Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第4页
P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 3 i3070 Series 6 System Summary Mux System UnMux System Full System Node Capabil ity Max Node of E9903G 5184 5184 Max Node of E9902G 2592 2592 Max Node of E…
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Introduction
The Keysight i3070 Series 6 In-Circuit Test (ICT) system is designed to bring industry-
leading in-circuit testing technologies into your Printed Circuit Board Assembly (PCBA)
manufacturing. This system is Industrial 4.0 ready and caters to in-circuit testing for a
wide range of PCBA sizes and applications such as Internet of Things, 5G
Communication, Automotive and Energy.
With a unique fixture design, i3070 offers the shortest signal path between measurement
circuitry and devices under test, this principle is the key to minimize undesired effects
from parasitic capacitance, improved immunity to crosstalk, and eliminate stray signal
coupling effects for a more consistent and repeatable measurement result.
i3070 Series 6 Family
i3070 Series 6 family offers a specific test capability that can be expanded in both
hardware and software capabilities to meet your future growth needs in your
manufacturing.
i3070 Series 6 family
Max Nodes
Foot Print
E9903G
5184
Width 1490 mm (58.66 in)
Depth 935 mm (36.81 in)
Height 887 mm (34.92 in)
E9902G
2592
Width 1490 mm (58.66 in)
Depth 935 mm (36.81 in)
Height 887 mm (34.92 in)
E9905G
2592
Width 954 mm (37.56 in)
Depth 935 mm (36.81 in)
Height 887 mm (34.92 in)
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i3070 Series 6 System Summary
Mux System
UnMux System
Full System Node Capability
Max Node of E9903G
5184
5184
Max Node of E9902G
2592
2592
Max Node of E9905G
2592
2592
Full System Analog Capability
Shorts test programmable threshold
2 Ω to 1000
2 Ω to 1000
Resistance, Potentiometer measurements
0.1 Ω to 10 MΩ
0.1 Ω to 10 MΩ
Capacitance measurements
10 pf to 10 mf
10 pf to 10 mf
Inductance measurements
5 µH to 100 H
5 µH to 100 H
Diode measurements
± 0 V–19V
± 0 V–19V
Zener diode measurements
± 0 V–60V
± 0 V–60V
Transistor measurements (Beta)
10–1000
10–1000
FET measurements (On Resistance)
5 Ω–500 Ω
5 Ω–500 Ω
Fuse, Jumper, Switch measurements
0.1 Ω–500 Ω
0.1 Ω–500 Ω
Arbitrary waveform generator
1 Hz to 20 kHz
1 Hz to 20 kHz
Waveform digitizer
40k samples/sec, 8192 samples
Function generator (DC,
Sine, Square, and Triangle)
0 to ±10 V,
0.5 Hz to 20 kHz
0 to ±10 V,
0.5 Hz to 20 kHz
Auxiliary DC voltage source
0 to ±10 V; 30 or 150mA
0 to ±10 V; 30 or 150mA
DC detector
0 to 160 V
0 to 160 V
Universal counter: frequency, pulse, and time
interval measurements
1 Hz to 60 MHz; 30 ns to 1s
1 Hz to 60 MHz; 30 ns to 1s
Analog functional test access ports
E9903G:
8
E9903G:
8
E9902G
4
E9902G
4
E9905G
4
E9905G
4
Full System Digital Capability
Max Drive and Receive channels
E9903G:
576
E9903G:
5184
E9902G
288
E9902G
2592
E9905G
288
E9905G
2592
Pin-by-pin programmable drive and receive
resources
1 ns programming resolution
3.5 to +5.0 V logic levels 25 to
250 V/µs slew rate in 25 V/µs
steps, Pull-up/pull-down
2 ns programming resolution
0 to +5.0 V drive level 0 to
+4.875 V receive level
Pull-up/pull-down or AC
termination loads
Logic analyzer
bit-by-bit, and CRC capture
modes
bit-by-bit, and CRC capture
modes
Drive edge placement accuracy (any driver)
±5 ns (typical) ±700 mA
sourcing, 500 mA sinking
backdrive current
±15 ns (typical) ±750 mA peak,
±100 mA continuous backdrive
current
Drive voltage accuracy
2.206 mV programming
resolution
±100 mV
20 mV programming resolution
± 2% of setting ±20 mV
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Receive edge placement accuracy (any
receiver):
±5 ns (typical)
±15 ns (typical)
Receive voltage accuracy
2.2 mV (typical) programming
resolution
±100 mV
20 mV programming resolution
±2% of setting ± 100 mV
(typical)
Pattern rate
6.25, 12.5. 20 million/second
6.25 million/second
ASIC test length no reload
> 4M vectors (typical)
> 4M vectors (typical)
Boundary-scan test length no reload
> 4.8M vectors (typical)
> 4.8M vectors (typical)
RAM test length no reload
> 64M vectors (typical)
> 64M vectors (typical)
ROM test length no reload
> 256M vectors (typical)
> 256M vectors (typical)
Clocks
Sync to Clock
625 kHz to 50 MHz
160 kHz to 80 MHz
625 kHz to 50 MHz
160 kHz to 80 MHz
Standard Peripherals
PC Controller
Windows 10 64-bit
Windows 10 64-bit
Guided hand-held probe
Yes
Yes
Repair ticket printer
Yes
Yes
Standard System Software / Features
Board Test Insight
Yes
Yes
Board Consultant
Yes
No
Fixture Consultant
Yes
No
Test Consultant
Yes
No
IPG-II Analog Program Generator
Yes
Yes
Pushbutton Debug
Yes
Yes
Automatic 6-wire analog in-circuit tests
Yes
Yes
Automatic digital test generation
Yes
Yes
Safeguard ICT analysis
Yes
Yes
Automatic global digital disable
Yes
Yes
Device test libraries
Yes
Yes
Multiple Board Versions
Yes
Yes
Long and Short-wire Fixturing Technology
Yes
Yes
Dual-well Fixturing Technology
Yes
Yes
Vectorless Test EP/intelligent Vectorless
Test EP
Yes
Yes
Connect Check
Yes
Yes
Boundary-scan (IEEE 1149.1)
Yes
Yes
PanelTest
Yes
Yes
Throughput Multiplier
Yes
Yes
Polarity Check Technology
Yes
Yes
Access Consultant
Yes
Yes
Board Test Grader
Yes
Yes
Coverage Analyst
Yes
Yes
Data Log Converter
Yes
Yes
Pushbutton Q-STATS
Yes
Yes
System Confirmation / Diagnostics
Yes
Yes
i3070 Software
Yes
Yes
Datalogging
Yes
Yes