 V/µs.
2. Drivers are programmed to 3.5 V into 100 non high impedance state and measured at 1.5 V. Receivers are programmed to 1.5 V, 325 kHz DUT 20 MHz. Input
signals to tester must have a slew rate 225 V/µs.
Pattern Rate
Parameter
Specification
Mux Systems (1)
Minimum Pattern Rate
330/sec
Maximum Pattern Rate
6.25 M/sec, 12.5 M/sec, or 20 M/sec
UnMux Systems (2)
Minimum Pattern Rate
330/sec
Maximum Pattern Rate
6.25 M/sec
1. Drivers are programmed for 0.2–3.5 V and a 225 V/µs slew rate into 100 non high impedance state and measured at 1.5 V. Receivers are programmed to 1.5 V,
325 kHz DUT clock of 20 MHz. Input signals to tester must have a slew rate of 225 V/µs.
2. Drivers have fixed rise and fall times of approximately 15 ns.
Guide Probe
Parameter
Specification
Programmable Receiver
Voltage Range
Low Threshold
−
3.5 to 5.0 V
High Threshold
−
3.5 to 5.0 V
Programming Resolution
5.25 mV
Accuracy
±150 mV
Maximum Input Voltage
±12 V
Bandwidth (using ground clip)
50 MHz
Input Resistance
20 k
Input Capacitance
10 pF
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Additional Digital Specifications
Module Control Card
High-speed Clocks and Clock Receivers
TTL Compatible Input and Output
Parameter
Specification
Number of Clock Drivers/Control Card
1
Clock Driver Multiplex Ratio
2:1
Clock Driver Frequency Range
Minimum
625 kHz
Maximum
50 MHz
Resolution
1
± 1% of frequency
Number of Clock Receivers/Control Card
2
Clock Receiver Frequency
Minimum
160 kHz
Maximum
80 MHz
1. Add ± 1 ns for periods over 100 ns.
Even Triggers
Parameter
Specification
Number of Triggers/ Control Card
3
Trigger Multiplex Ratio
2:1
Start-up Delay
550 ns (11 events)
Number of Triggers/ Control Card
3
Minimum Pattern Rate
330/sec
Capture Ram
Parameter
Specification
Serial Capture RAM depth
1,048,576 (1 Mb)
General-Purpose Relays
Parameter
Specification
Number of General-Purpose Relays/Control Card
8
Maximum Voltage to Earth
±100 V peak
Maximum Switching Voltage
100 V peak
Maximum Switching Power
30 W
Maximum Switching Current
750 mA
Maximum Carry Current
750 mA
General-Purpose Relay Resistance
60 m
Switching Time (typical)
50 ms
Debug Ports
Output Voltage: TTL levels
Parameter
Specification*
Clock Port
Sequencer or event clock
Data Port
Buffered data from a receiver
Synchronization Port
Sync pulses added in digital test debug
* Systematic delay is typically 100–200 ns