SYSTEMS-8030277-REV_C.pdf - 第12页
CYBER REPORT SPI SOF TW ARE AOI SOF TW ARE CYBER REPORT CYBER CMM SPI SOF TW ARE AOI SOF TW ARE CYBER CMM CYBER PRINTOPTIMIZER CYBER PRINTOPTIMIZER A ward - Winning A O I Sof t ware F aster , Simpler and Smar ter • Solde…

AOI SYSTEMS
Inspection and Metrology Capabilities
Component Types Inspected
• Standard SMT (chips, J-lead, gull-wing, BGA, etc.), through-hole, odd-form,
clips, connectors, header pins, and more
Solder Joint Defects Categories
• Solder bridge, opens, lifted leads, wettability, excess and insucient solder,
debris, and more
3D Measurement Inspection (MX3000)
• Lifted Lead, package coplanarity, polarity dimple and chamfer identication
Other Items detected
• Gold nger contamination, pin-in-hole, bent pins, debris, OCR/OCV and many
others
Component Measurement Categories
• Component X, Y position and rotation
SIM (Strobe Inspection Module)
2D AOI Sensor Technology - High-speed,
On-the-Fly Inspection
At the core of every MX600 system are two SIMs (Strobed Inspection
Modules) enabling ‘on-the-y’ inspection. The SIM is designed with enhanced
illumination using LED lighting - delivering the best 01005 and solder joint
performance. With an 80 megapixel sensor and higher resolution (12µm), you
get crisp, perfect quality images for accurate defect review.
The system oers in-line multiple module grippers minimize handing tact time,
0402 inspection capability, and S2/S8 compliant.
Memory Module Post-Test Defect
Types, Pre-Shipping Inspection
Inspection capability (2D+3D) includes:
• Components edge
• Damage PCB corner
• Gold nger discolored / burnt / badly scratched
• Gold tab inspection - Lifted tie bar, burnt, contamination
• Physically damaged components

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Award-Winning AOI Software
Faster, Simpler and Smarter
• Solder Ball/ Blob Analysis, Solder Bridge, Insucient Solder, Tombstone
• No shadowing with small components next to tall components, Lifted Lead, Coplanarity, Text Detection
Intuitive, Easy-to-use Software
The multi-award winning SQ3000 AOI software is a more powerful yet
extremely simple software suite designed with an intuitive interface
and multi-touch control with 3D image visualization tools. Ultra-fast
programming capabilities bring the ease-of-use to a completely new
level and signicantly speeds setup, simplies the process, reduces
training eorts and minimizes operator interaction – all saving
time and cost.
AutoProgramming and AI
2
Superior in Programming & Performance - Enabling Smarter, Faster Inspection
Speed programming and tuning with new capabilities including AutoTeach, AutoDene, and AutoTune for faster set-up
and to simplify process.
CyberOptics AI
2
(Autonomous Image Interpretation) technology is all about keeping it simple - no parameters to adjust or
algorithms to tune. And, you do not need to anticipate defects or pre-dene variance either - AI
2
does it all for you. With
AI
2
, you have the power to inspect the most comprehensive list of features and identify the widest variety of defect types
- including those that you least expect. Perfect for those high-mix or low volume applications. With its unique ability to
‘ignore’ bad examples in a model, AI
2
oers precise discrimination even with excessive variance and minimizes eects of
outlier examples. The pixel marking feature highlights defective spots, so you can identify genuine defects instantly.

AOI SYSTEMS
Faster, Highly Accurate Coordinate
Measurement (CMM) Suite
CyberCMM™, a comprehensive software suite of coordinate measurement tools provides highly accurate, 100%
metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity,
distance, height and datum X, Y to name a few.
A fast and easy set-up can be performed with the world’s rst in-line CMM system for programming complex
applications as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments
with traditional coordinate measurement machines (CMMs).
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CyberReport™ - Fast, Scaleable SPC Solution
CyberReport oers full-edged machine-level to factory-level SPC capability with powerful historical analysis and reporting
tools delivering complete traceability for process verication and yield improvement. CyberReport is easy to setup and
simple to use while providing fast charting with a compact database size.
Factory-level SPC
Line-level SPC
Machine-level SPC
Yield
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Sample Report