Alltest-Agilent-Keysight-E9902G-Datasheet-29440-.pdf.pdf - 第9页
P a g e F i n d u s a t w w w . k e y s i g h t . c o m P a g e 8 Unguarded Tests (using DMC on ASR U- N) Source Voltage: 0.1 V AC Quality Factor: ω 1.0 Range Measurement Type Accuracy 5 µH – 50 mH 4-wire ±2.0%* 50 mH – …
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High Guard Ratio Tests
Range
Measurement Type
Accuracy
10 k
6-wire (using ED, EN, & OXT options)
(Source Voltage: 1.0 VDC)
(Guard Ratio: 1000 to 1 on both legs of guard circuit)
±2.5%
100 k
6-wire (using ED, EN, & OXT options)
(Source Voltage: 0.1 VDC)
(Guard Ratio: 1,000,000 to 1)
±1.0% (typ)
* High/Ultra-High guard ratio is not supported in tests using DMC on the ASRU-N card
Capacitor
Unguarded Tests
Source Voltage: 0.1 VAC
Dissipation Factor: 1.0
Range
Measurement Type
Accuracy
10 pF – 0.5 µF
2-wire (using ED & OXT options)
±2.0%*
0.5 µF – 10,000 µF
4-wire (using ED, EN, & OXT options)
±2.0%
* Plus system residual: ±1 pF with capacitor compensation, 0 to +40 pF typical without capacitor compensation.
Unguarded Tests (using DMC on ASRU-N)
Source Voltage: 0.1 VAC
Dissipation Factor: 1.0
Range
Measurement Type
Accuracy
10 pF – 0.5 µF
2-wire (using ED option)
±2.0%*
0.5 µF – 100 µF
4-wire (using ED option)
±2.0%
* Plus system residual: ±2.5 pF with capacitor compensation, 0 to +40 pF typical without capacitor compensation.
100k and 200k test frequencies are available when using DMC on the ASRU-N card.
Guarded Tests
Source Voltage: 0.1 VAC
Test Frequency: 1024 Hz
Dissipation Factor: 1.0
Guard Ratio: 1000 to 1 on both legs of guard circuit
Value
Measurement Type
Accuracy
1000 pF
6-wire (using ED, EN, & OXT options)
±6.0%
* Guard sense lines are not supported in tests using DMC on the ASRU-N card. Tests using source and detector sense lines are allowed.
Inductor
Unguarded Tests
Source Voltage: 0.1 VAC
Quality Factor: ω 1.0
Range
Measurement Type
Accuracy
5 µH – 50 mH
4-wire (using EN option)
±2.0%*
50 mH – 1.59 H
2-wire (using EN option)
±2.0%
1.59 H – 10 H
2-wire (using ED and EN options)
±2.0%
10 H – 100 H
2-wire (using ED and EN options)
±3.0%
* Plus system residual: 1 µH.
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Unguarded Tests (using DMC on ASRU-N)
Source Voltage: 0.1 VAC
Quality Factor: ω 1.0
Range
Measurement Type
Accuracy
5 µH – 50 mH
4-wire
±2.0%*
50 mH – 1.59 H
2-wire
±2.0%
1.59 H – 10 H
2-wire (using ED options)
±2.0%
10 H – 100 H
2-wire (using ED options)
±3.0%
* Plus system residual: 1 µH. 100k and 200k test frequencies are available when using DMC on the ASRU-N card.
Guarded Tests
Source Voltage: 0.1 VAC
Test Frequency: 8192 Hz
Dissipation Factor: 1.64
Value
Measurement Type
Accuracy
10 mH
6-wire (using ED and EN options)
±5.0%
Guard sense lines are not supported in tests using DMC on the ASRU-N card. Tests using source and detector sense lines are allowed
Diode
Unguarded Tests
Default Current: 1 mA
Programmable Range: Up to 100 mA
Range
Measurement Type
Accuracy
± 0V – 19 V
±(1.0% of reading + 4 mV)*
± 0V–19 V
* Plus system residual: 3.5 mV/mA
Zener Diode
Unguarded Tests
Default Current: 1 mA
Programmable Range: Up to 100 mA
Range
Accuracy
± 0V – 18 V
±(1.0% of reading + 4 mV)*
* Plus system residual: 3.5 mV/mA
High Voltage Zener
Default Current: 1 mA to 5 mA
Programmable Range: Up to 50 mA
Range
Accuracy
18V – 60 V
± 3.0% of reading
* Test is executed in pre-powered mode.
Bipolar Transistor (Beta Test)
Unguarded Tests
Programmable DC Emitter Bias
Current Range: 100 µA to 100 mA
Beta Range
Accuracy
10 – 1000
±15%
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Depletion Field Effect Transistor
Unguarded Tests
Voltage Range: 0 to 10 V
Default Voltage: 0.1 V
On Resistance Range
Accuracy
5 – 500
±1.5%*
* Plus system residual: 3.5
Fuse, Switch, and Jumper
Unguarded Tests
Default Voltage: 0.1 V
On Resistance Range
Accuracy
0.1 – 500
±1.5%
1.0 – 500
±1.0% (ASRU-N DMC)
* Plus system residual: 3.5
Vectorless Test EP
Source Voltage: 200 mV
Test Frequency: 8192 Hz
Parameter
Specification
Correlate Capacitance
Programmable Low Threshold
1 – 1000
0.5 fF – 750 pF
Programmable High Threshold
1 – 1000
0.5 fF – 750 pF
Programming Resolution
1
0.5 fF – 2 fF
Test Speed (typical)
500 pins per second
Polarity Check
Source Voltage: 200 mV
Parameter
Specification*
Test Range (total parallel capacitance)
up to 2000 µF
Test Range (stand-alone capacitance)
up to 4000 µF
Test Speed
10–15 capacitors per second (typical)
* Range varies with types of packaging used for capacitors.