AppX.A_spec_mx3600_sys_10.11.pdf - 第32页

MX - 3600 / CXI3600M X / Specification confidential 32 / 39 spec_mx3600_sys_10.11.doc Fig. 19b: Proce ssed Slice-Filter Example 4.4. AXI Inspection Criteria’s The inspection perf ormance is related to the f ollowing k ey…

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4.3. Slice-Filter Technique (SFT™)

The new (3D) Slice-Filter Technique provides the capability for double-sided

PCB-assembly inspection of 2 x Reflow processed boards.

Fig.18: SFT Principle

Fig. 19a: Processed Slice-Filter Example

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Fig. 19b: Processed Slice-Filter Example

4.4. AXI Inspection Criteria’s

The inspection performance is related to the following key parameters:

 Defect detection rate (related to solder-joints and components)

 False Calls (related to solder-joints and components)

 Repeatability (according detection rate results)

The specific HB inspection criteria’s are defined in AppendiX G.

4.5. X-RAY dose test (optional item)

The X-Ray dose test is providing the information about the typical and max.

radiation dose range during an automatic inspection.

Version A: Dose test according automatic inspection run – one direct shot with

max. of SMT solder-joint inspection plus 100 side view shots

simulating the PCB inspection shot portfolio.

Version B: Dose test according repeat view cycling: 10 repeat views with direct

shots !

The dose test results incl. the radiation levels are documented in test report

AppendiX: H

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5. System Calibration & Diagnostics

5.1. MX-3600 / grey-level consistency and repeatability test and

calibration (Gamma-Test)

The calibration tool provides the possibility to optimize and select the grey-level

function for the specific application range. i.ex.: SMT Solder-joint inspection or

back-end chip inspection,….

Fig. 20.a: Full 4096 (8/12 Bit) Greylevel Range b: specific grey-level range

The X2/MX-3600 calibration plate guarantees the test and calibration of a pre-

defined repeatable grey-level function curve over the full 12 Bit (0…4096) range.

Image calibration and correction is achieved by applying a gain and offset to each

pixel using the equation:

c[m,n] = gain[m,n] *b[m,n] + offset[m,n]; where b is the raw input image and c is

the corrected image.

Fig. 21: min. 4 testpoints (testplates) for gamma-curve calibration