QLF08_LaBel.pdf - 第13页
IC and Component Selection for Space Sy stems – Presented by Kenneth A . LaBel 13 Radiation Effects and Reliability • Radiation reliability is viewed differently than a normal reliability (bathtub) consideration – It is …

IC and Component Selection for Space Systems – Presented by Kenneth A. LaBel
12
Reliability “versus” Radiation:
Basic Electronics Reliability
• Reliability of electronics is viewed traditionally using a
“bathtub” curve view of mean time to failure (MTTF)
– This looks at both intrinsic (wearout) and extrinsic (infant
mortality) failure modes
Source: http://www.weibull.com/hotwire/issue21/hottopics21.htm

IC and Component Selection for Space Systems – Presented by Kenneth A. LaBel
13
Radiation Effects and Reliability
• Radiation reliability is viewed differently than a
normal reliability (bathtub) consideration
– It is a mix of a MTTF (or Time to First Failure - TTFF)
condition known as Total Ionizing Dose (TID) or
Displacement Damage (DD) and a Mean Time Between
Failures (MTBF) condition known as Single Event
Effects (SEE).
Time
Increasing failure rate
Dose
Normal
Distribution of
Failures
TTFF
MTTF
TID
Time
Increasing failure rate
Random
Distribution of
Failures
SEE
Spikes in SEE rates
can occur based on
position in orbit
and solar event

IC and Component Selection for Space Systems – Presented by Kenneth A. LaBel
14
Radiation and Traditional IC Reliability:
Are the two related?
• The short answer is yes
– Radiation MTTF conditions can accelerate reliability
wearout mechanisms either by eroding electrical signal
margins or material damage
– Radiation MTBF conditions also can impact long-term
reliability
• A single energetic particle, for example, can cause device
failure instantaneously (such as with a gate rupture) or at a
later time due to material damage.
• The methods of coupling the radiation-induced impacts
into reliability calculations are limited
– NEPP Program has a new effort to explore this coupling on
state-of-the-art commercial Flash memories that are highly
sought by flight programs
Latent damage from a single particle