Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第5页

P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 4 Receive edge placement accura cy (any receiver): ±5 ns (typical) ±15 ns (typical) Receive voltage accuracy 2.2 mV (typical) programming resolution ± 100 m…

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i3070 Series 6 System Summary
Mux System
Full System Node Capability
Max Node of E9903G
5184
Max Node of E9902G
2592
Max Node of E9905G
2592
Full System Analog Capability
Shorts test programmable threshold
2 Ω to 1000
Resistance, Potentiometer measurements
0.1 Ω to 10 MΩ
Capacitance measurements
10 pf to 10 mf
Inductance measurements
5 µH to 100 H
Diode measurements
± 0 V19V
Zener diode measurements
± 0 V60V
Transistor measurements (Beta)
101000
FET measurements (On Resistance)
5 Ω–500 Ω
Fuse, Jumper, Switch measurements
0.1 Ω–500 Ω
Arbitrary waveform generator
1 Hz to 20 kHz
Waveform digitizer
40k samples/sec, 8192 samples
Function generator (DC,
Sine, Square, and Triangle)
0 to ±10 V,
0.5 Hz to 20 kHz
Auxiliary DC voltage source
0 to ±10 V; 30 or 150mA
DC detector
0 to 160 V
Universal counter: frequency, pulse, and time
interval measurements
1 Hz to 60 MHz; 30 ns to 1s
Analog functional test access ports
E9903G:
8
E9903G:
8
E9902G
4
E9902G
4
E9905G
4
E9905G
4
Full System Digital Capability
Max Drive and Receive channels
E9903G:
576
E9903G:
5184
E9902G
288
E9902G
2592
E9905G
288
E9905G
2592
Pin-by-pin programmable drive and receive
resources
1 ns programming resolution
3.5 to +5.0 V logic levels 25 to
250 V/µs slew rate in 25 V/µs
steps, Pull-up/pull-down
Logic analyzer
bit-by-bit, and CRC capture
modes
Drive edge placement accuracy (any driver)
±5 ns (typical) ±700 mA
sourcing, 500 mA sinking
backdrive current
Drive voltage accuracy
2.206 mV programming
resolution
±100 mV
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Receive edge placement accuracy (any
receiver):
±5 ns (typical)
Receive voltage accuracy
2.2 mV (typical) programming
resolution
±100 mV
Pattern rate
6.25, 12.5. 20 million/second
ASIC test length no reload
> 4M vectors (typical)
Boundary-scan test length no reload
> 4.8M vectors (typical)
RAM test length no reload
> 64M vectors (typical)
ROM test length no reload
> 256M vectors (typical)
Clocks
Sync to Clock
625 kHz to 50 MHz
160 kHz to 80 MHz
Standard Peripherals
PC Controller
Windows 10 64-bit
Guided hand-held probe
Yes
Repair ticket printer
Yes
Standard System Software / Features
Board Test Insight
Yes
Board Consultant
Yes
Fixture Consultant
Yes
Test Consultant
Yes
IPG-II Analog Program Generator
Yes
Pushbutton Debug
Yes
Automatic 6-wire analog in-circuit tests
Yes
Automatic digital test generation
Yes
Safeguard ICT analysis
Yes
Automatic global digital disable
Yes
Device test libraries
Yes
Multiple Board Versions
Yes
Long and Short-wire Fixturing Technology
Yes
Dual-well Fixturing Technology
Yes
Vectorless Test EP/intelligent Vectorless
Test EP
Yes
Connect Check
Yes
Boundary-scan (IEEE 1149.1)
Yes
PanelTest
Yes
Throughput Multiplier
Yes
Polarity Check Technology
Yes
Access Consultant
Yes
Board Test Grader
Yes
Coverage Analyst
Yes
Data Log Converter
Yes
Pushbutton Q-STATS
Yes
System Confirmation / Diagnostics
Yes
i3070 Software
Yes
Datalogging
Yes
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Optional System Accessories and Software
HybridPlus-DD cards (144 nodes, 16 D/R)
Yes
AnalogPlus-DD cards (144 nodes, 0 D/R)
Yes
HybridPlus-DD cards (144 nodes, 144 D/R)
No
AccessPlus card
Yes
Utility card
Yes
Barcode Reader 1
Yes
Pin Verification Fixture
Yes
Programmable DUT Power Supply
Yes
Advanced Throughput Multiplier
Yes
Drive Thru Test
Yes
InterconnectPlus Boundary-scan
(IEEE 1149.1 and 1149.6)
Yes
Automated Silicon Nails
Yes
Cover-Extend Technology
Yes
Flash70 Software
Yes
In-System Programming
(Flash ISP and PLD ISP)
Yes
nanoVTEP hardware
Yes
External Device Link Library
Yes
Additional Test Development 2
Yes
1. For i3070 Inline System only
2. Additional licenses are inexpensively gained by purchasing the i3070 development software for installation on individual PCs.