SYSTEMS-8030277-REV_C.pdf - 第18页

SQ3 000 oers unmat ched ac curacy with the re vol utiona r y MRS technology b y meticu lously ide ntifying and rejecting reections caused by s hin y components. Eective s uppres sion of m ulti ple reections is c riti…

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CyberPrint OPTIMIZER™
Automatically optimizes the print process by proactively analyzing accurate trend data – rst-ever in the industry! Pre-dened
templates help you get started quickly while customizable rules support perfect customization for specic product needs.
With its predictive process improvement capability, you can get better yields and reduce downtime.
SPI SYSTEMS
CYBERREPORT
SPISOFTWARE
AOISOFTWARE
CYBERREPORT
CYBERCMM
SPISOFTWARE
AOISOFTWARE
CYBERCMM
CYBER
PRINTOPTIMIZER
CYBER
PRINTOPTIMIZER
Failure analysis drives line optimization and auto tolerance changes
Defect Correlation
SPI AOI AOI
FAIL
FAIL
FAIL
FAIL
FAIL FAIL
PASS PASS
PASS
CyberReport™ - Fast, Scaleable SPC Solution
CyberReport oers full-edged machine-level to factory-level SPC capability with powerful historical analysis and reporting
tools delivering complete traceability for process verication and yield improvement. CyberReport is easy to setup and
simple to use while providing fast charting with a compact database size.
Factory-level SPC
Line-level SPC
Machine-level SPC
Yield
CYBERREPORT
SPISOFTWARE
AOISOFTWARE
CYBERREPORT
CYBERCMM
SPISOFTWARE
AOISOFTWARE
CYBERCMM
CYBER
PRINTOPTIMIZER
CYBER
PRINTOPTIMIZER
Sample Report
SQ3000 oers unmatched accuracy with the revolutionary MRS technology by meticulously identifying and rejecting reections
caused by shiny components. Eective suppression of multiple reections is critical for true height measurement making MRS an
ideal technology solution for a wide range of applications including those with very high quality requirements.
CyberOptics has advanced the proprietary Multi-Reection Suppression (MRS) sensor to an even ner resolution. The Ultra-High
Resolution MRS sensor enhances the SQ3000 3D CMM platform, delivering superior inspection performance, ideally suited for
socket metrology, machined parts inspection, microelectronics and SMT applications where an even greater degree of accuracy
and inspection reliability is critical.
Fastest - Seconds, not Hours
• Signicantly speeds attaining coordinate
measurements vs. traditional CMMs
• Reduces engineering resource time
Easy-to-use Interface
• Simplies process with award-winning, intuitive, touch
screen experience
• Quick programming for complex applications
• Multi-process capable - AOI, SPI, AOM, CMM
Metrology Grade Accuracy
• Achieve metrology-grade accuracy with MRS-enabled
technology
• Repeatable and reproducible measurements for SMT,
semiconductor, microelectronics and metrology
applications
Coordinate Measurement (CMM)
The World’s First In-Line CMM - Ultimate in Speed and Accuracy for
SMT, Semiconductor, Microelectronics and Metrology Applications
SQ3000™
|
3D CMM
• World’s rst in-line CMM system
• Delivering metrology grade accuracy at
production speed, powered by MRS Technology
Solder Ball and Bump
Industrial/ Machined PartsSocket Metrology
Multiple
MRS Sensor
Options
Faster, Highly Accurate Coordinate
Measurement (CMM) Suite
CyberCMM™, a comprehensive software suite of coordinate
measurement tools provides highly accurate, 100% metrology-
grade measurement on all critical points much faster than a
traditional CMM, including coplanarity, distance, height and
datum X, Y to name a few.
A fast and easy set-up can be performed with the world’s rst
in-line CMM system for programming complex applications
as compared to slow, engineering resource-intensive set-up
that typically requires multiple adjustments with traditional
coordinate measurement machines (CMMs).
CMM SYSTEMS
CYBERREPORT
SPISOFTWARE
AOISOFTWARE
CYBERREPORT
CYBERCMM
SPISOFTWARE
AOISOFTWARE
CYBERCMM
CYBER
PRINTOPTIMIZER
CYBER
PRINTOPTIMIZER
Coordinate Measurement Capability
CyberCMM provides fast and highly accurate with repeatable and reproducible coordinate measurements for SMT,
semiconductor, microelectronics and metrology applications.
• Line / Distance / X,Y / Mid Line
• Inter Point / Regression Shifted
• Datum X,Y / LSF X,Y Oset
• X,Y Oset / Value / Location / List of X,Y Values
• Height / Local Height / Regression / Radius
• Coplanarity / Distance to Plane / 2nd Order Fitting
• Dierence / Absolute / 2sqrt / VC
• Max / Min / Ave / Sigma / Plus / Minus / Multiply