Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第7页

P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 6 Unpowered / Analog In-Circuit Test Measurement Specification Shorts and Opens Source Impedance: 100  Parameter Specification Programmable Threshold Range…

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Optional System Accessories and Software
HybridPlus-DD cards (144 nodes, 16 D/R)
Yes
AnalogPlus-DD cards (144 nodes, 0 D/R)
Yes
HybridPlus-DD cards (144 nodes, 144 D/R)
No
AccessPlus card
Yes
Utility card
Yes
Barcode Reader 1
Yes
Pin Verification Fixture
Yes
Programmable DUT Power Supply
Yes
Advanced Throughput Multiplier
Yes
Drive Thru Test
Yes
InterconnectPlus Boundary-scan
(IEEE 1149.1 and 1149.6)
Yes
Automated Silicon Nails
Yes
Cover-Extend Technology
Yes
Flash70 Software
Yes
In-System Programming
(Flash ISP and PLD ISP)
Yes
nanoVTEP hardware
Yes
External Device Link Library
Yes
Additional Test Development 2
Yes
1. For i3070 Inline System only
2. Additional licenses are inexpensively gained by purchasing the i3070 development software for installation on individual PCs.
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Unpowered / Analog In-Circuit Test Measurement Specification
Shorts and Opens
Source Impedance: 100
Parameter
Specification
Programmable Threshold Range
Short
2–1000
Open
2–1000
Programming Resolution
1.0
Accuracy
±(0.25% + 2.2 )
Programmable Settling Time
Minimum
0 µs
Maximum
3.2768 s
Default
50 µs
Programming Resolution
50 µs
Test Voltage
0.1 V DC
Resistor / Potentiometer
Unguarded Tests
Source Voltage: 0.1 VDC
Range
Measurement Type
Accuracy
0.1 –10
4-wire (using ED, EN, & OXT options)
±1.5%
10 – 300
4-wire (using ED, EN, & OXT options)
±1.0%
300 – 10 k
4-wire (using ED, EN, & OXT options)
2-wire
±0.25%
±1.0%*
10 k– 100 k
2-wire (using ED, EN, & OXT options)
2-wire
±0.25%
±1.0%
100 k – 1 M
2-wire (using ED, EN, & OXT options)
2-wire
2-wire
±0.5% ±2.5%
1.0 M – 10 M
2-wire (using ED, EN, & OXT options)
±5.0%
* Plus system residual 3.5
Unguarded Tests (Using DMC on ASRU-N)
Source Voltage: 0.1 VDC
Range
Measurement Type
Accuracy
1 – 300
4-wire (using ED option)
±1.0%
300 – 10 k
4-wire (using ED option)
2-wire
±0.25%
±1.0%*
10 k– 100 k
2-wire (using ED option)
2-wire
±0.25%
±1.0%
100 k– 1 M
2-wire (using ED option)
2-wire
±0.5%
±2.5%
1.0 M– 10 M
2-wire (using ED option)
±5.0%
* Plus system residual 3.5
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High Guard Ratio Tests
Range
Measurement Type
Accuracy
10 k
6-wire (using ED, EN, & OXT options)
(Source Voltage: 1.0 VDC)
(Guard Ratio: 1000 to 1 on both legs of guard circuit)
±2.5%
100 k
6-wire (using ED, EN, & OXT options)
(Source Voltage: 0.1 VDC)
(Guard Ratio: 1,000,000 to 1)
±1.0% (typ)
* High/Ultra-High guard ratio is not supported in tests using DMC on the ASRU-N card
Capacitor
Unguarded Tests
Source Voltage: 0.1 VAC
Dissipation Factor: 1.0
Range
Measurement Type
Accuracy
10 pF – 0.5 µF
2-wire (using ED & OXT options)
±2.0%*
0.5 µF – 10,000 µF
4-wire (using ED, EN, & OXT options)
±2.0%
* Plus system residual: ±1 pF with capacitor compensation, 0 to +40 pF typical without capacitor compensation.
Unguarded Tests (using DMC on ASRU-N)
Source Voltage: 0.1 VAC
Dissipation Factor: 1.0
Range
Measurement Type
Accuracy
10 pF – 0.5 µF
2-wire (using ED option)
±2.0%*
0.5 µF – 100 µF
4-wire (using ED option)
±2.0%
* Plus system residual: ±2.5 pF with capacitor compensation, 0 to +40 pF typical without capacitor compensation.
100k and 200k test frequencies are available when using DMC on the ASRU-N card.
Guarded Tests
Source Voltage: 0.1 VAC
Test Frequency: 1024 Hz
Dissipation Factor: 1.0
Guard Ratio: 1000 to 1 on both legs of guard circuit
Value
Measurement Type
Accuracy
1000 pF
6-wire (using ED, EN, & OXT options)
±6.0%
* Guard sense lines are not supported in tests using DMC on the ASRU-N card. Tests using source and detector sense lines are allowed.
Inductor
Unguarded Tests
Source Voltage: 0.1 VAC
Quality Factor: ω 1.0
Range
Measurement Type
Accuracy
5 µH – 50 mH
4-wire (using EN option)
±2.0%*
50 mH – 1.59 H
2-wire (using EN option)
±2.0%
1.59 H – 10 H
2-wire (using ED and EN options)
±2.0%
10 H – 100 H
2-wire (using ED and EN options)
±3.0%
* Plus system residual: 1 µH.