ENA-X and ENA Series Vector Network Analyzers.pdf - 第10页
10 E5081A ENA - X with Configur able Test Se t The E5081A ENA - X co mes with a configurable t est set on port s 1 and 2 to allo w for flexible setup of test systems by int egrating with external com ponents 1 such as bo…
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Calibration Options
Description
For E5080B ENA
For E5081A ENA-X
Additional Information
ISO 17025 compliant
calibration
E5080B-1A7
E5081A-1A7
Provides a complete set of measurements which
tests the unit to manufacturer’s published
specifications. Includes calibration label, ISO
17025 calibration certificate and data report, and
measurement uncertainties and guardbands on
all customer specifications. Conforms to ISO
17025 and ISO 9001.
ANSI Z540
compliant calibration
E5080B-A6J
N/A
Provides a complete set of measurements which
tests the unit to manufacturer’s published
specifications. Includes pre- and post-adjustment
data and measurement uncertainty information
compliant with the ANSI/NCSL Z540 standard.
Accessories
Description
For E5080B ENA
For E5081A ENA-X
Additional Information
Rack mount kit for
installation without
handles
E5080B-1CM
E5081A-1CM
Adds a rackmount flange kit (5063-1543) and a
rail kit (E3663AC) for use without handles.
Rack mount kit for
installation with
handles
E5080B-1CP
E5081A-1CP
Adds handles, a rack mount flange kit (5063-
1555), and a rail kit (E3663AC) for use with
handles.
Add keyboard
E5080B-181
E5081A-181
Add mouse
E5080B-182
E5081A-182
Solid State Drive
(SSD) spare kit
E5080BU-180,
E5080BU-181
1
, or
E5080BU-182
2
E5081AU-180,
E5081AU-181
3
, or
E5081AU-182
4
Visit web sites (E5080B upgrade kits / E5081A
upgrade kits) for more details.
1. Spare SSD with Windows 10 OS. For the E5080B with serial-number prefixes of MY592/SG592 or lower, order the E5080BU-
180. For the E5080B with series-number prefixes of MY593/SG593 or greater, order the E5080BU-181.
2. Spare SSD with Windows 11 OS. It is not compatible with E5080B with serial-number prefixes of MY591-MY595 or SG591-
SG595.
3. Spare SSD with Windows 10 OS. For the E5081A with serial-number prefixes of MY632/SG632 or lower, order the E5081AU-
180. For the E5081A with series-number prefixes of MY633/SG633, order the E5081AU-181.
4. Spare SSD with Windows 11 OS. It is not compatible with E5081A with serial-number prefixes of MY631-MY633 or SG631-
SG633.
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E5081A ENA-X with Configurable Test Set
The E5081A ENA-X comes with a configurable test set on ports 1 and 2 to allow for flexible setup of test
systems by integrating with external components
1
such as booster amplifiers, attenuators, or directional
couplers. This functionality combined with modulated signal analysis allows you to characterize highly
integrated components with a single connection.
High-Power S-Parameter Tests
One example using the E5081A with configurable test set is S-parameter measurements of high-power
devices. When you need an input level higher than the analyzer’s source can provide, booster amplifiers
are necessary to increase the power level incident upon the DUT. However, the reference signal is
measured before the booster amplifier with a standard configuration of a 2-port VNA, and temperature
drift or high reverse isolation of a booster amplifier will prevent accurate reflection measurements of the
DUT’s input.
A typical configuration for high-power measurements with the 2-port E5081A is shown. Reflected and
transmitted signals of the DUT are detected with all the logical receivers, and the VNA firmware provides
measured high-power S-parameters.
External components should be selected based on their high-power limits or frequency range
specifications. Be sure that these components can handle the output power level of the booster amplifier.
1. External components are not included with the E5081A. Must be purchased separately.
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Modulation Distortion Analysis with Vector Signal Source
An E5081A with option 2K6/2N6/2N7/4K6/4N6/4N7 and an external modulated source (e.g., Keysight
MXG) can be combined to support both vector network analysis and modulation distortion analysis with a
single connection. RF modulation signals under 6 GHz from the external source are added to the
“Upconverter BB In” (Upconverter baseband input) port on the E5081A’s front panel, and then
upconverted with a built-in upconverter to output mmwave modulated signals at port 1 or port 2 up to
44 GHz. The S960704B (up to 20 GHz) or S960707B (up to 44 GHz) software enable users to measure
the nonlinear behavior of power amplifiers or frequency converting devices under the high-frequency,
wideband modulated stimulus conditions.
The VNA-based vector correction extends the reference planes of the signal source to the DUT’s planes.
As a result, you can achieve excellent signal fidelity resulting in accurate and repeatable modulated
distortion measurements. The system delivers faster, more accurate, and repeatable EVM and ACPR
measurements compared to conventional signal analyzers.
Modulation distortion analysis setup for amplifiers (left), and frequency converters (right)